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Exploring Resilience of LPDRAM against RowHammer 探索 LPDRAM 抵御 RowHammer 的能力
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-09-02 DOI: 10.1109/mdat.2024.3453197
Anandpreet Kaur, Pravin Srivastav, Bibhas Ghoshal
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引用次数: 0
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities 硅生命周期管理（SLM）：需求、趋势和机遇
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-09-02 DOI: 10.1109/mdat.2024.3453192
Mehdi Tahoori, Seyedeh Maryam Ghasemi, Yervant Zorian
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引用次数: 0
Postquantum Cryptography for Internet of Things 物联网后量子密码学
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3419062
Partha Pratim Pande
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引用次数: 0
IEEE Design & Test Publication Information IEEE 设计与测试出版物信息
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3436433
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引用次数: 0
Get in the Conversation! 参与对话！
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3447860
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引用次数: 0
DATE 2024: Consolidating the New Conference Format DATE 2024：整合新的会议形式
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3394320
Andy D. Pimentel, Valeria Bertacco, Aida Todri-Sanial, Theocharis Theocharides
{"title":"DATE 2024: Consolidating the New Conference Format","authors":"Andy D. Pimentel, Valeria Bertacco, Aida Todri-Sanial, Theocharis Theocharides","doi":"10.1109/mdat.2024.3394320","DOIUrl":"https://doi.org/10.1109/mdat.2024.3394320","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142183629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TechRxiv: Share Your Preprint Research With the World! TechRxiv：与世界分享您的预印本研究成果！
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3436437
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引用次数: 0
IEEE Membership IEEE 会员
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3436431
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引用次数: 0
Special Issue on Postquantum Cryptography for Internet of Things 物联网后量子密码学特刊
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3400894
Shivam Bhasin, Anupam Chattopadhyay, Tim Güneysu, Swarup Bhunia
{"title":"Special Issue on Postquantum Cryptography for Internet of Things","authors":"Shivam Bhasin, Anupam Chattopadhyay, Tim Güneysu, Swarup Bhunia","doi":"10.1109/mdat.2024.3400894","DOIUrl":"https://doi.org/10.1109/mdat.2024.3400894","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142183633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Connects You to a Universe of Information! IEEE 将您与信息世界相连！
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3448009
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引用次数: 0
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