Journal of Synchrotron Radiation最新文献_第9页

Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors. 利用金刚石薄膜和硅漂移探测器可视化同步加速器x射线光束详细轮廓的方法。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-05-01 Epub Date: 2025-04-22 DOI: 10.1107/S1600577525002838

Togo Kudo, Shinji Suzuki, Mutsumi Sano, Toshiro Itoga, Hiroyasu Masunaga, Shunji Goto, Sunao Takahashi

{"title":"Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors.","authors":"Togo Kudo, Shinji Suzuki, Mutsumi Sano, Toshiro Itoga, Hiroyasu Masunaga, Shunji Goto, Sunao Takahashi","doi":"10.1107/S1600577525002838","DOIUrl":"https://doi.org/10.1107/S1600577525002838","url":null,"abstract":"Contamination from nearby bending magnet radiation hinders precise and accurate determination of the true beam center of undulator radiation. To solve this problem, a semi-nondestructive method was developed to visualize the detailed profile of a synchrotron radiation beam by using a thin diamond film as a scatterer. As the beam passed through the diamond film, scattered X-rays were imaged using a pinhole camera and measured with a two-dimensional silicon drift detector (SDD) scan. With this configuration, the beam center was accurately determined by visualizing the radiation pattern distribution for each energy level of a pink X-ray beam within an aperture size of 1.5 mm × 1.5 mm, shaped by a front-end slit (FES) positioned upstream of the monochromator. Additionally, by scanning the FES in two dimensions with a reduced aperture of 0.4 mm × 0.4 mm, energy-resolved images were successfully obtained using the SDD at a fixed position. These images revealed the profile of undulator radiation over a broad area (with an aperture extending up to 4 mm) in a pre-slit positioned upstream of the FES, demonstrating good alignment with SPECTRA calculations. This method effectively eliminates contamination from nearby bending magnet radiation, a significant issue in previous approaches, enabling a direct and highly accurate determination of the true beam center.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"622-628"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067321/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144035767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

P21.1 at PETRA III - a high-energy X-ray diffraction beamline for physics and chemistry. PETRA III的P21.1 -物理和化学的高能x射线衍射光束线。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-05-01 Epub Date: 2025-04-22 DOI: 10.1107/S1600577525002826

Martin V Zimmermann, Oleh Ivashko, Fernando Igoa Saldaña, Jiatu Liu, Philipp Glaevecke, Olof Gutowski, Rüdiger Nowak, Katharina Köhler, Björn Winkler, Andreas Schöps, Horst Schulte-Schrepping, Ann Christin Dippel

引用次数: 0

Discorpy: algorithms and software for camera calibration and correction. 相机校准和校正的算法和软件。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-05-01 Epub Date: 2025-04-09 DOI: 10.1107/S1600577525002267

Nghia T Vo

引用次数: 0

A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL. 欧洲自由电子激光器FXE仪器上的高能劳厄x射线发射光谱仪。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-05-01 Epub Date: 2025-03-31 DOI: 10.1107/S1600577525001389

X Huang, Y Uemura, F Ardana-Lamas, P Frankenberger, M Knoll, H Yousef, H Wang, S Heder, M Nachtegaal, G Smolentsev, L Wang, L F Zhu, C Milne, F A Lima

{"title":"A high-energy Laue X-ray emission spectrometer at the FXE instrument at the European XFEL.","authors":"X Huang, Y Uemura, F Ardana-Lamas, P Frankenberger, M Knoll, H Yousef, H Wang, S Heder, M Nachtegaal, G Smolentsev, L Wang, L F Zhu, C Milne, F A Lima","doi":"10.1107/S1600577525001389","DOIUrl":"10.1107/S1600577525001389","url":null,"abstract":"The high-energy-resolution X-ray emission spectroscopy (XES) spectrometers available at the Femtosecond X-ray Experiment (FXE) instrument of the European XFEL operate in Bragg (reflective) geometry, with optimum performance in the range between 5 and 15 keV. However, they quickly lose efficiency above around 15 keV due to the decrease in reflectivity of the crystal analyzers at such high photon energies. This hampers high-energy-resolution spectroscopy experiments on heavy elements (e.g. 4d metals), which thus do not fully profit from the high-photon-energy capabilities of the European XFEL. Here we present the design, implementation and performance of a novel high-resolution XES spectrometer operating in Laue (transmission) geometry optimized for measurements at high photon energies (>15 keV). The High-Energy Laue X-ray emIssiOn Spectrometer (HELIOS) operates mainly in dispersive mode by placing the crystal analyzer inside or outside the Rowland circle. The Laue spectrometer performance in terms of energy resolution and efficiency is presented and discussed. Two Laue analyzers, silicon and quartz, have been tested at SuperXAS of the Swiss Light Source and at FXE of the European XFEL. The quartz analyzer was found to be about 2.7 times more efficient than the silicon one. The Laue spectrometer energy resolution (ΔE/E) reached at the FXE instrument is around 1.2 × 10-4. Depending on different user requests, the resolution can be further increased by using higher diffraction orders. The new Laue spectrometer increases the existing portfolio of XES spectrometers at FXE, enabling efficient implementation of ultrafast X-ray spectroscopies with high energy resolution at photon energies above 15 keV. This spectrometer will allow the expansion of studies in the field of ultrafast sciences, particularly including investigation of 4d elements using hard X-rays.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"506-523"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067320/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143755392","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Massive compression for high data rate macromolecular crystallography (HDRMX): impact on diffraction data and subsequent structural analysis. 高数据速率大分子晶体学（HDRMX）的大量压缩：对衍射数据和后续结构分析的影响。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-06 DOI: 10.1107/S1600577525000396

Herbert J Bernstein, Alexei S Soares, Kimberly Horvat, Jean Jakoncic

{"title":"Massive compression for high data rate macromolecular crystallography (HDRMX): impact on diffraction data and subsequent structural analysis.","authors":"Herbert J Bernstein, Alexei S Soares, Kimberly Horvat, Jean Jakoncic","doi":"10.1107/S1600577525000396","DOIUrl":"10.1107/S1600577525000396","url":null,"abstract":"New higher-count-rate, integrating, large-area X-ray detectors with framing rates as high as 17400 images per second are beginning to be available. These will soon be used for specialized macromolecular crystallography experiments but will require optimal lossy compression algorithms to enable systems to keep up with data throughput. Some information may be lost. Can we minimize this loss with acceptable impact on structural information? To explore this question, we have considered several approaches: summing short sequences of images, binning to create the effect of larger pixels, use of JPEG-2000 lossy wavelet-based compression, and use of Hcompress, which is a Haar-wavelet-based lossy compression borrowed from astronomy. We also explore the effect of the combination of summing, binning, and Hcompress or JPEG-2000. In each of these last two methods one can specify approximately how much one wants the result to be compressed from the starting file size. These provide particularly effective lossy compressions that retain essential information for structure solution from Bragg reflections.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"385-398"},"PeriodicalIF":2.5,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892891/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143366320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Image registration for accurate electrode deformation analysis in operando microscopy of battery materials. 电池材料operando显微镜中精确电极变形分析的图像配准。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-04 DOI: 10.1107/S1600577524012293

Tianxiao Sun, Robert Peng, Wenlong Li, Yijin Liu

{"title":"Image registration for accurate electrode deformation analysis in operando microscopy of battery materials.","authors":"Tianxiao Sun, Robert Peng, Wenlong Li, Yijin Liu","doi":"10.1107/S1600577524012293","DOIUrl":"10.1107/S1600577524012293","url":null,"abstract":"Operando imaging techniques have become increasingly valuable in both battery research and manufacturing. However, the reliability of these methods can be compromised by instabilities in the imaging setup and operando cells, particularly when utilizing high-resolution imaging systems. The acquired imaging data often include features arising from both undesirable system vibrations and drift, as well as the scientifically relevant deformations occurring in the battery sample during cell operation. For meaningful analysis, it is crucial to distinguish and separately evaluate these two factors. To address these challenges, we employ a suite of advanced image-processing techniques. These include fast Fourier transform analysis in the frequency domain, power spectrum-based assessments for image quality, as well as rigid and non-rigid image-registration methods. These techniques allow us to identify and exclude blurred images, correct for displacements caused by motor vibrations and sample holder drift and, thus, prevent unwanted image artifacts from affecting subsequent analyses and interpretations. Additionally, we apply optical flow analysis to track the dynamic deformation of battery electrode materials during electrochemical cycling. This enables us to observe and quantify the evolving mechanical responses of the electrodes, offering deeper insights into battery degradation. Together, these methods ensure more accurate image analysis and enhance our understanding of the chemomechanical interplay in battery performance and longevity.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"417-423"},"PeriodicalIF":2.5,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892904/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143191030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Macromolecular crystallography at SPring-8 and SACLA. SPring-8和SACLA的大分子晶体学。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-18 DOI: 10.1107/S1600577525000657

Masaki Yamamoto, Takashi Kumasaka

引用次数: 0

Resolution enhancement on single-shot X-ray spectrometers using a detuned non-dispersive multi-crystal analyzer. 用失谐非色散多晶分析仪提高单次x射线光谱仪的分辨率。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-17 DOI: 10.1107/S1600577525000505

Taito Osaka, Yuichi Inubushi, Takashi Kameshima, Ichiro Inoue, Makina Yabashi

{"title":"Resolution enhancement on single-shot X-ray spectrometers using a detuned non-dispersive multi-crystal analyzer.","authors":"Taito Osaka, Yuichi Inubushi, Takashi Kameshima, Ichiro Inoue, Makina Yabashi","doi":"10.1107/S1600577525000505","DOIUrl":"10.1107/S1600577525000505","url":null,"abstract":"This study proposes and demonstrates a simple method for improving the energy resolution in a single-shot X-ray spectrometer, which consists of a focusing mirror and a single-crystal analyzer. Two Si(220) channel-cut crystals arranged in a non-dispersive geometry are employed as the analyzer. The angular width of diffraction for the multi-crystal analyzer is reduced by detuning one of the crystals, thereby enhancing the energy resolution of the spectrometer while maintaining the energy range. A proof-of-principle experiment with 10.4 keV X-rays clearly shows a resolution enhancement by a factor of two. It was found that X-ray penetration within the crystals broadened the point-spread function on the detector, significantly impacting the energy resolution under highly detuned conditions. A long detector distance of greater than 14 m is expected to achieve a high energy resolution of 100 meV and a range of 80 eV, enabling full spectral characterization of X-ray free-electron laser radiation as well as advanced spectroscopy techniques.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"288-293"},"PeriodicalIF":2.5,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892894/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143442489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Compact laser-driven plasma X-ray source for time-resolved diffraction, spectroscopy and imaging experiments at ELI Beamlines. 紧凑型激光驱动等离子体x射线源，用于ELI光束线的时间分辨衍射，光谱和成像实验。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-19 DOI: 10.1107/S1600577525000645

Y Pulnova, T Parkman, B Angelov, I Baranova, A Zymaková, S Cipiccia, L Fardin, B A Yorke, R Antipenkov, D Peceli, O Hort, D D Mai, J Andreasson, J Nejdl

引用次数: 0

New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy. 扫描透射x射线显微术中新型光束强度在线同步监测系统。

IF 2.5 3区物理与天体物理

Journal of Synchrotron Radiation Pub Date : 2025-03-01 Epub Date: 2025-02-04 DOI: 10.1107/S1600577524012141

Yuchen Jiao, Xiangzhi Zhang, Zijian Xu, Zhen Yao, Tianxiao Sun, Yufei Zhang, Bo Zhao, Zhi Guo, Yong Wang, Xiangjun Zhen, Haigang Liu, Shasha Liang, Haitao Li, Xuanyu Zhao, Jian He, Renzhong Tai

{"title":"New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy.","authors":"Yuchen Jiao, Xiangzhi Zhang, Zijian Xu, Zhen Yao, Tianxiao Sun, Yufei Zhang, Bo Zhao, Zhi Guo, Yong Wang, Xiangjun Zhen, Haigang Liu, Shasha Liang, Haitao Li, Xuanyu Zhao, Jian He, Renzhong Tai","doi":"10.1107/S1600577524012141","DOIUrl":"10.1107/S1600577524012141","url":null,"abstract":"The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"424-431"},"PeriodicalIF":2.5,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892909/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143191045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0