发布求助
文献互助 智能选刊 最新文献

2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.最新文献

筛选
英文 中文
Validation of circuit extraction procedure by means of frequency and time domain measurement 用频域和时域测量方法验证电路提取程序
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513469
G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak
{"title":"Validation of circuit extraction procedure by means of frequency and time domain measurement","authors":"G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak","doi":"10.1109/ISEMC.2005.1513469","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513469","url":null,"abstract":"Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"63 1","pages":"45-50"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91239912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Examination of electronic module immunity using transfer functions 用传递函数检验电子模块抗扰度
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513625
Chingchi Chen
{"title":"Examination of electronic module immunity using transfer functions","authors":"Chingchi Chen","doi":"10.1109/ISEMC.2005.1513625","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513625","url":null,"abstract":"In this paper, the immunity of electronic modules to external electromagnetic interference (EMI) was evaluated using transfer functions, which correlate the external disturbances with the noise encountered by the components inside the module. Simple lumped-circuit models are used to describe noise coupling mechanisms, and they can be verified by straight-forward test procedures. Based on these simple models, the dominant coupling mechanisms were identified and mitigation effectiveness verified. This approach was utilized to examine an electronic module with immunity weaknesses. The module was first studied on-bench, at no power. Counter measures were then applied and effectiveness quantified. This component was then tested on a functional vehicle, with measured effectiveness matching on-bench predictions flawlessly.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"61 1","pages":"756-761 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83146386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
On the prediction of near-field microcontroller emission 近场微控制器发射预测
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513613
E. Sicard, A. Boyer, A. Tankielun
{"title":"On the prediction of near-field microcontroller emission","authors":"E. Sicard, A. Boyer, A. Tankielun","doi":"10.1109/ISEMC.2005.1513613","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513613","url":null,"abstract":"This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"108 1","pages":"695-699 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81751887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Influence of ground plane to distance dependence leaked electric field from power line 地平面对距离依赖性电力线泄漏电场的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513673
Y. Watanabe, M. Tokuda
{"title":"Influence of ground plane to distance dependence leaked electric field from power line","authors":"Y. Watanabe, M. Tokuda","doi":"10.1109/ISEMC.2005.1513673","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513673","url":null,"abstract":"In this paper, we focused attention on the system that used the MHz band in a power line communication, and calculated the influence of electric condition of ground plane to distance dependence and electric field distribution of leaked electric field by method of moments. As a result, we understood the standard ground attenuated leaked electric field to distance as not 20 dB/dec but 40 dB/dec. And we understood the almost uniform attenuation in the standard ground independency of direction from the electric field distribution.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"27 1","pages":"1008-1013 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84604946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Assessment of automobile radio system performance in noisy EM environments 噪声环境下汽车无线电系统性能评估
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513465
J. Colburn, H.J. Song, H. Hsu, R. Wiese
{"title":"Assessment of automobile radio system performance in noisy EM environments","authors":"J. Colburn, H.J. Song, H. Hsu, R. Wiese","doi":"10.1109/ISEMC.2005.1513465","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513465","url":null,"abstract":"A procedure is presented to simulate the complete automobile radio system, from antenna to speaker. The method involves generating reduced order models of all relevant components and interactions, which are then linked together in a time-domain system solver. To illustrate the usefulness of this simulation capability in vehicle-level system design a novel algorithm for automated computer rating of automobile audio tracks is developed. The algorithm uses wavelet and Fourier decompositions for automated computer rating of audio quality. The algorithm developed is validated by comparing its output to a study using human subjects to score recorded audio tracks","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"87 1","pages":"24-28"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83421671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Analysis of phantom boundary shell and the resultant matching effect of shell on SAR (specific absorption rate) values 幻影边界壳的分析及由此产生的壳对SAR值的匹配效应
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513476
Daniel Brooks, S. Nicol, Jacek Wojcik
{"title":"Analysis of phantom boundary shell and the resultant matching effect of shell on SAR (specific absorption rate) values","authors":"Daniel Brooks, S. Nicol, Jacek Wojcik","doi":"10.1109/ISEMC.2005.1513476","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513476","url":null,"abstract":"Finite difference time domain (FDTD) methods were employed to develop the complete mechanical structure (complex) of the half-wavelength experimental dipole models used to conduct this research. This paper examines how the phantom shell dielectric boundary affects the specific absorption rate (SAR) for simulations based on experimental system validation measurement protocols and the resultant calculations. Numerical calculations are made to determine complex electric and magnetic field magnitudes along with the SAR values within the APREL Laboratories universal phantom filled with tissue simulation fluid. Secondary calculations are made without the universal phantom shell (elimination of phantom shell boundary) being in place and compared against the prime phantom model data","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"79-83"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89269806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EMI controlling in a rugged launch computer 在坚固的发射计算机中进行电磁干扰控制
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513618
K.R. Rao, S. Satav, V.V.R. Sarma
{"title":"EMI controlling in a rugged launch computer","authors":"K.R. Rao, S. Satav, V.V.R. Sarma","doi":"10.1109/ISEMC.2005.1513618","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513618","url":null,"abstract":"Developing of a rugged launch mobile computer system in rack mountable form is not an easy task. If the system is going to be used in a stringent EMI environment, then achieving the EMC is a challenging task for the designers and EMI engineers. Initially the system did not qualify to met all the EMC requirements even after implementing the possible EMC measures in the design and development Achieving EMC by design is must. The EMC engineers analyzed the design concept of the system and its failures during EMI/EMC performance evaluation. In this paper the authors mainly highlighted and expressed their views about the incorporation of EMC measures, fixes and final achievement in qualifying the system. The authors also explained the electromagnetic compatibility achievement. The sequence adapted in achieving EMC is explained.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"721-725 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89975256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Towards developing a standard for data input/output format for PDN modeling & simulation tools 为PDN建模和仿真工具开发数据输入/输出格式标准
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513593
R. Kaw, I. Novak, M. Swaminathan
{"title":"Towards developing a standard for data input/output format for PDN modeling & simulation tools","authors":"R. Kaw, I. Novak, M. Swaminathan","doi":"10.1109/ISEMC.2005.1513593","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513593","url":null,"abstract":"This paper explores the design and verification environment of power delivery networks (PDN) in an attempt to point out areas for improving the tools and the methods. It also points out potential interfaces between PDN tools that can be standardized so that the models can be ported between various available tools","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"30 1","pages":"644-649"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83358988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers 模态搅拌室场自相关系数的统计解释
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513576
H. Krauthauser, T. Winzerling, J. Nitsch
{"title":"Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers","authors":"H. Krauthauser, T. Winzerling, J. Nitsch","doi":"10.1109/ISEMC.2005.1513576","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513576","url":null,"abstract":"The autocorrelation function of electrical field strengths for different boundary conditions (tuner positions) at a given special position is proposed in the IEC standard 61000-4-21 as a measure for the determination of the number of uncorrelated boundary conditions in mode-stirred chambers. Additionally, an upper limit for the autocorrelation coefficient is given for a fixed number N of measured tuner positions only. In this paper, we analyze an approach given in the literature that includes the treatment of different N, but still gives results that are inconsistent with the daily measurement practice in mode-stirred chambers. A slight modification of this approach is proposed that leads to consistent results. This paper gives critical values for the autocorrelation coefficients for any number of measured tuner positions based on a statistical analysis of the well known probability distribution of autocorrelation coefficients. The degree of determination and the significance level remain as free parameters that have to be established by the community. The authors propose values for these parameters that are consistent with the example given in the standard","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"46 1","pages":"550-555"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73340323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 40
Comparing and visualising statistical shielding effectiveness for rectangular enclosures with different inner structures 比较和可视化不同内部结构矩形围护结构的统计屏蔽效果
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513572
J. Hamalainen, M. Aunola, T. Martin, M. Backstrom
{"title":"Comparing and visualising statistical shielding effectiveness for rectangular enclosures with different inner structures","authors":"J. Hamalainen, M. Aunola, T. Martin, M. Backstrom","doi":"10.1109/ISEMC.2005.1513572","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513572","url":null,"abstract":"Histograms of the electromagnetic field amplitudes inside rectangular enclosures with different inner structures are studied. We consider the variations of the histograms as the inner structure of the enclosure becomes more complex. Furthermore, we study differences of the field component histograms and introduce a shielding effectiveness histogram. We concentrate on enclosures, which are not overmoded on studied frequencies. Obtained results show the usability of histograms in examination of statistical shielding effectiveness and point out that it is not very sensitive against small changes of the inner structure of the enclosure.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"69 1","pages":"530-533 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74713243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信