{"title":"Prediction for system reliability and availability","authors":"G. Collas","doi":"10.1109/ARMS.1989.49622","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49622","url":null,"abstract":"The author presents a method developed in Bull Systems to predict reliability and availability of computer systems. He examines the combined analyses of hardware and software reliability. The method is based on modeling, intensive measurements, and simulation on microcomputer during the development and production phases. This technique, already applied on DPS7000 systems, is continuously improved to offer more and more dependable systems to the customer.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126874966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Warranty program engineering","authors":"T. Rooker","doi":"10.1109/ARMS.1989.49557","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49557","url":null,"abstract":"A process is developed that contributes to the successful engineering of a warranty program. The process utilizes a combination of analytical techniques to define a window of ranges for factors impacting warranty program cost. To create a tighter target, a simulation-based algorithm called programmed optimization of warranty (POWer) is introduced. The POWer algorithm converts factors from production, field service, marketing, and reliability into easily digestible units of dollars. The algorithm uses the Monte Carlo simulation technique to project warranty performance. The results are linked with engineering/economic factors to provide a solution in dollars.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125423219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Availability modeling of FDDI networks","authors":"K.A. Bateman, E. Cortes","doi":"10.1109/ARMS.1989.49632","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49632","url":null,"abstract":"A practical approach is presented to availability modeling of fiber distributed data interface (FDDI) computer networks using Markov methods. A brief discussion of FDDI networks is given, and the actual availability modeling performed is described in detail. This description includes models and results for two- and three-wiring-concentrator FDDI ring networks.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126813186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated engineering notebooks","authors":"K. Blemel","doi":"10.1109/ARMS.1989.49656","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49656","url":null,"abstract":"The use of electronic notebooks is a generic and necessary step to automated design engineering. With the use of a workstation notebook, the flow of data and graphics can be unified into a firm point of documentation. The data obtained about individual design items (assemblies) can be further centralized into a resident workstation containing all known design knowledge. The author presents one implementation using off-the-shelf hardware and software that enables customers, manufacturers, designers, and users to participate in formation of dynamic engineering notebooks and perhaps have a say in what a good notebook should contain.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127594650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Software reliability growth process-a life cycle approach","authors":"D. Raheja","doi":"10.1109/ARMS.1989.49573","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49573","url":null,"abstract":"The author presents a life-cycle cost-reduction technique to achieve rapid growth rate in software reliability growth. He points out the deficiencies in the current practices in the hardware reliability growth process and how to overcome such weaknesses in software engineering. It is suggested that fixing errors in software introduces a negative growth because the programmer may not know which paths are affected by the change. The best way to accelerate the software reliability and maintenance growth is to identify engineering changes in the early design phases. The ATAF program tends to minimize risks and lower life-cycle costs significantly.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"299 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132655575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Importance of accurate thermal analyses (computer reliability)","authors":"D.W. Jacobson","doi":"10.1109/ARMS.1989.49647","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49647","url":null,"abstract":"The author focuses on the importance of accurate thermal measurements. The reliability impact of junction temperature changes is examined for four different components. This is followed by two case studies done at the card level as opposed to the component level. The first case study involves a memory card in which a cost-saving technology change was made because of a decrease in the estimated junction temperature. The second case covers a processor card which has 15 temperature-sensitive components. The study examines the reliability implications of inaccurately measuring the thermal characteristics of these components. A section on the monetary and competitive aspects of the importance of accurate thermal measurements is included.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131228412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability model for computerized safety systems","authors":"P. Hokstad, L. Bodsberg","doi":"10.1109/ARMS.1989.49641","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49641","url":null,"abstract":"A model for reliability prediction of computerized process shutdown systems is described. Particular attention is given to the classification of component failures to ensure that all types of failures are included, and to the modeling of dependent (common-cause) failures. A dependent failure model called the multiple-error shock (MESH) model is introduced. The reliability calculation is illustrated for a subsystem, using 1-out-of-2 voting logic. Some remarks as to the overall degree of redundancy of a total system are given. The dependent-failure model itself should be applicable to quite general systems.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134366345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"RAMCAD PLUS: a CALS RAMCAD system","authors":"G.J. Warlick, F.J. Findlow, C. Lemmons, P. Ng","doi":"10.1109/ARMS.1989.49552","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49552","url":null,"abstract":"RAMCAD PLUS is a rule-based expert system designed to evaluate the supportability characteristics of new designs. The system operates within a CAD environment and permits individual engineers to evaluate the relative supportability of their drawings. The system makes use of CADAM (computer-aided design and manufacture) drawing files as inputs and provides the designer with information on changes that will improve the supportability of their designs. Operating a CAD environment, RAMCAD PLUS represents a system in that it does not require inputs from anyone except the engineer to operate effectively. The RAMCAD PLUS system functions to increase the supportability designs in two ways: (1) by evaluating the supportability of drawings and suggesting design changes that would make them more supportable, and (2) by providing the engineer with interpretations of historic feedback data.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127909959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Warranties: concept to implementation","authors":"J. Brennan, S. A. Burton","doi":"10.1109/ARMS.1989.49556","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49556","url":null,"abstract":"The 1984 warranty legislation, and the subsequent revised legislation in 1985, have been a source of concern to contractors and US Government customers. The government is attempting to understand how to set warranty requirements to satisfy the law; the contractor is struggling with how to quote the warranties in a competitive environment; and both parties are attempting to establish their negotiating strategy as partners rather than adversaries and to facilitate warranty implementation. The authors share some insights and experiences with regard to warranty concepts and implementation in response to the law.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114837225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High reliability in the commercial arena","authors":"J.E. Bridgers","doi":"10.1109/ARMS.1989.49627","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49627","url":null,"abstract":"The author discusses his company's reliability activities during 1988. He first examines the environment in which these activities take place, arguing that American industry has failed because mediocrity is 'good enough'. He suggests approaches for American industry to respond to the situation. His company's (Codex, designs and manufactures modems and network products) approach is then presented.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126098170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}