W. Kerscher, T. Lin, H. Stephenson, E.H. Vannoy, J. Wioskowski
{"title":"全场事故的可靠性模型","authors":"W. Kerscher, T. Lin, H. Stephenson, E.H. Vannoy, J. Wioskowski","doi":"10.1109/ARMS.1989.49566","DOIUrl":null,"url":null,"abstract":"Traditional reliability predictions can differ significantly from actual field incident experience, particularly during the early life of the product. It is shown that it is possible to extend the reliability prediction process of preliminary electrical/electronic product designs, to include not only the effect of a constantly declining failure rate, but also the effects of infant mortality. The prediction can also account for misdiagnosis to predict warranty rate.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A reliability model for total field incidents\",\"authors\":\"W. Kerscher, T. Lin, H. Stephenson, E.H. Vannoy, J. Wioskowski\",\"doi\":\"10.1109/ARMS.1989.49566\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Traditional reliability predictions can differ significantly from actual field incident experience, particularly during the early life of the product. It is shown that it is possible to extend the reliability prediction process of preliminary electrical/electronic product designs, to include not only the effect of a constantly declining failure rate, but also the effects of infant mortality. The prediction can also account for misdiagnosis to predict warranty rate.<<ETX>>\",\"PeriodicalId\":430861,\"journal\":{\"name\":\"Proceedings., Annual Reliability and Maintainability Symposium\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., Annual Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1989.49566\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Annual Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1989.49566","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Traditional reliability predictions can differ significantly from actual field incident experience, particularly during the early life of the product. It is shown that it is possible to extend the reliability prediction process of preliminary electrical/electronic product designs, to include not only the effect of a constantly declining failure rate, but also the effects of infant mortality. The prediction can also account for misdiagnosis to predict warranty rate.<>
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