IEEE Transactions on Electromagnetic Compatibility最新文献

筛选
英文 中文
Accurate Measurement of Intradecoupling Characteristics for Noise Suppression Sheets on Conducting Plates in Low-Frequency Range 精确测量低频范围内导电板上噪声抑制片的内耦合特性
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-26 DOI: 10.1109/TEMC.2025.3538563
Hyun Ho Park
{"title":"Accurate Measurement of Intradecoupling Characteristics for Noise Suppression Sheets on Conducting Plates in Low-Frequency Range","authors":"Hyun Ho Park","doi":"10.1109/TEMC.2025.3538563","DOIUrl":"10.1109/TEMC.2025.3538563","url":null,"abstract":"In this article, a test method is proposed for accurately evaluating the intradecoupling characteristics of noise suppression sheets (NSSs) on a conducting plate using two loop probes placed perpendicularly to the NSS on the same side. The effectiveness of the proposed method is discussed in comparison with the standard test method from IEC 62333-2, particularly by examining the underlying mechanisms based on the image method. To establish a test setup for measuring intradecoupling at frequencies below 100 MHz, the effects of various factors including the distance between the two loop probes, the distance from the probes to the NSS, and the size of the NSS were investigated using three-dimensional full-wave numerical simulations and design of experiments. For validation, intradecoupling ratios of commercial NSSs were measured using both the IEC 62333-2 method and the proposed method with two rectangular loop probes. In addition, regression analysis based on the measurement results was used to derive linear equations for predicting the intradecoupling ratio based on the real relative permeability and thickness, within the frequency range where real permeability is constant. The intradecoupling ratios at 1 MHz predicted by these regression equations showed an average deviation of 0.36<inline-formula><tex-math>$%$</tex-math></inline-formula> from the measured values of real NSSs on conducting plates.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"384-391"},"PeriodicalIF":2.0,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143506803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimal Cancellation Loop Termination to Reduce the Magnetic Field in WPT Systems 减少WPT系统磁场的最优对消回路终止
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-25 DOI: 10.1109/temc.2025.3531470
Silvano Cruciani, Tommaso Campi, Francesca Maradei, Mauro Feliziani
{"title":"Optimal Cancellation Loop Termination to Reduce the Magnetic Field in WPT Systems","authors":"Silvano Cruciani, Tommaso Campi, Francesca Maradei, Mauro Feliziani","doi":"10.1109/temc.2025.3531470","DOIUrl":"https://doi.org/10.1109/temc.2025.3531470","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"32 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143495565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Institutional Listings 机构清单
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-20 DOI: 10.1109/TEMC.2025.3525905
{"title":"Institutional Listings","authors":"","doi":"10.1109/TEMC.2025.3525905","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3525905","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"C4-C4"},"PeriodicalIF":2.0,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10896934","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Electromagnetic Compatibility Information for Authors IEEE《作者电磁兼容性信息汇刊》
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-20 DOI: 10.1109/TEMC.2025.3525907
{"title":"IEEE Transactions on Electromagnetic Compatibility Information for Authors","authors":"","doi":"10.1109/TEMC.2025.3525907","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3525907","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"C3-C3"},"PeriodicalIF":2.0,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10896904","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrostatic Field by Thunderclouds: Threat at Ground Level 雷雨云静电场:对地面的威胁
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-20 DOI: 10.1109/temc.2025.3535669
Erika Stracqualursi, Gianfranco Di Lorenzo, Rodolfo Araneo, Giampiero Lovat, Salvatore Celozzi
{"title":"Electrostatic Field by Thunderclouds: Threat at Ground Level","authors":"Erika Stracqualursi, Gianfranco Di Lorenzo, Rodolfo Araneo, Giampiero Lovat, Salvatore Celozzi","doi":"10.1109/temc.2025.3535669","DOIUrl":"https://doi.org/10.1109/temc.2025.3535669","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"81 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143462349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Electromagnetic Compatibility Society Information IEEE电磁兼容协会信息
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-20 DOI: 10.1109/TEMC.2025.3525909
{"title":"IEEE Electromagnetic Compatibility Society Information","authors":"","doi":"10.1109/TEMC.2025.3525909","DOIUrl":"10.1109/TEMC.2025.3525909","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"C2-C2"},"PeriodicalIF":2.0,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10896906","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143462760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FDTD Simulation and Experimental Comparative Study of a Gasket's Shielding Effectiveness Characterization: Dipole Vs. Log-Periodic Antenna 偶极子与对数周期天线衬垫屏蔽效能特性的FDTD仿真与实验比较研究
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-19 DOI: 10.1109/TEMC.2025.3531946
Pavithrakrishnan Radhakrishnan;Lirim Koraqi;Tim Claeys;Johan Catrysse;Davy Pissoort
{"title":"FDTD Simulation and Experimental Comparative Study of a Gasket's Shielding Effectiveness Characterization: Dipole Vs. Log-Periodic Antenna","authors":"Pavithrakrishnan Radhakrishnan;Lirim Koraqi;Tim Claeys;Johan Catrysse;Davy Pissoort","doi":"10.1109/TEMC.2025.3531946","DOIUrl":"10.1109/TEMC.2025.3531946","url":null,"abstract":"This article presents a comparative analysis of the characterization of the shielding effectiveness of gaskets using either a tuned dipole antenna (IEEE Std. 299) or a log-periodic antenna (MIL DTL 83528 G), following the specifications outlined in the relevant standards. Our study integrates both 3-D full-wave simulations using the finite-difference-time-domain solver and experimental validation within the frequency range of 200 MHz–1 GHz. In the simulations, near-field sensors representing external antennas were utilized to assess the gasket's shielding performance at various angles and locations. Additionally, the simulations explored the variability in shielding effectiveness when employing both antennas. For the experimental set-up, only the impinging angle of 0<inline-formula><tex-math>$^{circ }$</tex-math></inline-formula> was considered to calculate the gasket's shielding effectiveness. The study demonstrates a good level of correlation between numerical simulations and experimental validation, revealing that tuned dipole and log-periodic antennas exhibit similar behaviors in terms of shielding effectiveness. Finally, the article emphasizes that despite the recommendation in the IEEE Std. 299 to use tuned dipole antennas, log-periodic antennas can be equivalently utilized due to their ease of use and practical perspective.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"598-608"},"PeriodicalIF":2.0,"publicationDate":"2025-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143452052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Failure Threshold of Digital Control Circuit Under Mixed Electromagnetic Interference of Electrical Fast Transient and Surge 电快暂态和浪涌混合电磁干扰下数字控制电路失效阈值评估
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-31 DOI: 10.1109/TEMC.2025.3532291
Jing Sun;Zhaocheng Zhong;Hao Liu;Henglin Chen
{"title":"Evaluation of Failure Threshold of Digital Control Circuit Under Mixed Electromagnetic Interference of Electrical Fast Transient and Surge","authors":"Jing Sun;Zhaocheng Zhong;Hao Liu;Henglin Chen","doi":"10.1109/TEMC.2025.3532291","DOIUrl":"10.1109/TEMC.2025.3532291","url":null,"abstract":"Digital control circuits failure problem usually occurs in electronic equipment working in a mixed electromagnetic environment. Therefore, it is necessary to study the failure mechanism of digital control circuits under mixed electromagnetic interference (EMI) and electromagnetic compatibility (EMC) design method to the failure problem. The digital circuit failure behaviors under mixed EMI of electrical fast transient (EFT) and surge are tested and analyzed. This article innovatively proposes an evaluation method of failure threshold of digital control circuits, that can be applied to the case where both voltage and current may change under mixed EMI of EFT and surge. The proposed evaluation method is dependent on the instantaneous product of amplitude and slope of the power supply port voltage of the regulator chip. The port voltage transfer characteristic of the regulator chip expressed using transfer function under mixed EMI is obtained. Then, the coupling model of mixed EMI of EFT and surge on the digital circuit board is built. The coupling model is validated by comparing the simulated results and measured results in 1000 V EFT and 20 V surge test. Based on the coupling model and the failure threshold, an evaluation method of circuit failure state under mixed EMI of EFT and surge is introduced and verified. Furthermore, an anti-interference filter design method is presented. Through a prototype experiment, the anti-interference filter design method is validated.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"467-476"},"PeriodicalIF":2.0,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Innovations in Connector Terminal Design for Improved Signal Integrity in DDR5 Memory 改进DDR5存储器中信号完整性的连接器终端设计创新
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-28 DOI: 10.1109/TEMC.2025.3526370
Yuchen Lee;Shuhao Liang
{"title":"Innovations in Connector Terminal Design for Improved Signal Integrity in DDR5 Memory","authors":"Yuchen Lee;Shuhao Liang","doi":"10.1109/TEMC.2025.3526370","DOIUrl":"10.1109/TEMC.2025.3526370","url":null,"abstract":"This article introduces an innovative connector terminal design for double data rate fifth-generation synchronous dynamic random-access memory (DDR5) connectors to enhance signal integrity in high-frequency memory systems. With the evolution of memory technology from DDR1 to DDR5, the requirements for higher transmission speeds and less signal distortion have necessitated more precise terminal designs. Simulations were conducted using ANSYS high-frequency structure simulator to assess the proposed stub design's high-frequency performance in terms of impedance, insertion loss (IL), return loss, and crosstalk (XT). Experimental results confirmed the superiority of the proposed design, which eliminates the 2.16 mm terminal stub from the conventional design. This modification minimized impedance variation, reduced IL by 0.2–0.4 dB in the 9–14.5 GHz frequency range, and enabled higher resonant frequencies in XT tests, thus enhancing signal integrity. These improvements hold significant promise for high-frequency applications, establishing a new design paradigm for DDR5 connector gold fingers and providing valuable insights for future high-speed memory interfaces.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"609-618"},"PeriodicalIF":2.0,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054864","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Neural Network Based Calibratable Arc Model for Air Electrostatic Discharge 基于神经网络的空气静电放电可校正电弧模型
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-27 DOI: 10.1109/TEMC.2025.3526942
Yang Jiang;Richard Xian-Ke Gao;Yew Choon Tan;Yew Seng Goh;Mui Mui Goh;Hui Min Lee;Zaifeng Yang;Srien Sithara Syed Nasser
{"title":"A Neural Network Based Calibratable Arc Model for Air Electrostatic Discharge","authors":"Yang Jiang;Richard Xian-Ke Gao;Yew Choon Tan;Yew Seng Goh;Mui Mui Goh;Hui Min Lee;Zaifeng Yang;Srien Sithara Syed Nasser","doi":"10.1109/TEMC.2025.3526942","DOIUrl":"10.1109/TEMC.2025.3526942","url":null,"abstract":"This article introduces an innovative calibratable modeling approach to effectively capture intricate arc behavior in air electrostatic discharge (ESD). The proposed method incorporates a compact electric arc resistance model rooted in the Rompe–Weizel law, calibrating by a physics informed neural network (PINN). The systematic uncertainties in the air discharge behavior due to environmental factors and measurement procedure are succinctly and effectively quantified through introducing an equivalent arc length in the compact model. A dedicated electrostatic air discharge behavior library is developed by a reduced-order partial element equivalent circuit model for training the neural network. The PINN calibrates the arc model according to the measured discharge currents on a standard ESD calibration set. The fidelity of the calibrated compact electric arc model is verified by the simulation and measurement. The efficacy of the proposed approach is observed through a case study. This new environment-aware modeling method provides deeper insights into air discharge phenomena and proves its promising potential in characterizing noncontact electromagnetic discharge.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"392-402"},"PeriodicalIF":2.0,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143049908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信