发布求助
文献互助 智能选刊 最新文献

2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.最新文献

筛选
英文 中文
A system level enclosure (chassis) resonance evaluation methodology and its applications 系统级机箱(机箱)共振评价方法及其应用
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513499
Jin Zhao
{"title":"A system level enclosure (chassis) resonance evaluation methodology and its applications","authors":"Jin Zhao","doi":"10.1109/ISEMC.2005.1513499","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513499","url":null,"abstract":"This paper presents a methodology of evaluating the resonance inside an enclosure which is caused by the resonance of the printed circuit board (PCB) installed inside the chassis. The radiation emitted from the slots on the surface of the enclosure can also be calculated. The paper demonstrates the elimination of such enclosure resonance by placing decoupling capacitors on board to remove the PCB resonance. As a consequence, the radiation from those slots on the enclosure surface is reduced also. The methodology presented here is useful in system level EMC control. The paper also illustrates that power delivery system design is closely related to system level EMC control.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"12 1","pages":"195-199 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82887211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Improving the behavior of PCB power-bus structures by an appropriate segmentation 通过适当的分段改善PCB电源总线结构的性能
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513664
M. Hampe, S. Dickmann
{"title":"Improving the behavior of PCB power-bus structures by an appropriate segmentation","authors":"M. Hampe, S. Dickmann","doi":"10.1109/ISEMC.2005.1513664","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513664","url":null,"abstract":"An effective and cost efficient method for suppressing cavity mode resonances within the power-bus of high-speed printed circuit boards is presented. It is shown that resonant modes can be completely suppressed by segmenting the power-bus into rectangular parts of smaller dimensions and connecting these parts suitably. For the case of identically shaped segments a double summation expression of the resulting voltage distribution within each part is derived. Furthermore, the impact of different connections between the segments is investigated. The theoretical results are well confirmed by measurements.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"21 1","pages":"961-966 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81043943","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Study of electromagnetic interference from a high power copper vapor laser 大功率铜蒸气激光器的电磁干扰研究
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513643
A. Gayen, B. Das, D. R. Poddar
{"title":"Study of electromagnetic interference from a high power copper vapor laser","authors":"A. Gayen, B. Das, D. R. Poddar","doi":"10.1109/ISEMC.2005.1513643","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513643","url":null,"abstract":"The copper-vapor laser (CVL) is a high power pulsed-electric discharge pumped laser. The laser lases in copper vapor media By heating the copper pieces to evaporation temperature (/spl sim/1500 /spl deg/C), copper vapors are generated in the laser head. The thermal energy required for heating the copper metal to vaporization is supplied through the excitation pulse. The discharge excitation is at a rate between 2 to 20 kHz. A pulse power supply unit (PPSU) generates the high voltage pulse (electrical pulse having voltage of the order of 15 to 20 kV at 1 to 2 kA for duration of /spl sim/600 nS), which is obtained by using a resonant charging circuit. Thus the PPSU generates power of the order of Megawatt (/spl sim/20 MW). Hence the power supply unit along with the high voltage (HV) cable carrying the electrical pulse to the laser head is a source of electromagnetic interference (EMI). In addition the laser head where the discharge takes place is also a source of electromagnetic noise. The paper presents a study of electromagnetic interference from a high power copper vapor laser system.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"45 1","pages":"847-850 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89940456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Effects of radio frequency interference in OPAMP differential input stages 射频干扰对OPAMP差分输入级的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513647
M. Corradin, G. Spiazzi, S. Buso
{"title":"Effects of radio frequency interference in OPAMP differential input stages","authors":"M. Corradin, G. Spiazzi, S. Buso","doi":"10.1109/ISEMC.2005.1513647","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513647","url":null,"abstract":"The paper deals with the problem of RFI induced output dc offset in operational amplifiers. In particular, it presents an extended analysis of the effect of the input differential stage nonlinearity in the generation of the output voltage offset. Differently from previously presented analyses, the proposed approach allows to take into account the effects of non purely square-law device models, e.g. including also velocity saturation effects. The paper also analyzes the common emitter differential input pair the analysis results can be easily extended to represent sub-threshold biased MOSFET differential stages. Based on the proposed analytical approach the paper discusses two very simple design provisions that mitigate the RFI effects. Design trade-offs related to these solutions are discussed. The proposed solutions are validated by simulations.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"41 1","pages":"866-871 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90889257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Lightning strikes to elevated structures: influence grounding conditions on currents and electromagnetic fields 雷击对高架结构的影响:电流和电磁场的接地条件
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513543
E. Petrache, F. Rachidi, D. Pavanello, W. Janischewskyj, A. Hussein, M. Rubinstein, V. Shostak, W. Chisholm, J. Chang
{"title":"Lightning strikes to elevated structures: influence grounding conditions on currents and electromagnetic fields","authors":"E. Petrache, F. Rachidi, D. Pavanello, W. Janischewskyj, A. Hussein, M. Rubinstein, V. Shostak, W. Chisholm, J. Chang","doi":"10.1109/ISEMC.2005.1513543","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513543","url":null,"abstract":"This paper presents an analysis of lightning return strokes to tall structures. The interaction of lightning with a tall structure is modeled using the antenna theory. The finite ground conductivity as well as the buried grounding system of the tall structure are taken into account in the analysis. It is shown that the current waveform, in sections of the tower close to ground, is somewhat affected by a finite ground conductivity. However, for sections further up the tower, it is not significantly influenced. Furthermore, our simulations show that some fine structure associated with current waveforms measured on the Toronto CN tower can be attributed to the finite ground conductivity. It is also shown that the current path down the tower structure is notably subjected to the skin effect. The current distribution along the buried grounding structure of the tower is also presented, illustrating the dispersion effect as a function of the ground conductivity. Finally, the lightning return-stroke generated electric and magnetic fields computed at a distance of 2 km from the tower are presented. It is shown that some late-time subsidiary peaks are smoothed out by the effect of the propagation along a finitely-conducting ground.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"33 1","pages":"377-381 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77758655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
Effective use of EMC analysis tools in the automotive product development process 在汽车产品开发过程中有效使用EMC分析工具
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513623
S. Mee, S. Ranganathan, R. Taylor
{"title":"Effective use of EMC analysis tools in the automotive product development process","authors":"S. Mee, S. Ranganathan, R. Taylor","doi":"10.1109/ISEMC.2005.1513623","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513623","url":null,"abstract":"The pressures of today's markets cause suppliers of automotive electronics to find better ways of developing products. The use of analysis is a highly effective way to bring compliant product to the market place, en time. A workflow is proposed to guide an engineering team through the arduous task of developing a product with often fewer resources and time available than ever before. Predictive analysis provides the ability to create 'virtual' board iterations, saving tune, and costs of development. Additionally, analysis is effective at creating product 'blueprints' and making them available for later design re-use.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"96 1","pages":"744-749 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77927216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
The measurement of broad band over power line emissions 宽频带电力线发射的测量
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513669
L. Cohen, J. de Graaf, A. Light, F. Sabath
{"title":"The measurement of broad band over power line emissions","authors":"L. Cohen, J. de Graaf, A. Light, F. Sabath","doi":"10.1109/ISEMC.2005.1513669","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513669","url":null,"abstract":"This paper is a report on measurements taken of broadband over power line (BPL) signals at two US test sites in October 2004. The investigation sought to: (1) discriminate between BPL emissions and power line noise in the near field; (2) determine the maximum level of magnetic field intensity levels (H FIELD) at a given distance in the near field and (3) utilizing the CONCEPT II method of moments routine develop a numerical electromagnetic model of the power line emission (H/sub y/ and E/sub x/ ) characteristics.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"2008 1","pages":"988-991 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82552708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Domain decomposition and multi-scale finite elements for electromagnetic analysis of integrated electronic systems 集成电子系统电磁分析的域分解和多尺度有限元
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513637
A. Cangellaris, Hong Wu
{"title":"Domain decomposition and multi-scale finite elements for electromagnetic analysis of integrated electronic systems","authors":"A. Cangellaris, Hong Wu","doi":"10.1109/ISEMC.2005.1513637","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513637","url":null,"abstract":"A finite element methodology is presented for computer-aided analysis and design of the interconnect and power distribution network of integrated, packaged electronic systems. The concept of multi-scale finite elements is introduced to describe the generalization of the traditional finite element, understood as a small finite volume of the computational domain over which the unknown field quantity is approximated in terms of interpolate polynomial functions, to a generalized, electromagnetic behavior-baring, scaleable, mathematical macro-model, which captures the electromagnetic response of a sub-region of the computational domain, in a manner seamlessly compatible with the finite element modeling infrastructure. Such generalized finite elements, combined with a domain decomposition methodology suitable for multi-layered electronic substrate electromagnetic modeling, help enhance the modeling versatility and applicability of finite elements to integrated electronic system modeling.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"43 1","pages":"817-822 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81866637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
FDTD-SUPML simulation of photonic integrated circuits 光子集成电路的FDTD-SUPML仿真
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513566
Hai Lin, R. Dou, Gaofeng Wang, Bing-Zhong Wang
{"title":"FDTD-SUPML simulation of photonic integrated circuits","authors":"Hai Lin, R. Dou, Gaofeng Wang, Bing-Zhong Wang","doi":"10.1109/ISEMC.2005.1513566","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513566","url":null,"abstract":"Accurate modeling of photonic integrated circuits (PIC) is essential for development of high performance optical components. In this work, a finite difference time domain method (FDTD), combined with a simplified uniaxial perfectly matched layer boundary condition is presented to efficiently analyze light propagation in PIC. The FDTD-SUPML formulation can be easily applied to complex optical components. Numerical examples illustrate that this combined approach gives high accuracy.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"19 1","pages":"501-504 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78302009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Development of a magnetic field measurement system using a tri-axial search coil 三轴搜索线圈磁场测量系统的研制
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513482
T. Tosaka, I. Nagano, S. Yagitani
{"title":"Development of a magnetic field measurement system using a tri-axial search coil","authors":"T. Tosaka, I. Nagano, S. Yagitani","doi":"10.1109/ISEMC.2005.1513482","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513482","url":null,"abstract":"In order to measure the magnetic field noise around electric devices, we developed a measurement system using a tri-axial search coil. The crosstalk of the orthogonal search coils is less than -40 dB between the tri-axial search coil sensors. The measured magnetic sensitivity of the search coil is 10 pT//spl radic/Hz at 1 kHz.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"423 1","pages":"102-106 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76744835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信