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IEEE Design & Test Publication Information IEEE 设计与测试出版物信息
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2024.3357922
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引用次数: 0
A BIST Approach to Approximate Co-Testing of Embedded Data Converters 嵌入式数据转换器近似协同测试的 BIST 方法
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-14 DOI: 10.1109/mdat.2024.3365958
Kushagra Bhatheja, Shravan Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Issac Bruce, Degang Chen
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引用次数: 0
Testing for Multiple Faults in Deep Neural Networks 测试深度神经网络中的多重故障
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-13 DOI: 10.1109/mdat.2024.3365988
Dina A. Moussa, Michael Hefenbrock, Mehdi Tahoori
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引用次数: 0
Efficient Aspect Verification and Debug of High-Performance Microprocessor Designs 高性能微处理器设计的高效指标验证和调试
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-06 DOI: 10.1109/mdat.2024.3363085
Arun Joseph, Pretty Mariam Jacob, Matthias Klein, Wolfgang Roesner
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引用次数: 0
Losing My Memory 失去记忆
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-17 DOI: 10.1109/mdat.2023.3312570
Scott Davidson
{"title":"Losing My Memory","authors":"Scott Davidson","doi":"10.1109/mdat.2023.3312570","DOIUrl":"https://doi.org/10.1109/mdat.2023.3312570","url":null,"abstract":"I was happy to see the article on estimating memory usage by Yoon et al. in this issue of <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">IEEE Design&amp;Test</i>\u0000. I have not seen much work on this subject lately. I have heard those who do software for embedded systems rightly express pride in how efficiently they write code but judging from the memory usage data on programs I run on my laptop, many modern software developers are allergic to the system call that frees up memory. I check this because my somewhat antiquated computer (eight years old) runs slowly. But what should I expect? It has only 6 GB of memory.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ethics in Computing 计算机伦理
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-17 DOI: 10.1109/mdat.2023.3340991
Partha Pratim Pande
{"title":"Ethics in Computing","authors":"Partha Pratim Pande","doi":"10.1109/mdat.2023.3340991","DOIUrl":"https://doi.org/10.1109/mdat.2023.3340991","url":null,"abstract":"<fig orientation=\"portrait\" position=\"float\" xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\"> <graphic orientation=\"portrait\" position=\"float\" xlink:href=\"pande-3340991.tif\"/> </fig> The articles in this issue are divided into three groups: 1) the first group comprises the Special Issue on Ethics in Computing articles; 2) the second group consists of general interest articles; and 3) additionally, we have a tutorial article in this issue.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special Issue on Ethics in Computing 计算机伦理特刊
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-17 DOI: 10.1109/mdat.2023.3331319
Sudeep Pasricha, Marilyn Wolf
{"title":"Special Issue on Ethics in Computing","authors":"Sudeep Pasricha, Marilyn Wolf","doi":"10.1109/mdat.2023.3331319","DOIUrl":"https://doi.org/10.1109/mdat.2023.3331319","url":null,"abstract":"Computing systems are tightly integrated today into our professional, social, and private lives. These systems span the gamut of wearables and smart home Internet of Things (IoT) edge devices, to automotive cyber-physical systems (CPS), and massive cloud computing data center facilities. An important consequence of this growing ubiquity of computing is that it can have significant ethical implications, which computing professionals should carefully take into consideration. In most real-world scenarios, it is not immediately obvious how particular technical choices could be viewed from an ethical perspective.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ISLPED 2023: International Symposium on Low-Power Electronics and Design ISLPED 2023：低功耗电子与设计国际研讨会
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-17 DOI: 10.1109/mdat.2023.3324518
Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen
{"title":"ISLPED 2023: International Symposium on Low-Power Electronics and Design","authors":"Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen","doi":"10.1109/mdat.2023.3324518","DOIUrl":"https://doi.org/10.1109/mdat.2023.3324518","url":null,"abstract":"The ISLPED 2023 conference was held as a presence-only event from 6 to 8 August 2023, at the premises of the Technische Universität TU Wien near the center of Vienna, Austria. It was the first presence-only meeting after the disruption due to the COVID-19 pandemic, which was very much enjoyed by all delegates. 35 full papers and 18 posters were presented in two parallel sessions. Also, two keynote presentations, one special session, and one panel were organized. In addition, a design contest with seven participants was conducted. Again, artificial neural network-based machine-learning topics have been prominently represented in both the technical and special sessions.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The 28th IEEE European Test Symposium 第 28 届电气和电子工程师学会欧洲测试研讨会
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-17 DOI: 10.1109/mdat.2023.3292800
Naghmeh Karimi
{"title":"The 28th IEEE European Test Symposium","authors":"Naghmeh Karimi","doi":"10.1109/mdat.2023.3292800","DOIUrl":"https://doi.org/10.1109/mdat.2023.3292800","url":null,"abstract":"The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22–26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe’s premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS’23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students).","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking 学习你的锁利用逻辑锁定中的结构漏洞
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-01-15 DOI: 10.1109/mdat.2024.3354569
Prabuddha Chakraborty, Jonathan Cruz, Rasheed Almawzan, Tanzim Mahfuz, Swarup Bhunia
{"title":"Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking","authors":"Prabuddha Chakraborty, Jonathan Cruz, Rasheed Almawzan, Tanzim Mahfuz, Swarup Bhunia","doi":"10.1109/mdat.2024.3354569","DOIUrl":"https://doi.org/10.1109/mdat.2024.3354569","url":null,"abstract":"This article argues the need for structural security in securing logic locking against learning-based attacks.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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