2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)最新文献

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MoM based current reconstruction using near-field scanning 基于MoM的近场扫描电流重建
Qiaolei Huang, L. Li, Xin Yan, Bumhee Bae, Hark-Byeong Park, C. Hwang, J. Fan
{"title":"MoM based current reconstruction using near-field scanning","authors":"Qiaolei Huang, L. Li, Xin Yan, Bumhee Bae, Hark-Byeong Park, C. Hwang, J. Fan","doi":"10.1109/ISEMC.2017.8077930","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077930","url":null,"abstract":"Multiple digital ICs sharing ground plane have potential problems of ground noise interference to each other. Current distribution on the ground plane can introduce intra-system EMC issues, which can possibly result in receiver desensitization issue in wireless devices. In this paper, a method of moment (MoM) based current reconstruction method is proposed to estimate the current on the ground plane. This method requires phased resolved near field data for accurate current reconstruction. The proposed method is validated by a numerical example. The current reconstructed from the proposed method is compared with the current from the simulation tool. The difference is within 3.5 dB which is acceptable for most engineering practice.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115467802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Vulnerability of wireless systems to (Intentional) EMI Tutorial: Tutorial ‘Wireless’, WE-PM-1 无线系统对(故意)EMI的脆弱性教程:教程“无线”,WE-PM-1
F. Leferink
{"title":"Vulnerability of wireless systems to (Intentional) EMI Tutorial: Tutorial ‘Wireless’, WE-PM-1","authors":"F. Leferink","doi":"10.1109/ISEMC.2017.8078067","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078067","url":null,"abstract":"Outline • EM Coexistence: more users, data and spectrum demand • Intentional EMI: wireless systems are vulnerable against electromagnetic interference • Interference mechanisms • Damage, Blocking, Jamming • Simulation and measurement results of • Terrestrial Trunked Radio (TETRA) • Remote Keyless Entry (RKE)","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114140506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Status of DoD tri-service working group revision d of MIL-STD-464 国防部三军种工作组修订MIL-STD-464的现状
Joseph DeBoy
{"title":"Status of DoD tri-service working group revision d of MIL-STD-464","authors":"Joseph DeBoy","doi":"10.1109/ISEMC.2017.8078019","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078019","url":null,"abstract":"This article consists of a collection of slides from the author's conference presentation.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114110953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study of the conducted emissions of an IPT system composed of an array of magnetically coupled resonators 由一组磁耦合谐振器组成的IPT系统的传导发射研究
José Alberto, U. Reggiani, L. Sandrolini
{"title":"Study of the conducted emissions of an IPT system composed of an array of magnetically coupled resonators","authors":"José Alberto, U. Reggiani, L. Sandrolini","doi":"10.1109/ISEMC.2017.8077943","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077943","url":null,"abstract":"In this paper the conducted emissions generated by an inductive power transfer (IPT) system composed of an array of magnetically coupled stranded-wire resonators and powered by an H-bridge inverter (operating at a resonant frequency of 147kHz) are assessed for arrays with different numbers of resonators, different termination impedances and for a constant power of 5W absorbed by the termination impedance. It was found that the peak values of the disturbance voltage obtained through measurements, in the frequency range from 150kHz to 30MHz, depend on the equivalent impedance that represents the impedance of the array after removing the resonator connected to the power source. More specifically, the highest peak values of the disturbance voltage were found at 150kHz and 294kHz (the former frequency is close to the resonant frequency and the latter is its second harmonic) for an even number of resonators and a high termination impedance or for an odd number of resonators and a low termination impedance, situations which both correspond to a low value of the equivalent impedance. Finally, when a termination impedance close to the equivalent impedance of an infinite array of resonators is used, the disturbance voltage values are approximately the same for any number of resonators.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114220734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Compact delay matching solution for reference clock in PCB PCB参考时钟的紧凑型延迟匹配方案
Hanqiao Zhang, G. Ouyang, Kai Xiao, Beomtaek Lee
{"title":"Compact delay matching solution for reference clock in PCB","authors":"Hanqiao Zhang, G. Ouyang, Kai Xiao, Beomtaek Lee","doi":"10.1109/ISEMC.2017.8077897","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077897","url":null,"abstract":"This paper proposes a compact delay matching solution for reference clock in PCB. The proposed method provides up to 70% area saving compared to the traditional length matching methods. It also provides design and layout flexibility. Effectiveness of the matching network, electrical static performance, and component variation impacts are simulated and compared to conventional methods.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125302626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizing EMI radiation physics for edge-and broad-side coupled connectors 边缘和宽边耦合连接器的电磁干扰辐射物理特性
Y. S. Cao, Xu Wang, Wending Mai, Yansheng Wang, Lijun Jiang, A. Ruehli, Shiquan He, Huapeng Zhao, Jun Hu, J. Fan, J. Drewniak
{"title":"Characterizing EMI radiation physics for edge-and broad-side coupled connectors","authors":"Y. S. Cao, Xu Wang, Wending Mai, Yansheng Wang, Lijun Jiang, A. Ruehli, Shiquan He, Huapeng Zhao, Jun Hu, J. Fan, J. Drewniak","doi":"10.1109/ISEMC.2017.8077970","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077970","url":null,"abstract":"Electromagnetic radiation for a printed circuit board (PCB) midplane connector is studied in this paper. By applying integral-equation (IE) based method and characteristic mode (CM) analysis, the current is split into radiating and non-radiating ones. The radiated power from each part of the structure can be quantified using the radiating current. Therefore, the radiation hot spot can be identified for both edge-side coupled and broad-side coupled connectors. Furthermore, the radiation characteristics for these connectors are compared.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123430060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Analysis of unnecessary radio wave near the inverter equipment at the carrier frequency-range of mobile terminal 移动终端载波频率范围内逆变器设备附近不必要无线电波分析
Y. Miyazawa, Satoshi Tanaka, M. Nishizawa, Jingyan Ma, M. Yamaguchi, K. Kondo, M. Nagata, Y. Okiyoneda
{"title":"Analysis of unnecessary radio wave near the inverter equipment at the carrier frequency-range of mobile terminal","authors":"Y. Miyazawa, Satoshi Tanaka, M. Nishizawa, Jingyan Ma, M. Yamaguchi, K. Kondo, M. Nagata, Y. Okiyoneda","doi":"10.1109/ISEMC.2017.8077881","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077881","url":null,"abstract":"In the 5th generation mobile communication system (5G), the carrier frequency range of mobile communication equipment will be extended to the 6 GHz band and higher, and the number of connected equipment is expected to reach 1 million units/km2. It is assumed that inverter and mobile communication devices are used in close proximity. On the other hand, with the widespread use of inverter equipment driven by a fast switching SiC or GaN device, the unnecessary radio wave can be emitted more from the inverter in the GHz band. In order to evaluate the influence of such unnecessary radio waves, we developed and measured the unnecessary radio waves emitted from inverter devices with high sensitivity, and confirmed its influence on wireless communication performance, using a wireless power transmission (WPT) system for electric vehicles as a test bench.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"4 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123680169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
ANSI C63.25 Draft Update ANSI C63.25草案更新
Daniel Sigouin, G. Kiemel, D. Hoolihan, Zhonghuai Chen, W. Schaefer, D. Heirman
{"title":"ANSI C63.25 Draft Update","authors":"Daniel Sigouin, G. Kiemel, D. Hoolihan, Zhonghuai Chen, W. Schaefer, D. Heirman","doi":"10.1109/ISEMC.2017.8078054","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078054","url":null,"abstract":"This article consists of a collection of slides from the author's conference presentation.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121576439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Coil design for 100 KHz and 6.78 MHz WPT system :Litz and solid wires and winding methods 100khz和6.78 MHz WPT系统的线圈设计:Litz和实心线和绕组方法
Jonghyun Cho, Jingdong Sun, Heegon Kim, J. Fan, Y. Lu, Siming Pan
{"title":"Coil design for 100 KHz and 6.78 MHz WPT system :Litz and solid wires and winding methods","authors":"Jonghyun Cho, Jingdong Sun, Heegon Kim, J. Fan, Y. Lu, Siming Pan","doi":"10.1109/ISEMC.2017.8077977","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077977","url":null,"abstract":"Coil design is one of the critical part to get high power transfer efficiency for wireless power transfer (WPT) system. There exists coil figure of merit (FOM), which is used to evaluate coil design in the aspect of WPT system efficiency. WPT coil FOM is function of coil quality factor (Q-factor) and coupling coefficient, k and higher Q and k guarantees higher coil-to-coil efficiency. Coil DC loss, skin effect, proximity effect, and displacement current between turns are key factors to determine Q-factor and its effects changes depending on wire-type, winding method, and target frequency. In this paper, we focus on transmitter coil design to maximize Q-factor in both 100 MHz and 6.78 MHz. Coil Q-factor equations are provided to explain and analyze the physics and measurement was done for the validation of the equation. Finally optimal coil winding methods are proposed to maximize coil Q-factor","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121844577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
IEC view of transient immunity testing 1 暂态抗扰度测试的IEC观点
T. Braxton
{"title":"IEC view of transient immunity testing 1","authors":"T. Braxton","doi":"10.1109/ISEMC.2017.8078081","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078081","url":null,"abstract":"1 — First things first: work with the customer and define what constitutes a failure in your product; make that part of the test plan. — Check the product category to see if additional immunity tests are required. — Monitor all responses as the tests are executed and document them all. — The goal is to minimize ambiguity and produce a quality product.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124965785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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