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Interview With Vishwani Agrawal 采访 Vishwani Agrawal
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3416393
Nicola Nicolici
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引用次数: 0
Attack of the AI Papers 人工智能论文的攻击
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-28 DOI: 10.1109/mdat.2024.3419058
Scott Davidson
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引用次数: 0
Background Receiver IQ Imbalance Correction for In-Field Testing 场内测试背景接收器智商失衡校正
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-27 DOI: 10.1109/mdat.2024.3450442
Muslum Emir Avci, Sule Ozev
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引用次数: 0
STAR: A Mixed Analog Stochastic In-DRAM Convolutional Neural Network Accelerator STAR：混合模拟随机 In-DRAM 卷积神经网络加速器
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-26 DOI: 10.1109/mdat.2024.3447580
Salma Afifi, Ishan Thakkar, Sudeep Pasricha
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引用次数: 0
Remote Power Side-Channel Attacks on FPGAs 针对 FPGA 的远程电源侧信道攻击
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-23 DOI: 10.1109/mdat.2024.3448371
Mark Zhao, G. Edward Suh
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引用次数: 0
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS 130 纳米 CMOS 中的开源 12 位 10 kS/s 增量 ADC
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-08-15 DOI: 10.1109/mdat.2024.3444728
Raymond H. Yang, Yaqing Xia
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引用次数: 0
A Survey of High Level Synthesis based Hardware (IP) Watermarking Approaches 基于高级合成的硬件（IP）水印方法概览
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-07-29 DOI: 10.1109/mdat.2024.3435056
Anirban Sengupta, Aditya Anshul
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引用次数: 0
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges 用于健康监测的可自我维持的可穿戴设备和物联网（IoT）设备：机遇与挑战
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-07-29 DOI: 10.1109/mdat.2024.3432862
Pietro Mercati, Ganapati Bhat
{"title":"Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges","authors":"Pietro Mercati, Ganapati Bhat","doi":"10.1109/mdat.2024.3432862","DOIUrl":"https://doi.org/10.1109/mdat.2024.3432862","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141862976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the Relation Between Reliability and Entropy in Physical Unclonable Functions 论物理不可克隆函数中可靠性与熵的关系
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-07-10 DOI: 10.1109/mdat.2024.3425791
Vasilii Kulagin, Sergio Vinagrero Gutierrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena-Ioana Vatajelu
{"title":"On the Relation Between Reliability and Entropy in Physical Unclonable Functions","authors":"Vasilii Kulagin, Sergio Vinagrero Gutierrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena-Ioana Vatajelu","doi":"10.1109/mdat.2024.3425791","DOIUrl":"https://doi.org/10.1109/mdat.2024.3425791","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141586026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
True Interactive Testing based on IJTAG 基于 IJTAG 的真正交互式测试
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-07-02 DOI: 10.1109/mdat.2024.3422128
Michele Portolan
{"title":"True Interactive Testing based on IJTAG","authors":"Michele Portolan","doi":"10.1109/mdat.2024.3422128","DOIUrl":"https://doi.org/10.1109/mdat.2024.3422128","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141507568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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