{"title":"Passive Shielding Integrity Monitoring Method Using Signals-of-Opportunity and Software-Defined Radios","authors":"Ridvan Aba;Robert Vogt-Ardatjew;Karol Niewiadomski;Ryan Groot;Hans Schipper;Frank Leferink","doi":"10.1109/TEMC.2026.3680655","DOIUrl":"10.1109/TEMC.2026.3680655","url":null,"abstract":"Effective shielding is crucial for a range of applications, such as safeguarding information-sensitive systems and providing protection against the effects of high-altitude, nuclear, or lightning-induced electromagnetic pulses. Since the deterioration of the shield can have serious consequences, real-time monitoring is critical to ensure the continuous shielding integrity. Conventional shielding effectiveness measurement techniques are limited to periodic evaluations, making them unsuitable for real-time monitoring. Furthermore, conventional shielding effectiveness measurements rely on high field strength electromagnetic signals which are not desired for continuous assessment. This article proposes a passive shielding integrity monitoring method particularly designed for on-site conditions, using signals-of-opportunity and software-defined radio-based receivers. Unlike conventional methods, due to its small footprint, the proposed method is able to be applied in operational enclosures with contents. Experimental results have shown the feasibility and adaptability of the proposed method. The proposed method allows the bridging between periodic evaluations and real-time monitoring and helps in mitigating the risks associated with the potential electromagnetic leakage of interfering signals or compromising emanations, thereby significantly enhancing information security for sensitive environments and critical infrastructure.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"876-885"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147695673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Member Discount","authors":"","doi":"10.1109/TEMC.2026.3722412","DOIUrl":"https://doi.org/10.1109/TEMC.2026.3722412","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"1047-1047"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11657631","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148747981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Qiusen He;Anfeng Huang;Chenxi Liu;Jie Luo;Zhitong Guo;Yin Sun;Jun Fan;Xinglin Sun
{"title":"A Novel Permeability Extraction Method for Nanocrystalline Shielding Sheet in Magnetic Snap-On WPT Applications","authors":"Qiusen He;Anfeng Huang;Chenxi Liu;Jie Luo;Zhitong Guo;Yin Sun;Jun Fan;Xinglin Sun","doi":"10.1109/TEMC.2026.3677898","DOIUrl":"10.1109/TEMC.2026.3677898","url":null,"abstract":"Magnetic shielding sheets in wireless power transfer (WPT) systems exert a critical influence on both energy transfer efficiency and electromagnetic compatibility (EMC) performance. Commonly used high-performance layered nanocrystalline shielding sheets exhibit notable discrepancies between the effective permeability of their layered structures and the intrinsic permeability of the nanocrystalline flake ribbon materials. The design of their stacking critically determine the equivalent permeability of these shielding sheets. The precise characterization of permeability in layered nanocrystalline shielding sheets presents a challenge, which limits the accuracy of performance simulations in WPT systems. In addition, in recent widely used magnetic snap-on WPT applications, inadequate permanent magnet design can lead to the saturation of permeability in layered nanocrystalline shielding sheets, severely hindering power transfer efficiency. This study proposes an efficient method for rapid permeability characterization of layered nanocrystalline shielding sheets, solving the permanent magnet-influenced WPT challenge and preventing nanocrystalline saturation from bad permanent magnet design of magnetic snap-on WPT application.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"1035-1046"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147684723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Field-to-Wire Coupling Model for Arbitrarily Routed Shielded Cables Above Ground","authors":"Bing Li;Jiayue Xing;Wenxuan Huang;Yaoyao Li;Weiping Tong;Zongfei Zhou","doi":"10.1109/TEMC.2026.3686982","DOIUrl":"https://doi.org/10.1109/TEMC.2026.3686982","url":null,"abstract":"In this article, transmission line (TL) theory is applied to the modeling of shielded cables with arbitrary routing paths above ground, enabling efficient and accurate prediction of field-to-wire coupling effects. The external electromagnetic field is first modeled either analytically (such as via plane wave illumination) or numerically (such as through nonuniform complex fields), and the cable path is discretized for field sampling along its trajectory. Afterward, a segmented TL-based external-loop circuit model is established, and the current distribution in the external loop is obtained through a recursive chain parameter algorithm. With an appropriate transfer impedance model, a segmented TL-based internal-loop circuit is subsequently formulated to determine the induced terminal currents. The accuracy and efficiency of the proposed model are verified through three representative full-wave simulation cases involving tubular-shield coaxial and multiconductor cables with both straight and arbitrarily routed (Gaussian-modulated helical) paths, including dielectric-coated, lossy, and segmentwise nonuniform shielding configurations, driven by analytical plane wave and numerically simulated fields. Furthermore, the proposed method was validated through radiated susceptibility experiments in a gigahertz transverse electromagnetic cell using three braided-shield coaxial cables arranged along straight and parabolic paths.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"990-1001"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148747984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis and Optimization of ESD-induced Soft Failure in a Microcontroller Unit","authors":"Jiabei Pan;Ling Zhang;Yipeng Chen;Er-Ping Li;Shurong Dong","doi":"10.1109/TEMC.2026.3695921","DOIUrl":"https://doi.org/10.1109/TEMC.2026.3695921","url":null,"abstract":"The continuous scaling of complementary metal oxide semiconductor process technology has necessitated a reduction in operating voltages, thereby diminishing the noise margins of chips. Consequently, the ground bounce induced by electrostatic discharge events is more likely to cause critical power supply fluctuations, leading to soft failures in the chip. To rapidly identify design vulnerabilities, this article developed a power supply noise simulation model and integrated it into the full microcontroller unit (MCU) performance simulation flow to predict noise levels and guide design modifications. A power supply noise measurement method that requires no additional circuitry is further proposed to monitor key signals associated with soft failures on the MCU. Through improvements in down-bond packaging and a redesign of the low-dropout regulator and phase-locked loop circuits, the chip’s soft failure level is enhanced by a factor of more than 10 without increasing die area or degrading chip performance.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"856-866"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148748583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shivdeep;Sahil Sharma;Mahendra Sakare;Devarshi Mrinal Das
{"title":"Mitigating EMI Susceptibility in Three OpAmp INA With a High CMRR EMI Immune OTA","authors":"Shivdeep;Sahil Sharma;Mahendra Sakare;Devarshi Mrinal Das","doi":"10.1109/TEMC.2026.3677893","DOIUrl":"10.1109/TEMC.2026.3677893","url":null,"abstract":"Operational transconductance amplifiers (OTAs) are susceptible to conducted electromagnetic interference (EMI) reaching their input terminals. A DC OOV is generated, and it shifts the biasing of the circuit, which may cause an erroneous output or saturation in the worst case. The three-OpAmp instrumentation amplifier (INA) is widely used in analog front-end circuits for sensor interfacing, where the common-mode rejection ratio (CMRR) is an important performance specification. This article investigates the EMI-susceptibility of the three-OpAmp INA and presents an EMI-immune two-stage OTA with Miller compensation design to minimize the EMI-induced offset voltage in the three-OpAmp INA. The CMRR and in-band offset of the INA are taken into consideration along with EMI immunity. High CMRR of <inline-formula><tex-math>$>$</tex-math></inline-formula> 81 dB and low in-band offset voltage of <inline-formula><tex-math>$< $</tex-math></inline-formula>298 <inline-formula><tex-math>$mu$</tex-math></inline-formula>V of the EMI-immune INA is measured on the IC fabricated using UMC 180 nm CMOS technology.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"867-875"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147684725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Differentiable Transfer-Matrix Method for Gradient-Based Inverse Design of Multilayer Electromagnetic Shields","authors":"Jake W. Liu","doi":"10.1109/TEMC.2026.3692385","DOIUrl":"10.1109/TEMC.2026.3692385","url":null,"abstract":"Inverse design of multilayer electromagnetic shields is a challenging problem due to nonlinear, frequency-dependent interactions between lossy conductors and dispersive magnetic materials. Existing approaches rely on derivative-free metaheuristics that require thousands of function evaluations, limiting scalability to many-layer stacks. This work presents a differentiable transfer-matrix method that enables gradient-based optimization of multilayer shield designs. The method combines a scattering matrix (S-matrix) recursion—unconditionally stable for arbitrarily thick lossy layers—with forward-mode automatic differentiation to provide exact shielding effectiveness (SE) gradients, and a softmax reparameterization that satisfies total-thickness budget constraints exactly at every iteration. Comprehensive validation confirms agreement with analytical solutions, independent finite-difference (FD) time-domain simulation, and FD gradient verification. The gradient-based optimizer limited-memory Broyden–Fletcher–Goldfarb–Shanno (L-BFGS) converges in one to two orders of magnitude fewer evaluations than differential evolution (DE) on 2–20 layer shield design problems, and reaches at least comparable SE; the residual gap reflects stagnation of the DE baseline in local optima of the multimodal SE landscape under the stated hyperparameter settings, rather than a fundamental performance ceiling of the baseline method. Including frequency-dispersive permeability in the differentiable model reveals that nondispersive permeability assumptions can significantly overestimate achievable broadband shielding performance.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"886-895"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148287211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
GyeongRyun Choi;Taewook Kwon;Hanyang Li;Geun-Ho Kim;Hongsik Keum;Wansoo Nah
{"title":"IEC 61000-4-41: Test Signal Calibration Compensating for High-Power Amplifier Non-Linearity Using Digital Predistortion","authors":"GyeongRyun Choi;Taewook Kwon;Hanyang Li;Geun-Ho Kim;Hongsik Keum;Wansoo Nah","doi":"10.1109/TEMC.2026.3702268","DOIUrl":"10.1109/TEMC.2026.3702268","url":null,"abstract":"This article proposes, for the first time, a calibration method for the newly established IEC 61000-4-41 radiated immunity (RI) standard to prevent distortion of broadband test signals. Broadband signals exhibit high peak-to-average power ratios (PAPR) and are highly sensitive to the frequency-dependent nonlinearities of high-power amplifiers, causing conventional calibration to produce nonuniform signal power, spectrum mask violations, and PAPR reduction due to amplifier saturation. To address these issues, signal distortion is analyzed based on IEC 61000-4-41 requirements, which specify both a spectrum mask and PAPR criteria, and a flatness parameter is introduced to quantify spectrum-mask violations. Signal distortion is then compensated by using digital predistortion together with an adaptive output power alignment algorithm. This method restores flatness, prevents PAPR reduction, and equalizes channel power across the full test-frequency range. Over-the-air measurements verify that the proposed method satisfies the IEC 61000-4-41 spectrum mask at all frequencies and reduces channel-power variation from 2.67to 0.78 dB. By preserving the intrinsic waveform characteristics, the method ensures consistent test conditions and provides a basis for identifying which signal parameters lead to the worst-case immunity of the equipment under test under equal-power conditions.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"844-855"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148415054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yuan Zhao;Jing Li;Huapeng Zhao;Jiqian Wang;Chenyang He;Guohong Du
{"title":"Statistical Analysis of Electromagnetic Field Radiated by Printed Circuit Board Inside the Perforated Shielding Enclosure in Time-Domain","authors":"Yuan Zhao;Jing Li;Huapeng Zhao;Jiqian Wang;Chenyang He;Guohong Du","doi":"10.1109/TEMC.2026.3692707","DOIUrl":"https://doi.org/10.1109/TEMC.2026.3692707","url":null,"abstract":"Within a shielding enclosure with apertures, the electromagnetic field radiated by the built-in printed circuit board (PCB) will form a complex internal electromagnetic environment (EME), which potentially impacts the operational performance of the PCB itself and the others. In this article, the electromagnetic compatibility issue is studied through statistical method in time-domain. First, a near-field scanning system was developed to measure the radiated electromagnetic field, which was compared with simulated results to verify the consistency with each other. Second, the statistical characteristics of the internal EME was analyzed based on kernel density estimation and statistic parameter estimation to identify its statistical properties under three distinct scenarios: PCB is excited by different signals; PCB is located at different positions inside the enclosure; and different observation time. It was found that under the aforementioned different conditions, the time-domain magnetic field inside the perforated shielding enclosure exhibits similar statistical characteristics when the PCB is positioned at the same location. These characteristics are independent of the excitation signal and time, and all approximately follow a lognormal distribution.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"973-981"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148747978","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reconstructing Electromagnetic Field in Enclosures From Sparse Probes: The Effect of Probe Placement","authors":"Jon W. Wallace;Chandler B. Smith","doi":"10.1109/TEMC.2026.3678196","DOIUrl":"10.1109/TEMC.2026.3678196","url":null,"abstract":"A framework is developed for reconstructing electromagnetic (EM) field inside metallic enclosures from sparse probe measurements, where one application is comprehensive evaluation of shielding effectiveness (SE) from measurement data. The effect of probe placement on the quality of field reconstruction is studied through simulations and measurements to understand the importance of optimizing SE experiments. Monte Carlo simulations with an efficient modal simulation technique are performed on 200 candidate probe sets to sample the probe placement domain space and associated reconstruction error distributions. A limited number of direct experiments are also performed on a custom-designed test vessel with highly configurable probes. Simulations and experiments confirm that the importance of optimizing probe location increases as the number of probes is reduced. Surprisingly, using the strategy of spreading out probe locations in an ad hoc manner gives reconstructions with relatively poor fidelity. Good probe sets, identified from the Monte Carlo simulations, yield useful experimental reconstruction performance (error of 1.8 dB and 2.7 dB at the 90% probability level for six and four probes, respectively). These results demonstrate that probe locations can be optimized using efficient modal simulation techniques, improving the quality of subsequent experiments and minimizing the error of reconstructed field.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 4","pages":"790-799"},"PeriodicalIF":2.6,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147684724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}