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IEEE Transactions on Electromagnetic Compatibility最新文献

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Generation and Application of a Very Large Dataset for Signal Integrity Via Array and Link Analysis 通过阵列和链路分析生成和应用超大型信号完整性数据集
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-18 DOI: 10.1109/temc.2024.3450307
Til Hillebrecht, Morten Schierholz, Youcef Hassab, Johannes Alfert, Christian Schuster
{"title":"Generation and Application of a Very Large Dataset for Signal Integrity Via Array and Link Analysis","authors":"Til Hillebrecht, Morten Schierholz, Youcef Hassab, Johannes Alfert, Christian Schuster","doi":"10.1109/temc.2024.3450307","DOIUrl":"https://doi.org/10.1109/temc.2024.3450307","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"65 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142245497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Visualization of Noise Coupling Paths Based on the Reciprocity Theorem 基于互易定理的噪声耦合路径可视化
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-18 DOI: 10.1109/TEMC.2024.3425575
Seungtaek Jeong;Jong Hwa Kwon;Deepak Pai;Jagan Rajagopalan;Chulsoon Hwang
{"title":"Visualization of Noise Coupling Paths Based on the Reciprocity Theorem","authors":"Seungtaek Jeong;Jong Hwa Kwon;Deepak Pai;Jagan Rajagopalan;Chulsoon Hwang","doi":"10.1109/TEMC.2024.3425575","DOIUrl":"10.1109/TEMC.2024.3425575","url":null,"abstract":"In this article, visualization of noise coupling paths is proposed and verified. The coupling coefficient (\u0000<italic>CC</i>\u0000) is derived based on the Reciprocity theorem and time-average coupled power, which represents the contribution of each spatial point to the coupled power. The physical meaning of \u0000<italic>CC</i>\u0000 is demonstrated by relating the integrations of \u0000<italic>CC</i>\u0000 in a volume space occupied by absorbers to the coupled power being suppressed by the absorbers. The proposed method is applied to a practical device and the identified dominant coupling paths are experimentally verified.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1505-1514"},"PeriodicalIF":2.0,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142245498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Lightning Transient Impulse Problem of Substation Grounding Grid in Multilayer Horizontal Layered Soil Considering Soil Ionization Effect and Frequency Characteristics 考虑土壤电离效应和频率特性的多层水平层土壤中变电站接地网雷电暂态冲击问题
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-17 DOI: 10.1109/temc.2024.3452419
Jian-Bin Fan, Zhong-Xin Li
{"title":"Lightning Transient Impulse Problem of Substation Grounding Grid in Multilayer Horizontal Layered Soil Considering Soil Ionization Effect and Frequency Characteristics","authors":"Jian-Bin Fan, Zhong-Xin Li","doi":"10.1109/temc.2024.3452419","DOIUrl":"https://doi.org/10.1109/temc.2024.3452419","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"4 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimized CPML for Emulating Electromagnetic Absorbers in Simulations and Its Optimization Utilizing Artificial Neural Network 仿真电磁吸收器的优化 CPML 及其人工神经网络优化
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-17 DOI: 10.1109/temc.2024.3454411
Kun-Lai Li, Xinran Ba, Yongliang Zhang, Zhengpeng Wang, Xiaoming Chen
{"title":"Optimized CPML for Emulating Electromagnetic Absorbers in Simulations and Its Optimization Utilizing Artificial Neural Network","authors":"Kun-Lai Li, Xinran Ba, Yongliang Zhang, Zhengpeng Wang, Xiaoming Chen","doi":"10.1109/temc.2024.3454411","DOIUrl":"https://doi.org/10.1109/temc.2024.3454411","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"33 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study on the Effects of Burst Pulse Magnetic Field Interference in IGBT Switching Circuit for High Power Application 大功率应用 IGBT 开关电路中突发脉冲磁场干扰的影响研究
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-16 DOI: 10.1109/temc.2024.3454081
Zheng-Wei Du, Zhe Chen, Dongyan Zhao, Yuankui Wang, Rui Wu, Hui Li, Jin Meng, Wei-Heng Shao, Xin Zhang, Wen-Yan Yin
{"title":"Study on the Effects of Burst Pulse Magnetic Field Interference in IGBT Switching Circuit for High Power Application","authors":"Zheng-Wei Du, Zhe Chen, Dongyan Zhao, Yuankui Wang, Rui Wu, Hui Li, Jin Meng, Wei-Heng Shao, Xin Zhang, Wen-Yan Yin","doi":"10.1109/temc.2024.3454081","DOIUrl":"https://doi.org/10.1109/temc.2024.3454081","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"32 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling of 10 kV Distribution Transformer Excited by Three-Phase Common Mode Transients 受三相共模瞬态激励的 10 kV 配电变压器建模
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-16 DOI: 10.1109/temc.2024.3454985
Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Ning Dong
{"title":"Modeling of 10 kV Distribution Transformer Excited by Three-Phase Common Mode Transients","authors":"Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Ning Dong","doi":"10.1109/temc.2024.3454985","DOIUrl":"https://doi.org/10.1109/temc.2024.3454985","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"32 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impedance Reconstruction of Airborne Coaxial Cable for Non-Uniformity Test 用于非均匀性测试的机载同轴电缆阻抗重构
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-12 DOI: 10.1109/temc.2024.3454098
Hongxu Zhao, Kun Lei, Zihan Zheng, Xudong Shi
{"title":"Impedance Reconstruction of Airborne Coaxial Cable for Non-Uniformity Test","authors":"Hongxu Zhao, Kun Lei, Zihan Zheng, Xudong Shi","doi":"10.1109/temc.2024.3454098","DOIUrl":"https://doi.org/10.1109/temc.2024.3454098","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"20 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142174595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improving Static Energy Meter Robustness Against Conducted EMI With an Analog Low-Pass Filter 利用模拟低通滤波器提高静态电能表对传导 EMI 的抗干扰能力
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-12 DOI: 10.1109/TEMC.2024.3434397
Tom Hartman;Martin van Mast;Bas ten Have;Niek Moonen;Frank Leferink
{"title":"Improving Static Energy Meter Robustness Against Conducted EMI With an Analog Low-Pass Filter","authors":"Tom Hartman;Martin van Mast;Bas ten Have;Niek Moonen;Frank Leferink","doi":"10.1109/TEMC.2024.3434397","DOIUrl":"10.1109/TEMC.2024.3434397","url":null,"abstract":"Static energy meters are used for billing purposes of the energy consumption. Those that utilize a Rogowski coil as their current transducer have shown the highest susceptibility to conducted electromagnetic interference resulting in misreadings. These disturbances occur due to pulsed currents with steep slopes with higher frequency content, drawn by nonlinear household appliances. This has resulted in over- and underestimations of the energy bill, and even in a perceived energy generation. This article describes improving the robustness against conducted electromagnetic interference by using the orthogonality of power flow principle, thus focusing only on the fundamental, in contrary to the energy metering trend of increasing the measurement bandwidth. A first-order low-pass filter is implemented between the current transducer and the amplifier to reduce interference without affecting the 50 Hz signal. The results show a reduction of errors from 1632% down to below 2.5%.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1382-1388"},"PeriodicalIF":2.0,"publicationDate":"2024-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142174592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Estimation of Reference Impedance in 2x-thru De-embedding With High Conductor-Loss Lines 高导体损耗线路 2x-thru 解嵌中的参考阻抗估算
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-11 DOI: 10.1109/TEMC.2024.3445346
Chiu-Chih Chou
{"title":"Estimation of Reference Impedance in 2x-thru De-embedding With High Conductor-Loss Lines","authors":"Chiu-Chih Chou","doi":"10.1109/TEMC.2024.3445346","DOIUrl":"10.1109/TEMC.2024.3445346","url":null,"abstract":"The 2x-thru de-embedding has emerged as an attractive alternative to the classical TRL for \u0000<italic>S</i>\u0000 parameter measurement of printed circuit board and packaging devices, mainly due to its simplicity that only one THRU standard suffices to fully characterize the test fixtures over broad bandwidth. The \u0000<italic>S</i>\u0000 parameters after 2x-thru de-embedding are referenced to the characteristic impedance of the transmission line in THRU, and accurate estimation of this reference impedance (Zref) is important for subsequent renormalization and time-domain simulation. In 2x-thru literature, only constant estimate of Zref, mostly based on the time-domain reflectometry (TDR), has been reported. However, the characteristic impedance of a transmission line is frequency dependent, and the TDR may not be flat for high conductor-loss lines. In this article, we analytically show that the TDR is an increasing function in time, and propose an innovative method to estimate Zref by fitting the TDR with a causal impedance model. Simulation and measurement examples are provided to validate the proposed theory and technique, and to show the importance of using accurate Zref for renormalization in 2x-thru de-embedding.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1315-1328"},"PeriodicalIF":2.0,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142170782","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Accelerate IEMI Evaluation in the Design Stage Using Parametric Vector-Fitting 利用参数矢量拟合加速设计阶段的 IEMI 评估
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-11 DOI: 10.1109/temc.2024.3453556
Mingwen Zhang, Chunguang Ma, Ruilong Song, Yong Luo
{"title":"Accelerate IEMI Evaluation in the Design Stage Using Parametric Vector-Fitting","authors":"Mingwen Zhang, Chunguang Ma, Ruilong Song, Yong Luo","doi":"10.1109/temc.2024.3453556","DOIUrl":"https://doi.org/10.1109/temc.2024.3453556","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"45 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142170780","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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