{"title":"非理想微带标准线反射匹配校准","authors":"Dylan F. Williams, J. Schappacher","doi":"10.1109/ARFTG.1995.327130","DOIUrl":null,"url":null,"abstract":"We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Line-Reflect-Match Calibrations with Nonideal Microstrip Standards\",\"authors\":\"Dylan F. Williams, J. Schappacher\",\"doi\":\"10.1109/ARFTG.1995.327130\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.\",\"PeriodicalId\":403073,\"journal\":{\"name\":\"46th ARFTG Conference Digest\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"46th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1995.327130\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"46th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1995.327130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Line-Reflect-Match Calibrations with Nonideal Microstrip Standards
We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.
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