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Proceedings., Annual Reliability and Maintainability Symposium最新文献

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An expert system to facilitate fault isolation 专家系统，便于故障隔离
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49578
S.M. Buswell, P.A. Sesto
{"title":"An expert system to facilitate fault isolation","authors":"S.M. Buswell, P.A. Sesto","doi":"10.1109/ARMS.1989.49578","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49578","url":null,"abstract":"An investigation is conducted of the incorporation of a knowledge-based expert system into the operational program of an electronic system to serve as the fault-isolation executive. The expert system will provide modularization to the fault-isolation executive. This will allow the testability design engineer to construct and modify the fault isolation knowledge base as the system matures, without requiring constant modification to the testability software by the software engineer.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123226741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A reliability model for total field incidents 全场事故的可靠性模型
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49566
W. Kerscher, T. Lin, H. Stephenson, E.H. Vannoy, J. Wioskowski
{"title":"A reliability model for total field incidents","authors":"W. Kerscher, T. Lin, H. Stephenson, E.H. Vannoy, J. Wioskowski","doi":"10.1109/ARMS.1989.49566","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49566","url":null,"abstract":"Traditional reliability predictions can differ significantly from actual field incident experience, particularly during the early life of the product. It is shown that it is possible to extend the reliability prediction process of preliminary electrical/electronic product designs, to include not only the effect of a constantly declining failure rate, but also the effects of infant mortality. The prediction can also account for misdiagnosis to predict warranty rate.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133190325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Probabilistic analysis of aircraft structure 飞机结构的概率分析
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49589
P. Zielinski
{"title":"Probabilistic analysis of aircraft structure","authors":"P. Zielinski","doi":"10.1109/ARMS.1989.49589","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49589","url":null,"abstract":"Probabilistic structural mechanics (PSM) has been promoted for use in the design of products. The author presents the practical methods for applying PSM to critical aircraft component fault-tree analysis. The B-1B Common Strategic Rotary Launcher (CSRL) fault-tree analysis is used as a demonstrative example of mechanical component failure probabilities calculated using PSM. The CSRL components demonstrate how this methodology accounts for aircraft limit loads, limit load exceedances per flight hour, material properties, and stress analysis or structural test results.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134129477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fitting the log-linear rate to Poisson processes 拟合泊松过程的对数线性速率
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49612
C. Vallarino
{"title":"Fitting the log-linear rate to Poisson processes","authors":"C. Vallarino","doi":"10.1109/ARMS.1989.49612","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49612","url":null,"abstract":"Given a sample of repairable systems, the author models its failure behavior. Each system is assumed to be an independent realization of a nonhomogeneous Poisson process with underlying log-linear intensity function. The author finds the maximum-likelihood estimates of the unknown parameters, presenting the likelihood function and its derivatives. Accurate starting values are obtained through a graphical method for the case of an increasing intensity. Finally, a set of real data is borrowed from R.E. Barlow and B. Davis (1978) to illustrate the techniques.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"211 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133516162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Reliability analysis of a class of fault tolerant systems 一类容错系统的可靠性分析
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49585
Hoang Pham, Shambhu Upadhyaya
{"title":"Reliability analysis of a class of fault tolerant systems","authors":"Hoang Pham, Shambhu Upadhyaya","doi":"10.1109/ARMS.1989.49585","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49585","url":null,"abstract":"The authors examine a method for improving the reliability of a class of fault-tolerant systems in digital data communication. They derive a general expression for the reliability of such systems and obtain a simple bound for the system reliability. The issue of minimizing the expected total system cost is discussed. A numerical example is given to illustrate the technique.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133361406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
On-line process failure analysis and modeling 在线过程失效分析和建模
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49640
H.C. Benski
{"title":"On-line process failure analysis and modeling","authors":"H.C. Benski","doi":"10.1109/ARMS.1989.49640","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49640","url":null,"abstract":"Using techniques originally developed to statistically analyze and model a repairable system failure history, the authors present a procedure to implement these techniques in the context of a portable data acquisition and control system that drives a testing or production process. The process failures are described as being unwanted events recorded by the data acquisition and control instrumentation, which then modifies the process operating conditions. Statistical analysis and testing are performed on the time information related to these events to predict a confidence interval for the time to next process failure. Simplified formulas are introduced to allow the process computer to adjust the process parameters without ever requiring a numerical table.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124811385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The cost effectiveness of reliability testing-What's good and what's not 可靠性测试的成本效益——什么是好的，什么是不好的
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49648
S.I. Kramer
{"title":"The cost effectiveness of reliability testing-What's good and what's not","authors":"S.I. Kramer","doi":"10.1109/ARMS.1989.49648","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49648","url":null,"abstract":"A discussion is presented of the shortcomings of several traditional reliability tests as applied to large systems. These include the reliability qualification test and the reliability development growth test. Alternatives are suggested to yield a greater return at less cost. Finally, a proposal is offered for a novel approach to the reliability warranty.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125597809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hornet maintenance (aircraft system management) 大黄蜂维修(飞机系统管理)
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49635
H. Chase
{"title":"Hornet maintenance (aircraft system management)","authors":"H. Chase","doi":"10.1109/ARMS.1989.49635","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49635","url":null,"abstract":"A step toward life cycle cost reduction was the introduction of a Flight Incident Recording and Aircraft Monitoring Set (FIRAMS) in the F/A-18 Hornet. FIRAMS provides onboard nonvolatile storage of operational flight information and maintenance parameters. It also integrates fuel and engine displays and performs the fuel gaging and transfer functions. FIRAMS also promotes the concept of using onboard computers for air vehicle system management. This concept was implemented into a large portion of the F/A-18C/D fuel system. The FIRAMS subsystem uses a complex correlation of data for fuel control. Future applications of the experience gained in the FIRAMS program include onboard fault detection and fault isolation.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129959795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Component failures based on flaw distributions 基于缺陷分布的部件失效
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49581
F. Jensen
{"title":"Component failures based on flaw distributions","authors":"F. Jensen","doi":"10.1109/ARMS.1989.49581","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49581","url":null,"abstract":"A discussion is presented of a model based on the assumption that all failures basically are due to wearout. The only real difference between long-term wearout and the failures that occur in early life and during the useful life period will be in the size of the inherent flaws or defects in the components. Large flaws connect with early life failures, small flaws connect with end-of-life-failures. The model takes several competing failure mechanisms into account. Examples and case studies are used to provide substance to the model.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115362091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 31
Standardized FRACAS for non-standardized products 非标准化产品的标准化FRACAS
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49643
J. Magnus
{"title":"Standardized FRACAS for non-standardized products","authors":"J. Magnus","doi":"10.1109/ARMS.1989.49643","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49643","url":null,"abstract":"A cost-effective failure reporting and corrective action system (FRACAS) has been developed as a tool for improving quality and productivity in today's competitive marketplace. The need for implementing a FRACAS has been well established within the reliability and maintainability engineering community for years. A discussion is presented of how a standardized approach is being utilized throughout GE/RCA's government communications systems division as a tool in establishing feedback and promoting corrective action to reduce life cycle costs and improve GE/RCA's competitiveness and product reliability.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131608729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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