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ARFTG Mailing and Membership List as of 04/12/95 截至1995年12月4日的ARFTG邮件和会员名单
46th ARFTG Conference Digest Pub Date : 1996-06-01 DOI: 10.1109/arftg.1996.327149
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引用次数: 0
Line-Reflect-Match Calibrations with Nonideal Microstrip Standards 非理想微带标准线反射匹配校准
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327130
Dylan F. Williams, J. Schappacher
{"title":"Line-Reflect-Match Calibrations with Nonideal Microstrip Standards","authors":"Dylan F. Williams, J. Schappacher","doi":"10.1109/ARFTG.1995.327130","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327130","url":null,"abstract":"We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131395806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A 10-6000MHz Receiver and Signal Separation Modules developed for a Mixed-Signal Automatic Test Equipment System 研制了用于混合信号自动测试设备系统的10-6000MHz接收机和信号分离模块
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327135
W. Ali-Ahmad, J. J. Chang, Eric C.K. Liu, M. Grace, John C. Dawson, Eliot Scull
{"title":"A 10-6000MHz Receiver and Signal Separation Modules developed for a Mixed-Signal Automatic Test Equipment System","authors":"W. Ali-Ahmad, J. J. Chang, Eric C.K. Liu, M. Grace, John C. Dawson, Eliot Scull","doi":"10.1109/ARFTG.1995.327135","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327135","url":null,"abstract":"A 10-6000MHz receiver and signal separation test set have been developed by Anritsu-Wiltron Co. and Teradyne Inc.. These modules provide multichannel 0.01-3.0GHz vector network analysis, with expansion capability to 6.0GHz. The power levels of the input signals to the receiver can vary over +13dBm ... -100dBm. The receiver has three selectable power ranges. The receiver Noise Figure is less than 9dB double sideband (DSB), over the 10-6000MHz frequency range. The receiver also provides a wideband IF output. In a mixed-signal test system, the 10-6000MHz signal separation module, which is a 100% solid-state module, provides the interface between the DUT and the receiver. It allows the de-embedding of the DUT S-parameters, and the measurement of DUT nth-order intercept points, noise figure, and P-1dB. The receiver can measure all of the modern digital modulation schemes used in PCS/PCN systems, when coupled with the broad-band DSP capability of the Teradyne A5 system.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131143132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Advanced Technology Speeds RF-Integrated-Circuit Testing 先进技术加速射频集成电路测试
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327139
Alan Kafton
{"title":"Advanced Technology Speeds RF-Integrated-Circuit Testing","authors":"Alan Kafton","doi":"10.1109/ARFTG.1995.327139","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327139","url":null,"abstract":"\"Rack and stack\" instrumentation has been used for many years to create systems for testing hybrid-RF modules. More recently, these systems have been modified to test monolithic RFICs. While these systems may offer a low initial hardware price, they suffer from inflexibility, long programming times, and throughputs that are much too slow to cost-effectively test RFICs in volumes that are now required. This paper will review traditional \"rack and stack\" system block diagram strengths and weaknesses, and briefly review the basics of a generic network analyzer. It will then, in a step-by-step fashion, evolve the network analyzer block diagram into a modern RF-ATE measurement system -- with digital technology -- that dramatically increases system throughput and flexibility.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131225393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Automated Large-Signal Load-Pull Characterization of Adjacent-Channel Power Ratio for Digital Wireless Communication Systems 数字无线通信系统邻接信道功率比自动大信号负载-拉特性研究
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327134
J. Sevic, R. Baeten, G. Simpson, M. Steer
{"title":"Automated Large-Signal Load-Pull Characterization of Adjacent-Channel Power Ratio for Digital Wireless Communication Systems","authors":"J. Sevic, R. Baeten, G. Simpson, M. Steer","doi":"10.1109/ARFTG.1995.327134","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327134","url":null,"abstract":"Large-signal adjacent-channel power ratio load-pull contours of a GaAs MESFET and a GaAs HEMT excited by ¿4-DQPSK modulation are demonstrated for the first time using an automated load-pull system. It is shown that in general there is only a weak relationship between two-tone third-order intermodulation and adjacent-channel power ratio for the (Japanese) Personal Digital Cellular standard. The relationship is both load impedance and device technology dependent insofar as two-tone linearity characterization cannot generally be used to optimize adjacent-channel power. The load-pull system presented here is modulation and device technology independent.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130915814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs 微波频率下低噪声器件的完整表征:hemt的两种替代程序
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327138
A. Caddemi, A. Di Paola, M. Sannino
{"title":"Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs","authors":"A. Caddemi, A. Di Paola, M. Sannino","doi":"10.1109/ARFTG.1995.327138","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327138","url":null,"abstract":"","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117035584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Using Digitally-Modulated Signals to Measure the Gain Compression and Phase Distortion of a Radio Frequency Amplifier 用数字调制信号测量射频放大器的增益压缩和相位失真
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327133
M. S. Heutmaker, E. Wu, Chauncey Herring, J. R. Welch
{"title":"Using Digitally-Modulated Signals to Measure the Gain Compression and Phase Distortion of a Radio Frequency Amplifier","authors":"M. S. Heutmaker, E. Wu, Chauncey Herring, J. R. Welch","doi":"10.1109/ARFTG.1995.327133","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327133","url":null,"abstract":"Radio frequency amplifier linearity test data obtained from a network analyzer cw power sweep does not always match the amplifier's response to a digitally modulated carrier (which is the signal present in a communications system). This paper describes a DSP-based RF test technique which extracts the gain compression and phase distortion characteristics of an amplifier from measurements performed with a digitally-modulated test stimulus. The technique utilizes the magnitude variations inherent in phase-shift keyed (PSK) modulation to sweep the input power to an amplifier, instead of using a power sweep from a network analyzer. By downconverting the modulated signal and digitizing in the time domain, the magnitude and phase of the modulation may be measured at the input and output of the amplifier. Using the modulation instead of a cw power sweep to drive the amplifier into compression might produce better correlation between test results and actual operation, at least for PSK modulation schemes. We have demonstrated this new technique experimentally on a commercial power amplifier, where we compare network analyzer power sweep data to DSP-based results using BPSK signals at two different bit rates. For this amplifier at 1 kbps the DSP-based measurement of saturation agrees with the network analyzer measurement and demonstrates the validity of the new technique. At 100 kbps, the amplifier saturation behavior during BPSK operation differs from that measured on the network analyzer in two repects: the nonlinearity of the amplifier decreases at the higher bit rate, and the saturation shows significant time-domain hysteresis.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123742911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A Comparative Study of TOSL, TRL, and TRL* Network Analyzer Calibration Techniques, Using Microstrip Test Fixtures 使用微带测试夹具的TOSL、TRL和TRL*网络分析仪校准技术的比较研究
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327127
D. Zelinka, M. Shaw
{"title":"A Comparative Study of TOSL, TRL, and TRL* Network Analyzer Calibration Techniques, Using Microstrip Test Fixtures","authors":"D. Zelinka, M. Shaw","doi":"10.1109/ARFTG.1995.327127","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327127","url":null,"abstract":"For many packaged devices, both active and passive, the preferred test fixture approach is one of microstrip transmission line design. In order to achieve accurate, and reliable two port s-parameter measurements, an accurate calibration of the fixture up to the DUT reference plane is essential. Modern vector network analyzers allow several options when it comes to performing the necessary systematic error correction or calibration. This paper will present results based on verification of three different calibration techniques, by measurement of well defined microstrip impedance standards under TOSL (Thru, open, short, load), TRL (Thru, reflect, line), and TRL* (Hewlett Packard`s modified TRL for three-sampler RF test sets).","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127406412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
T-Matrix De-Embedding of IC Metal Transmission Lines to 18 GHz 18ghz IC金属传输线t矩阵去埋
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327129
T. Maloney, Q. T. Vu
{"title":"T-Matrix De-Embedding of IC Metal Transmission Lines to 18 GHz","authors":"T. Maloney, Q. T. Vu","doi":"10.1109/ARFTG.1995.327129","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327129","url":null,"abstract":"T-matrix methods are applied to S-parameter data from on-chip metal lines connected to microwave measurement equipment so as to preserve mirror symmetry in the entire system. The propagation constant ¿ and characteristic impedance Zin of a line are derived from measurements on two different lengths of line. It is shown here that Zin can be found with few assumptions about the transition networks. In particular, we present a theorem for determining Zin or its phase for any symmetric or lossless transition network. Multiple lengths of otherwise identical IC line allow redundant, pairwise solutions to be acquired, with high confidence in the final result. Experimental results show that today's IC metal lines at Intel can have flat R, L, G, and C to at least 18 Ghz.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132931661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimizing Time-Domain Network Analysis 优化时域网络分析
46th ARFTG Conference Digest Pub Date : 1995-11-01 DOI: 10.1109/ARFTG.1995.327128
D. DeGroot, R. Marks
{"title":"Optimizing Time-Domain Network Analysis","authors":"D. DeGroot, R. Marks","doi":"10.1109/ARFTG.1995.327128","DOIUrl":"https://doi.org/10.1109/ARFTG.1995.327128","url":null,"abstract":"In this work, we demonstrate how changes in sample density, time-window size, and waveform averaging affect the accuracy and acquisition time of calibrated time-domain network analysis. One of the key results from this study is that accuracy can be enhanced by eliminating the incident step-edge signal from the time-domain reflection waveform before maximizing the instrument's vertical scale. This study identifies the trade-offs between accuracy and measurement speed and examines other trends to provide general guidance in establishing reliable and efficient time-domain network analysis measurements for a variety of rf and microwave applications.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115662688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
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