{"title":"Optimizing Time-Domain Network Analysis","authors":"D. DeGroot, R. Marks","doi":"10.1109/ARFTG.1995.327128","DOIUrl":null,"url":null,"abstract":"In this work, we demonstrate how changes in sample density, time-window size, and waveform averaging affect the accuracy and acquisition time of calibrated time-domain network analysis. One of the key results from this study is that accuracy can be enhanced by eliminating the incident step-edge signal from the time-domain reflection waveform before maximizing the instrument's vertical scale. This study identifies the trade-offs between accuracy and measurement speed and examines other trends to provide general guidance in establishing reliable and efficient time-domain network analysis measurements for a variety of rf and microwave applications.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"46th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1995.327128","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
In this work, we demonstrate how changes in sample density, time-window size, and waveform averaging affect the accuracy and acquisition time of calibrated time-domain network analysis. One of the key results from this study is that accuracy can be enhanced by eliminating the incident step-edge signal from the time-domain reflection waveform before maximizing the instrument's vertical scale. This study identifies the trade-offs between accuracy and measurement speed and examines other trends to provide general guidance in establishing reliable and efficient time-domain network analysis measurements for a variety of rf and microwave applications.