关于在混响室中进行的辐射敏感性试验中瞬时和延迟失效的检测与搅拌技术的关系

{"title":"关于在混响室中进行的辐射敏感性试验中瞬时和延迟失效的检测与搅拌技术的关系","authors":"Quentin Jacquet, Guillaume Andrieu, Ludovic Vollet, Marc Romero-De-La-Osa","doi":"10.1109/temc.2025.3572703","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"23 1","pages":""},"PeriodicalIF":2.5000,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"About the Detection of Instantaneous and Delayed Failures During Radiated Susceptibility Tests Performed in Reverberation Chambers as a Function of the Stirring Technique\",\"authors\":\"Quentin Jacquet, Guillaume Andrieu, Ludovic Vollet, Marc Romero-De-La-Osa\",\"doi\":\"10.1109/temc.2025.3572703\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":55012,\"journal\":{\"name\":\"IEEE Transactions on Electromagnetic Compatibility\",\"volume\":\"23 1\",\"pages\":\"\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2025-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electromagnetic Compatibility\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/temc.2025.3572703\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/temc.2025.3572703","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}