{"title":"使用微带测试夹具的TOSL、TRL和TRL*网络分析仪校准技术的比较研究","authors":"D. Zelinka, M. Shaw","doi":"10.1109/ARFTG.1995.327127","DOIUrl":null,"url":null,"abstract":"For many packaged devices, both active and passive, the preferred test fixture approach is one of microstrip transmission line design. In order to achieve accurate, and reliable two port s-parameter measurements, an accurate calibration of the fixture up to the DUT reference plane is essential. Modern vector network analyzers allow several options when it comes to performing the necessary systematic error correction or calibration. This paper will present results based on verification of three different calibration techniques, by measurement of well defined microstrip impedance standards under TOSL (Thru, open, short, load), TRL (Thru, reflect, line), and TRL* (Hewlett Packard`s modified TRL for three-sampler RF test sets).","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A Comparative Study of TOSL, TRL, and TRL* Network Analyzer Calibration Techniques, Using Microstrip Test Fixtures\",\"authors\":\"D. Zelinka, M. Shaw\",\"doi\":\"10.1109/ARFTG.1995.327127\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For many packaged devices, both active and passive, the preferred test fixture approach is one of microstrip transmission line design. In order to achieve accurate, and reliable two port s-parameter measurements, an accurate calibration of the fixture up to the DUT reference plane is essential. Modern vector network analyzers allow several options when it comes to performing the necessary systematic error correction or calibration. This paper will present results based on verification of three different calibration techniques, by measurement of well defined microstrip impedance standards under TOSL (Thru, open, short, load), TRL (Thru, reflect, line), and TRL* (Hewlett Packard`s modified TRL for three-sampler RF test sets).\",\"PeriodicalId\":403073,\"journal\":{\"name\":\"46th ARFTG Conference Digest\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"46th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1995.327127\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"46th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1995.327127","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Comparative Study of TOSL, TRL, and TRL* Network Analyzer Calibration Techniques, Using Microstrip Test Fixtures
For many packaged devices, both active and passive, the preferred test fixture approach is one of microstrip transmission line design. In order to achieve accurate, and reliable two port s-parameter measurements, an accurate calibration of the fixture up to the DUT reference plane is essential. Modern vector network analyzers allow several options when it comes to performing the necessary systematic error correction or calibration. This paper will present results based on verification of three different calibration techniques, by measurement of well defined microstrip impedance standards under TOSL (Thru, open, short, load), TRL (Thru, reflect, line), and TRL* (Hewlett Packard`s modified TRL for three-sampler RF test sets).