边缘和宽边耦合连接器的电磁干扰辐射物理特性

2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2017-08-01 DOI:10.1109/ISEMC.2017.8077970

Y. S. Cao, Xu Wang, Wending Mai, Yansheng Wang, Lijun Jiang, A. Ruehli, Shiquan He, Huapeng Zhao, Jun Hu, J. Fan, J. Drewniak

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引用次数: 9

摘要

本文研究了印刷电路板(PCB)背板连接器的电磁辐射问题。采用基于积分方程(IE)的方法和特征模态(CM)分析，将电流分为辐射电流和非辐射电流。利用辐射电流可以量化结构各部分的辐射功率。因此，无论是边侧耦合连接器还是宽侧耦合连接器，都可以识别出辐射热点。此外，还比较了这些连接器的辐射特性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Characterizing EMI radiation physics for edge-and broad-side coupled connectors

Electromagnetic radiation for a printed circuit board (PCB) midplane connector is studied in this paper. By applying integral-equation (IE) based method and characteristic mode (CM) analysis, the current is split into radiating and non-radiating ones. The radiated power from each part of the structure can be quantified using the radiating current. Therefore, the radiation hot spot can be identified for both edge-side coupled and broad-side coupled connectors. Furthermore, the radiation characteristics for these connectors are compared.

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来源期刊

2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

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