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Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024) 第 29 届亚洲及南太平洋设计自动化大会（ASPDAC 2024）回顾
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-04-23 DOI: 10.1109/mdat.2024.3371368
Taewhan Kim
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引用次数: 0
Blank Page 空白页
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-04-23 DOI: 10.1109/mdat.2024.3372177
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引用次数: 0
Fuzzing for Automated SoC Security Verification: Challenges and Solution 用于自动 SoC 安全验证的模糊测试：挑战与解决方案
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-03-18 DOI: 10.1109/mdat.2024.3377164
Muhammad Monir Hossain, Kimia Zamiri Azar, Fahim Rahman, Farimah Farahmandi, Mark Tehranipoor
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引用次数: 0
Conventional Tests for Approximate Scan Logic 近似扫描逻辑的常规测试
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-26 DOI: 10.1109/mdat.2024.3370824
Irith Pomeranz
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引用次数: 0
Blank Page 空白页
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2024.3363359
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引用次数: 0
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security 2021 年硬件和嵌入式安全精选研讨会特刊
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2023.3349082
Gang Qu
{"title":"Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security","authors":"Gang Qu","doi":"10.1109/mdat.2023.3349082","DOIUrl":"https://doi.org/10.1109/mdat.2023.3349082","url":null,"abstract":"The globalization of IC design is forcing IC and IP core designers and users to reconsider the security and trust of hardware as the semiconductor industry is losing multiple billions of dollars annually due to IP infringement. An attacker can reverse engineer the functionality of an IC/IP, steal and claim ownership of the IP, inject malicious circuitry into the IC, introduce counterfeits into the supply chain, or overbuild ICs/IPs and sell them illegally.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Report on the 2023 Embedded Systems Week (ESWEEK) 2023 年嵌入式系统周（ESWEEK）报告
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2023.3333795
Xiaobo Sharon Hu, Alain Girault, Heiko Falk
{"title":"Report on the 2023 Embedded Systems Week (ESWEEK)","authors":"Xiaobo Sharon Hu, Alain Girault, Heiko Falk","doi":"10.1109/mdat.2023.3333795","DOIUrl":"https://doi.org/10.1109/mdat.2023.3333795","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023) 第 42 届国际计算机辅助设计大会（ICCAD 2023）回顾
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2024.3351568
Evangeline Young
{"title":"Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023)","authors":"Evangeline Young","doi":"10.1109/mdat.2024.3351568","DOIUrl":"https://doi.org/10.1109/mdat.2024.3351568","url":null,"abstract":"This Year Marks our return to a fully in-person International Conference on Computer-Aided Design (ICCAD) after the COVID-19 pandemic. We are thrilled to resume an event with personal interactions and extensive networking while retaining some good practices adopted during the pandemic of having a virtual platform where participants and authors can connect remotely.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security 2021 年硬件和嵌入式安全精选研讨会特刊
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2024.3358221
Partha Pratim Pande
{"title":"Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security","authors":"Partha Pratim Pande","doi":"10.1109/mdat.2024.3358221","DOIUrl":"https://doi.org/10.1109/mdat.2024.3358221","url":null,"abstract":"<fig orientation=\"portrait\" position=\"float\" xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\"> <graphic orientation=\"portrait\" position=\"float\" xlink:href=\"pande-3358221.tif\"/> </fig> The articles in this issue are divided into three groups: 1) the first group are articles in the Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security; 2) the second group comprises general interest articles; and 3) additionally, we have two conference reports.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Predictions 预测
IF 2 4区 工程技术
IEEE Design & Test Pub Date : 2024-02-21 DOI: 10.1109/mdat.2024.3357778
Scott Davidson
{"title":"Predictions","authors":"Scott Davidson","doi":"10.1109/mdat.2024.3357778","DOIUrl":"https://doi.org/10.1109/mdat.2024.3357778","url":null,"abstract":"We engineers do a lot of predicting. When we design something, we predict how it will perform when implemented. We use tools like simulators and timing analyzers to help us refine these predictions, but getting silicon that runs as fast as you had hoped it would run is always a pleasant surprise.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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