IEEE Transactions on Electromagnetic Compatibility最新文献_第6页

Coupled Slotline Mode Suppression for Bent Coplanar Waveguide Using Double-Ended Open-Circuited Stubs 利用双端开路短节抑制弯曲共面波导的耦合槽线模式

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-23 DOI: 10.1109/temc.2025.3529296

Ching-Mao Chang, Chun-Long Wang

引用次数: 0

Radiated Emission from Superconducting Coplanar Waveguide Transmission Lines 超导共面波导传输线的辐射发射

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-22 DOI: 10.1109/temc.2024.3521863

Mohammad Hossein Amini, Alireza Mallahzadeh, Amirhossein Ghasemi, Gabriele Gradoni, Mohsen Khalily, Rahim Tafazolli

引用次数: 0

Performance Assessment of Grounding System for Large-Scale Grid-Connected-Photovoltaic System Using the PEEC-MTL Hybrid Model 基于PEEC-MTL混合模型的大型光伏并网系统接地系统性能评估

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-17 DOI: 10.1109/TEMC.2024.3501369

Zhentao Du;Yuxuan Ding;Yaping Du;Xiangen Zhao;Ruihan Qi

{"title":"Performance Assessment of Grounding System for Large-Scale Grid-Connected-Photovoltaic System Using the PEEC-MTL Hybrid Model","authors":"Zhentao Du;Yuxuan Ding;Yaping Du;Xiangen Zhao;Ruihan Qi","doi":"10.1109/TEMC.2024.3501369","DOIUrl":"10.1109/TEMC.2024.3501369","url":null,"abstract":"This article proposes an efficient and refined simulation method combining partial-element-equivalent-circuit (PEEC) and multiple-transmission-line (MTL) model considering the effects of lossy ground to develop a large-scale grid-connected photovoltaic (PV) system. The concentrated complex wire-conductor structure, such as PV panels, dc line of PV, grounding grids, and power distribution towers, are modeled using PEEC, while the long-distance transmission lines, such as buried cables and overhead lines are modeled with MTL. Both the ac side and dc side of the system are simulated synchronously, and the influence of the ac system on the dc system, including surge protecting device (SPD) installation, and grounding configurations are discussed. It is noted that a direct lightning strike on the dc side poses a significant threat to the system. However, when considering the connection to the ac system, the risk of lightning-caused overvoltage is mitigated. Moreover, this overvoltage reduces as the number of PV panels increases. For safe operation, it is essential to incorporate grounding at both ends of the cable enclosure and establish equipotential bonding among various grounding electrodes.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"658-666"},"PeriodicalIF":2.0,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142989027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A Multi-Parameter Statistical Inference Model for the Thermal Burnout Effect of LNA Excited by Repetitive Electromagnetic Disturbances 重复电磁干扰下LNA热燃效应的多参数统计推断模型

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-17 DOI: 10.1109/TEMC.2025.3525723

Zong-Yang Wang;Yan-Zhao Xie;Yu-Hao Chen;Pu-Qing Zhang

{"title":"A Multi-Parameter Statistical Inference Model for the Thermal Burnout Effect of LNA Excited by Repetitive Electromagnetic Disturbances","authors":"Zong-Yang Wang;Yan-Zhao Xie;Yu-Hao Chen;Pu-Qing Zhang","doi":"10.1109/TEMC.2025.3525723","DOIUrl":"10.1109/TEMC.2025.3525723","url":null,"abstract":"Repetitive electromagnetic disturbances (REDs), characterized by power level, repetition frequency, pulsewidth, and pulse number, would couple to the low noise amplifier (LNA) via the antenna. The four parameters collectively determine the heat accumulation process and the subsequent permanent damage in LNA. In this case, the scientific vulnerability assessment for LNA is important. In this article, the multiparameter statistical inference model is put forward to assess the thermal burnout effect of LNA excited by REDs. In the physical part of the model, the internal temperature rise is analyzed using the heat conduction equation, which takes into account the effect mechanism and thus the four parameters. In the statistical part of the model, the internal temperature rise is chosen as the latent variable. The model can be robustly and efficiently determined by two sets of single-parameter effect test samples, which is validated by the simulation case. Finally, a case study is carried out on LNA. The model parameters calculated from two pair of test sets are consistent, which indicates the model is reasonable. The inference results given by the model are validated by the validation test results. In addition, the model performs better than the logistic regression model by comparing the confusion matrix, accuracy, and cross entropy.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"427-436"},"PeriodicalIF":2.0,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142989028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analysis and Optimization of Fast Ethernet Terminations for Reduction of Differential-to-Common-Mode Conversion 减少差共模转换的快速以太网终端分析与优化

IF 2.1 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-10 DOI: 10.1109/temc.2024.3523962

Ludovica Illiano, Xiaokang Liu, Flavia Grassi, Sergio A. Pignari

引用次数: 0

2024 Index IEEE Transactions on Electromagnetic Compatibility Vol. 66 2024索引IEEE电磁兼容性交易卷66

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-09 DOI: 10.1109/TEMC.2025.3526545

引用次数: 0

Measurements of Induced Voltages on Overhead Distribution Line Due to Altitude-Triggered Lightning 高空雷击对架空配电线路感应电压的测量

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-30 DOI: 10.1109/TEMC.2024.3511938

Gan Yang;Shaodong Chen;Xu Yan;Lu Feng;Weitao Lyu;Gaopeng Lu;Lyuwen Chen;Yanfeng Fan

{"title":"Measurements of Induced Voltages on Overhead Distribution Line Due to Altitude-Triggered Lightning","authors":"Gan Yang;Shaodong Chen;Xu Yan;Lu Feng;Weitao Lyu;Gaopeng Lu;Lyuwen Chen;Yanfeng Fan","doi":"10.1109/TEMC.2024.3511938","DOIUrl":"10.1109/TEMC.2024.3511938","url":null,"abstract":"This article presents the measurements of induced voltages at the terminal of an overhead distribution line caused by three altitude-triggered lightning events, consisting of three mini-return strokes and 16 subsequent return strokes. The results indicate that even mini-return strokes can generate significant induced voltages on the overhead line, as one of the mini-return strokes occurring at a distance of 20 m produces a peak value of 37.1 kV. The voltage waveforms predominantly exhibit positive polarity, with a noticeable negative polarity rebound at the end of the descending edge. However, the polarity of the voltage waveform induced by a subsequent return stroke exhibits either bipolar or unipolar characteristics, depending on the location of the lightning relative to the overhead line. During a lightning event, the average 10%–90% rise time of the induced voltage waveforms caused by the subsequent return strokes is slightly less than that of the mini-return stroke. Moreover, compared with the simulation results, the induced voltages are notably influenced by the tortuosity of the lightning channel.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"200-208"},"PeriodicalIF":2.0,"publicationDate":"2024-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142905170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Modeling Nonlinear Black-Box Conducted Immunity of Mixed Analog-Digital Integrated Circuits Using Particle Swarm Optimization (PSO) and Piecewise Volterra Series 基于粒子群算法和分段Volterra级数的混合模数集成电路非线性黑盒传导抗扰度建模

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-26 DOI: 10.1109/TEMC.2024.3516496

Xi Chen;Shuguo Xie;Mengyuan Wei;Bing Shao;Yuanyuan Li;Shuling Zhou;Xiaozong Huang;Xiaoqiang Yang;Wenshuang Yi;Xiaokang Wen

{"title":"Modeling Nonlinear Black-Box Conducted Immunity of Mixed Analog-Digital Integrated Circuits Using Particle Swarm Optimization (PSO) and Piecewise Volterra Series","authors":"Xi Chen;Shuguo Xie;Mengyuan Wei;Bing Shao;Yuanyuan Li;Shuling Zhou;Xiaozong Huang;Xiaoqiang Yang;Wenshuang Yi;Xiaokang Wen","doi":"10.1109/TEMC.2024.3516496","DOIUrl":"10.1109/TEMC.2024.3516496","url":null,"abstract":"This article addresses the challenge of modeling the conducted immunity of mixed analog-digital integrated Circuits under electromagnetic interference (EMI). We propose a black-box modeling method, integrated circuits for RF immunity behavioral simulation—conducted immunity modeling using particle swarm optimization and piecewise Volterra series [ICIM-CI(PSVIB)]. This method leverages particle swarm optimization (PSO) and piecewise Volterra Series to enhance the immunity behavior module of the ICIM-CI model, aimed at simulating RF immunity in integrated circuits for conducted immunity scenarios. The proposed model accurately describes the nonlinear behavior of integrated circuits using the piecewise Volterra series and significantly improves model accuracy and generality by optimizing the segmentation threshold with the PSO algorithm. This approach overcomes the limitations of traditional ICIM-CI models, which assume linearity and thus struggle to precisely capture the nonlinear response of mixed analog-digital integrated circuits under EMI. Additionally, the proposed model addresses deficiencies in quantitative sensitivity analysis, output of quantitative information, and parametric cascade simulation. Experimental results demonstrate that the ICIM-CI (PSVIB) model provides accurate quantitative sensitivity analysis, outputs comprehensive quantitative information, supports parametric cascade simulation, and exhibits high generality. Compared to the traditional ICIM-CI model, the normalized mean square error of broadband modeling improves by at least 7.3 dB.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"510-520"},"PeriodicalIF":2.0,"publicationDate":"2024-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142887509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

On the Application of the Guided-Wave Approach to Reproduce the Electromagnetic Fields Radiated by Precursory Pulses in Altitude-Triggered Lightning 导波法在高度触发闪电前兆脉冲电磁场再现中的应用

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-25 DOI: 10.1109/TEMC.2024.3507793

Quanxin Li;Guohua Yang;Chijie Zhuang;Yang Zhang;Weitao Lyu;Bo Zhang;Jinliang He

引用次数: 0

IEEE Electromagnetic Compatibility Society Information IEEE电磁兼容协会信息

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-19 DOI: 10.1109/TEMC.2024.3504884

引用次数: 0