{"title":"先进技术加速射频集成电路测试","authors":"Alan Kafton","doi":"10.1109/ARFTG.1995.327139","DOIUrl":null,"url":null,"abstract":"\"Rack and stack\" instrumentation has been used for many years to create systems for testing hybrid-RF modules. More recently, these systems have been modified to test monolithic RFICs. While these systems may offer a low initial hardware price, they suffer from inflexibility, long programming times, and throughputs that are much too slow to cost-effectively test RFICs in volumes that are now required. This paper will review traditional \"rack and stack\" system block diagram strengths and weaknesses, and briefly review the basics of a generic network analyzer. It will then, in a step-by-step fashion, evolve the network analyzer block diagram into a modern RF-ATE measurement system -- with digital technology -- that dramatically increases system throughput and flexibility.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Advanced Technology Speeds RF-Integrated-Circuit Testing\",\"authors\":\"Alan Kafton\",\"doi\":\"10.1109/ARFTG.1995.327139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\\"Rack and stack\\\" instrumentation has been used for many years to create systems for testing hybrid-RF modules. More recently, these systems have been modified to test monolithic RFICs. While these systems may offer a low initial hardware price, they suffer from inflexibility, long programming times, and throughputs that are much too slow to cost-effectively test RFICs in volumes that are now required. This paper will review traditional \\\"rack and stack\\\" system block diagram strengths and weaknesses, and briefly review the basics of a generic network analyzer. It will then, in a step-by-step fashion, evolve the network analyzer block diagram into a modern RF-ATE measurement system -- with digital technology -- that dramatically increases system throughput and flexibility.\",\"PeriodicalId\":403073,\"journal\":{\"name\":\"46th ARFTG Conference Digest\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"46th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1995.327139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"46th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1995.327139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
"Rack and stack" instrumentation has been used for many years to create systems for testing hybrid-RF modules. More recently, these systems have been modified to test monolithic RFICs. While these systems may offer a low initial hardware price, they suffer from inflexibility, long programming times, and throughputs that are much too slow to cost-effectively test RFICs in volumes that are now required. This paper will review traditional "rack and stack" system block diagram strengths and weaknesses, and briefly review the basics of a generic network analyzer. It will then, in a step-by-step fashion, evolve the network analyzer block diagram into a modern RF-ATE measurement system -- with digital technology -- that dramatically increases system throughput and flexibility.
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