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2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.最新文献

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Field statistics in an enclosure with an aperture - effect of Q-factor and number of modes 具有孔径效应的壳体的场统计——q因子和模数的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513489
J. Dawson, T. Konefal, M. Robinson, A. Marvin, S. Porter, L. Chirwa
{"title":"Field statistics in an enclosure with an aperture - effect of Q-factor and number of modes","authors":"J. Dawson, T. Konefal, M. Robinson, A. Marvin, S. Porter, L. Chirwa","doi":"10.1109/ISEMC.2005.1513489","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513489","url":null,"abstract":"The statistics of the fields within an enclosure illuminated by an external field via an aperture have been investigated using Monte-Carlo methods. The field statistics in the volume of the enclosure are shown to correspond to the Rayleigh statistics found in properly functioning reverberation chambers when a sufficiently large number of modes is excited. The variation of field behaviour near the conducting walls is investigated. The deviation of the field statistics from the Rayleigh distribution as the number of excited modes falls is also investigated.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"263 1","pages":"141-146 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83923265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Termination with reverse-connected common-mode choke (T-ReCC) for a differential transmission line 差分传输线端接反接共模扼流圈(T-ReCC)
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513495
H. Suenaga, O. Shibata, Y. Saito
{"title":"Termination with reverse-connected common-mode choke (T-ReCC) for a differential transmission line","authors":"H. Suenaga, O. Shibata, Y. Saito","doi":"10.1109/ISEMC.2005.1513495","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513495","url":null,"abstract":"In this paper, a new termination circuit that consists of two common-mode chokes for a differential transmission line is proposed. It dramatically reduces common-mode noise while maintaining the transmission performance of a differential-mode signal. The noise-reduction effect of the circuit is explained here theoretically; it was also verified experimentally using an evaluation board.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"121 1","pages":"175-178 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85846373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Specifying and characterizing cable/connector systems for high-speed interfaces in defense/aerospace systems 国防/航空航天系统中高速接口用电缆/连接器系统的规定和特性
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513661
J. G. Kraemer
{"title":"Specifying and characterizing cable/connector systems for high-speed interfaces in defense/aerospace systems","authors":"J. G. Kraemer","doi":"10.1109/ISEMC.2005.1513661","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513661","url":null,"abstract":"This paper presents a common-sense approach for specifying and characterizing cable/connector systems used for high-speed data interfaces between defense/aerospace equipment, most specifically equipment using off-the-shelf non-defense/aerospace interfaces. The approach described examines the cable/connector system by itself to specify and characterize its ability to impede the transfer of interference, prevent emissions of the desired signal, and to meet required signal integrity attributes. Cable/connector system specification wording and verification methods are provided.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"79 1","pages":"943-948 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86833930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Validation of circuit extraction procedure by means of frequency and time domain measurement 用频域和时域测量方法验证电路提取程序
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513469
G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak
{"title":"Validation of circuit extraction procedure by means of frequency and time domain measurement","authors":"G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak","doi":"10.1109/ISEMC.2005.1513469","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513469","url":null,"abstract":"Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"63 1","pages":"45-50"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91239912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Examination of electronic module immunity using transfer functions 用传递函数检验电子模块抗扰度
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513625
Chingchi Chen
{"title":"Examination of electronic module immunity using transfer functions","authors":"Chingchi Chen","doi":"10.1109/ISEMC.2005.1513625","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513625","url":null,"abstract":"In this paper, the immunity of electronic modules to external electromagnetic interference (EMI) was evaluated using transfer functions, which correlate the external disturbances with the noise encountered by the components inside the module. Simple lumped-circuit models are used to describe noise coupling mechanisms, and they can be verified by straight-forward test procedures. Based on these simple models, the dominant coupling mechanisms were identified and mitigation effectiveness verified. This approach was utilized to examine an electronic module with immunity weaknesses. The module was first studied on-bench, at no power. Counter measures were then applied and effectiveness quantified. This component was then tested on a functional vehicle, with measured effectiveness matching on-bench predictions flawlessly.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"61 1","pages":"756-761 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83146386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
On the prediction of near-field microcontroller emission 近场微控制器发射预测
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513613
E. Sicard, A. Boyer, A. Tankielun
{"title":"On the prediction of near-field microcontroller emission","authors":"E. Sicard, A. Boyer, A. Tankielun","doi":"10.1109/ISEMC.2005.1513613","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513613","url":null,"abstract":"This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"108 1","pages":"695-699 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81751887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Influence of ground plane to distance dependence leaked electric field from power line 地平面对距离依赖性电力线泄漏电场的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513673
Y. Watanabe, M. Tokuda
{"title":"Influence of ground plane to distance dependence leaked electric field from power line","authors":"Y. Watanabe, M. Tokuda","doi":"10.1109/ISEMC.2005.1513673","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513673","url":null,"abstract":"In this paper, we focused attention on the system that used the MHz band in a power line communication, and calculated the influence of electric condition of ground plane to distance dependence and electric field distribution of leaked electric field by method of moments. As a result, we understood the standard ground attenuated leaked electric field to distance as not 20 dB/dec but 40 dB/dec. And we understood the almost uniform attenuation in the standard ground independency of direction from the electric field distribution.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"27 1","pages":"1008-1013 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84604946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Assessment of automobile radio system performance in noisy EM environments 噪声环境下汽车无线电系统性能评估
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513465
J. Colburn, H.J. Song, H. Hsu, R. Wiese
{"title":"Assessment of automobile radio system performance in noisy EM environments","authors":"J. Colburn, H.J. Song, H. Hsu, R. Wiese","doi":"10.1109/ISEMC.2005.1513465","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513465","url":null,"abstract":"A procedure is presented to simulate the complete automobile radio system, from antenna to speaker. The method involves generating reduced order models of all relevant components and interactions, which are then linked together in a time-domain system solver. To illustrate the usefulness of this simulation capability in vehicle-level system design a novel algorithm for automated computer rating of automobile audio tracks is developed. The algorithm uses wavelet and Fourier decompositions for automated computer rating of audio quality. The algorithm developed is validated by comparing its output to a study using human subjects to score recorded audio tracks","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"87 1","pages":"24-28"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83421671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Analysis of phantom boundary shell and the resultant matching effect of shell on SAR (specific absorption rate) values 幻影边界壳的分析及由此产生的壳对SAR值的匹配效应
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513476
Daniel Brooks, S. Nicol, Jacek Wojcik
{"title":"Analysis of phantom boundary shell and the resultant matching effect of shell on SAR (specific absorption rate) values","authors":"Daniel Brooks, S. Nicol, Jacek Wojcik","doi":"10.1109/ISEMC.2005.1513476","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513476","url":null,"abstract":"Finite difference time domain (FDTD) methods were employed to develop the complete mechanical structure (complex) of the half-wavelength experimental dipole models used to conduct this research. This paper examines how the phantom shell dielectric boundary affects the specific absorption rate (SAR) for simulations based on experimental system validation measurement protocols and the resultant calculations. Numerical calculations are made to determine complex electric and magnetic field magnitudes along with the SAR values within the APREL Laboratories universal phantom filled with tissue simulation fluid. Secondary calculations are made without the universal phantom shell (elimination of phantom shell boundary) being in place and compared against the prime phantom model data","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"79-83"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89269806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EMI controlling in a rugged launch computer 在坚固的发射计算机中进行电磁干扰控制
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513618
K.R. Rao, S. Satav, V.V.R. Sarma
{"title":"EMI controlling in a rugged launch computer","authors":"K.R. Rao, S. Satav, V.V.R. Sarma","doi":"10.1109/ISEMC.2005.1513618","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513618","url":null,"abstract":"Developing of a rugged launch mobile computer system in rack mountable form is not an easy task. If the system is going to be used in a stringent EMI environment, then achieving the EMC is a challenging task for the designers and EMI engineers. Initially the system did not qualify to met all the EMC requirements even after implementing the possible EMC measures in the design and development Achieving EMC by design is must. The EMC engineers analyzed the design concept of the system and its failures during EMI/EMC performance evaluation. In this paper the authors mainly highlighted and expressed their views about the incorporation of EMC measures, fixes and final achievement in qualifying the system. The authors also explained the electromagnetic compatibility achievement. The sequence adapted in achieving EMC is explained.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"721-725 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89975256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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