IEEE Transactions on Electromagnetic Compatibility最新文献_第5页

Design of an LISN for Low-Frequency Conducted Emissions Measurement 设计用于低频传导发射测量的 LISN

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-16 DOI: 10.1109/temc.2024.3510390

Lu Wan, Arun D. Khilnani, Xinglong Wu, Xiaokang Liu, Sergio A. Pignari, David W. P. Thomas, Mark Sumner, Flavia Grassi

引用次数: 0

MIMO Performance and Uncertainty Analysis in a Reverberation Chamber With Phase Stirring 相位搅拌混响室内MIMO性能及不确定度分析

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-13 DOI: 10.1109/TEMC.2024.3507287

Yifan Wang;Hanzhi Ma;Gangzha Liu;Er-Ping Li

{"title":"MIMO Performance and Uncertainty Analysis in a Reverberation Chamber With Phase Stirring","authors":"Yifan Wang;Hanzhi Ma;Gangzha Liu;Er-Ping Li","doi":"10.1109/TEMC.2024.3507287","DOIUrl":"10.1109/TEMC.2024.3507287","url":null,"abstract":"Source-stirred reverberation chamber (SSRC) is a typical type of reverberation chambers (RCs) that can produce an electromagnetic environment suitable for electromagnetic compatibility (EMC) testing without a mechanical stirrer. This article proposes an SSRC based on phased array antennas, which achieves stirring by changing the phase difference, helping to improve test efficiency and reduce costs. The stirring effects and the multiple-input multiple-output (MIMO) performance of SSRC is investigated, with a focus on the measurement and uncertainty analysis of the Rician <italic>K</i>-factor. The results demonstrate that the phase stirring method can achieve sufficient stirring. Moreover, four sample selection methods are employed to evaluate the measurement uncertainty. It is found that the correlation matrix method yielding the smallest relative uncertainty among them, approximately 1.2<inline-formula><tex-math>$%$</tex-math></inline-formula> at 10 GHz. Through a uniformity and MIMO performance test, this article demonstrates the potential of phase stirring technology in EMC and MIMO over-the-air testing, providing a significant option for improving efficiency and reducing costs.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"42-50"},"PeriodicalIF":2.0,"publicationDate":"2024-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142820984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

GHz-Range Modeling of Power Integrity in an Array of Simultaneously Switching Power Converters 同时开关的功率转换器阵列的 GHz 范围功率完整性建模

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-13 DOI: 10.1109/TEMC.2024.3509375

Gabriel Nobert;Nicolas G. Constantin;Yves Blaquière

{"title":"GHz-Range Modeling of Power Integrity in an Array of Simultaneously Switching Power Converters","authors":"Gabriel Nobert;Nicolas G. Constantin;Yves Blaquière","doi":"10.1109/TEMC.2024.3509375","DOIUrl":"10.1109/TEMC.2024.3509375","url":null,"abstract":"Power integrity issues and voltage fluctuations on power rails in emerging system-in-packages (SiP) that integrate switch-mode converters can impede the performances of embedded sensitive analog devices. Indeed, the progress of power device downsizing allows higher switching frequencies and shorter switching times, which create significant high-frequency switching noise in power rails. More specifically for converters that operate under a range of loading, gate driving and biasing conditions, a behavioral model is necessary in the context where simulation only is not sufficient for proper prediction of the power integrity characteristics of a system under that range of conditions. This article proposes a power integrity model and a characterization methodology to predict voltage fluctuations on the power rails in simultaneous switching conditions on an array of switch-mode converters integrated in SiP. Results show that for every condition studied in this work, accuracy better than 6 dB, aside from some limited discrete frequencies, is obtained between <inline-formula><tex-math>$0$</tex-math></inline-formula> and 1.9 <inline-formula><tex-math>$text{G}$</tex-math></inline-formula><inline-formula><tex-math>$text{Hz}$</tex-math></inline-formula> when the fluctuations caused by a single or multiple converters are measured. In terms of overall shape, for every condition studied both under simultaneous switching or not, the variance-normalized mean squared error is in a worst case of 0.624 and under numerous conditions better than 0.25.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"316-327"},"PeriodicalIF":2.0,"publicationDate":"2024-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142820740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Intelligent Prediction Method for Radiation Emission of Printed Circuit Board by Using Deep Learning 基于深度学习的印刷电路板辐射发射智能预测方法

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-13 DOI: 10.1109/TEMC.2024.3491822

Kai Wei;Dan Shi;Chengyu Li;Yanchi Liu;Na Sun;Dan Xiao;Xingguo Jiang

{"title":"Intelligent Prediction Method for Radiation Emission of Printed Circuit Board by Using Deep Learning","authors":"Kai Wei;Dan Shi;Chengyu Li;Yanchi Liu;Na Sun;Dan Xiao;Xingguo Jiang","doi":"10.1109/TEMC.2024.3491822","DOIUrl":"10.1109/TEMC.2024.3491822","url":null,"abstract":"This article introduces a novel deep learning approach, utilizing a seq2seq model, to predict far-field radiation emissions (REs) in high-density, multilayer, and complex printed circuit boards (PCBs). To address the challenges of weak long-term dependencies and information ambiguity arising from excessively long network sequences in RE prediction for complex PCBs, our method begins by tokenizing and modeling each network combination. These combinations are then fed into the seq2seq model for training, supplemented with a multihead attention mechanism to enhance information connectivity. To validate the model's accuracy and efficiency, we compared our prediction results with those obtained from traditional full-wave electromagnetic simulations. Our approach significantly reduces the RE prediction time for the entire board from several hours to nearly one second. Moreover, the model exhibits high performance in RE prediction, with a mean absolute error of approximately 0.001 V/m. To verify the model's reliability, we applied the trained model to predict RE for brand-new entire boards and key networks, demonstrating its ability to accurately predict RE in previously unseen PCBs. Therefore, this method can be implemented for intelligent, full-automatic RE prediction in practical applications.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"2027-2038"},"PeriodicalIF":2.0,"publicationDate":"2024-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142820741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Investigation of Thin Absorber With Big Incident Angle Absorption and RCS Reduction 大入射角吸收和减小RCS的薄吸收体研究

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-13 DOI: 10.1109/TEMC.2024.3506939

Chaoyi Ma;Haoran Xing;Yue Wu;Mengjun Wang;Chao Fan;Hongxing Zheng;Erping Li

引用次数: 0

Modeling and Suppression of Common-Mode Current Resonance in an All-in-One Motor Drive Module of Electric Vehicle 电动汽车一体化电机驱动模块共模电流谐振建模与抑制

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-11 DOI: 10.1109/temc.2024.3503070

Zhaocheng Zhong, Zili Zhu, Jing Sun, Henglin Chen

引用次数: 0

A Slot-Type Ez Probe With a Lower Effective Center 低有效中心槽型Ez探针

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-11 DOI: 10.1109/TEMC.2024.3503725

Yu Tian;Xing-Chang Wei;Di Wang;Richard Xian-Ke Gao

引用次数: 0

Effect of a Longitudinal Aperture's Position Uncertainty on the Electromagnetic Fields Excited in a Finite Length Cylindrical Cavity 纵向孔径位置不确定性对有限长圆柱腔内电磁场的影响

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-09 DOI: 10.1109/TEMC.2024.3506623

Secil E. Dogan;Joel T. Johnson;Robert J. Burkholder

引用次数: 0

A High-Efficiency Crosstalk Control Method of the Staggered High-Speed via Array in PCB for Chiplet-Based System 基于芯片系统的PCB交错高速通孔阵列的高效串扰控制方法

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-04 DOI: 10.1109/temc.2024.3502412

Ruan Jiang, Xianglong Wang, DongDong Chen, DI Li, Yingtang Yang

引用次数: 0

Estimation of Apparent Ionospheric Reflection Height from LEMP Waveforms for the Case of Tilted Lightning Channel 倾斜闪电通道情况下LEMP波形对电离层反射高度的估计

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-03 DOI: 10.1109/temc.2024.3502457

Yuto Ichikawa, Yoshihiro Baba, Toshihiro Tsuboi, Vladimir A. Rakov

引用次数: 0