使用微带测试夹具的TOSL、TRL和TRL*网络分析仪校准技术的比较研究

D. Zelinka, M. Shaw
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引用次数: 6

摘要

对于许多封装器件,无论是有源还是无源,首选的测试夹具方法是微带传输线设计。为了实现准确、可靠的双端口s参数测量,将夹具精确校准到被测件参考平面是必不可少的。现代矢量网络分析仪允许几个选项,当涉及到执行必要的系统误差校正或校准。本文将介绍基于验证三种不同校准技术的结果,通过测量明确定义的微带阻抗标准在TOSL(通,开,短,负载),TRL(通,反射,线)和TRL*(惠普的修改TRL三采样器射频测试集)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Comparative Study of TOSL, TRL, and TRL* Network Analyzer Calibration Techniques, Using Microstrip Test Fixtures
For many packaged devices, both active and passive, the preferred test fixture approach is one of microstrip transmission line design. In order to achieve accurate, and reliable two port s-parameter measurements, an accurate calibration of the fixture up to the DUT reference plane is essential. Modern vector network analyzers allow several options when it comes to performing the necessary systematic error correction or calibration. This paper will present results based on verification of three different calibration techniques, by measurement of well defined microstrip impedance standards under TOSL (Thru, open, short, load), TRL (Thru, reflect, line), and TRL* (Hewlett Packard`s modified TRL for three-sampler RF test sets).
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