Response of Metal-Oxide Varistors Excited by Consecutive Early-Time and Intermediate-Time HEMP Conducted Currents

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Dao-zhong Zhang;Yan-zhao Xie;Yi Zhou;Yun-peng Zhang
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引用次数: 0

Abstract

High-altitude electromagnetic pulse (HEMP) can be divided into three parts: 1) early-time HEMP (E1); 2) intermediate-time HEMP (E2); and 3) late-time HEMP (E3). Most studies focus on E1 alone, as E2 and E3 pose lower peak value, especially E2, which is considered less severe than lightning. However, E2 coexists with E1 and affects victim equipment simultaneously, which may result in different effects than E1 or E2 alone. As the most widely used surge protection device, the behavior of metal-oxide varistors (MOVs) under the consecutive E1 and E2 should be investigated and compared with those under E1 or E2 alone. Based on a pulse current injection platform, the voltage, current, susceptibility, and nonuniformity behavior of two types of MOVs under the separate E1, E2, and consecutive E1 and E2 disturbances are investigated and compared. The peak residual voltages of the MOV samples under consecutive E1 and E2 disturbances reach 15 kV, which is the same as that under the E1 disturbance and much higher than that under the E2 disturbance (1.5 kV). The MOV samples are more sensitive to the consecutive E1 and E2 disturbance, particularly those with a higher nonuniformity. Finally, the response process is discussed based on the microstructural nonuniformity of MOVs.
金属氧化物压敏电阻在连续早期和中期HEMP传导电流激励下的响应
高空电磁脉冲(HEMP)可分为三部分:1)早期HEMP (E1);2)中间期HEMP (E2);3)后期HEMP (E3)。大多数研究只关注E1, E2和E3的峰值较低,尤其是E2,被认为不如闪电严重。但E2与E1共存,同时对受害设备产生影响,可能会产生不同于单独E1或E2的效果。金属氧化物压敏电阻作为应用最广泛的浪涌保护器件,应研究其在连续E1和E2下的行为,并与单独在E1或E2下的行为进行比较。基于脉冲电流注入平台,研究并比较了两种移动电机在单独E1、E2和连续E1、E2干扰下的电压、电流、磁化率和非均匀性行为。MOV样品在E1和E2连续扰动下的残余电压峰值达到15 kV,与E1扰动下的残余电压峰值相同,远高于E2扰动下的残余电压峰值(1.5 kV)。MOV样品对连续E1和E2干扰更敏感,特别是那些不均匀性较高的样品。最后,讨论了基于微结构非均匀性的动体响应过程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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