{"title":"New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy.","authors":"Yuchen Jiao, Xiangzhi Zhang, Zijian Xu, Zhen Yao, Tianxiao Sun, Yufei Zhang, Bo Zhao, Zhi Guo, Yong Wang, Xiangjun Zhen, Haigang Liu, Shasha Liang, Haitao Li, Xuanyu Zhao, Jian He, Renzhong Tai","doi":"10.1107/S1600577524012141","DOIUrl":null,"url":null,"abstract":"<p><p>The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"424-431"},"PeriodicalIF":2.5000,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892909/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577524012141","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/2/4 0:00:00","PubModel":"Epub","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.
期刊介绍:
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.