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Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)最新文献

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The Upgraded Microstrip Silicon Sensor Characterisation Facility of the University of Sheffield 谢菲尔德大学升级微带硅传感器表征设施
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0028
E. Kourlitis, K. Lohwasser, R. French, S. Edwards
{"title":"The Upgraded Microstrip Silicon Sensor Characterisation Facility of the University of Sheffield","authors":"E. Kourlitis, K. Lohwasser, R. French, S. Edwards","doi":"10.22323/1.343.0028","DOIUrl":"https://doi.org/10.22323/1.343.0028","url":null,"abstract":"A major component of the ATLAS Phase-II upgrade is the Inner Tracker, an all-silicon detector featuring novel microstrip sensors. Motivated by the current research efforts in silicon sensor technology, a characterisation facility has been recently upgraded at the University of Sheffield. A description of the facility along with initial benchmark measurements of sensors before and after their irradiation are presented. The results were found to be in agreement with similar measurements conducted by other facilities in the UK and support the successful commissioning of the facility.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"164 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116594694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electronics Developments for Phase-2 Upgrade of CMS Drift Tubes CMS漂移管第二阶段升级的电子技术进展
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0035
A. Triossi, Á. N. Tobar, D. Redondo, C. Bedoya, J. Puerta-Pelayo, I. Redondo, J. Sastre, M. Bellato, D. Corti, R. Isocrate, S. Ventura, P. Remigis, S. Maselli, F. Rotondo
{"title":"Electronics Developments for Phase-2 Upgrade of CMS Drift Tubes","authors":"A. Triossi, Á. N. Tobar, D. Redondo, C. Bedoya, J. Puerta-Pelayo, I. Redondo, J. Sastre, M. Bellato, D. Corti, R. Isocrate, S. Ventura, P. Remigis, S. Maselli, F. Rotondo","doi":"10.22323/1.343.0035","DOIUrl":"https://doi.org/10.22323/1.343.0035","url":null,"abstract":"","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123857457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
New 63U ATCA rack: thermal performances and integration challenge 新型63U ATCA机架:热性能和集成挑战
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0037
M. Kalinowski, C. Bortolin
{"title":"New 63U ATCA rack: thermal performances and integration challenge","authors":"M. Kalinowski, C. Bortolin","doi":"10.22323/1.343.0037","DOIUrl":"https://doi.org/10.22323/1.343.0037","url":null,"abstract":"","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122203050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Concept, design and verification of components for an integrated on-detector silicon photonic multichannel transmitter 集成检波器硅光子多通道发射机的概念、设计与元件验证
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0057
Yunlong Zhang, D. Karnick, M. Schneider, L. Eisenblätter, T. Kühner, M. Weber
{"title":"Concept, design and verification of components for an integrated on-detector silicon photonic multichannel transmitter","authors":"Yunlong Zhang, D. Karnick, M. Schneider, L. Eisenblätter, T. Kühner, M. Weber","doi":"10.22323/1.343.0057","DOIUrl":"https://doi.org/10.22323/1.343.0057","url":null,"abstract":"","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128962708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Embedded Local Monitor Board upgrade proposals 嵌入式本地监控板升级建议
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0034
K. Nicpon, H. Binderup, H. Boterenbrood, P. Farthouat, P. Nikiel, V. Ryjov, S. Schlenker
{"title":"The Embedded Local Monitor Board upgrade proposals","authors":"K. Nicpon, H. Binderup, H. Boterenbrood, P. Farthouat, P. Nikiel, V. Ryjov, S. Schlenker","doi":"10.22323/1.343.0034","DOIUrl":"https://doi.org/10.22323/1.343.0034","url":null,"abstract":"The Embedded Local Monitor Board (ELMB) is a microcontroller based plug-in module using the CANopen communication protocol. It has been widely used in LHC systems and experiments for slow-control and monitoring purposes, providing multiple, galvanically isolated analog inputs, and multiple digital inputs and outputs. While the module showed excellent performance in the past 15 years, a new design is deemed necessary due to the obsolescence of some components of the existing ELMB and the higher radiation tolerance required for the planned HL-LHC upgrade. Three development paths, one fully backward compatible and two conceptually different solutions with different levels of radiation tolerance are presented.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124111034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Test results of irradiated CMOS pixel circuits in 150 nm CMOS technology for the ATLAS Inner Tracker Upgrade 用于ATLAS内部跟踪器升级的150nm CMOS技术辐照CMOS像素电路的测试结果
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0156
Z. Chen, M. Barbero, P. Barrillon, C. Bespin, S. Bhat, P. Breugnon, I. Caicedo, Y. Degerli, S. Godiot, T. Hemperek, T. Hirono, F. J. Iguaz, H. Krüger, P. Pangaud, Rozanov Alexandre, P. Rymaszewski, P. Schwemling, M. Vandenbroucke, T. Wang, Wermes Norbert
{"title":"Test results of irradiated CMOS pixel circuits in 150 nm CMOS technology for the ATLAS Inner Tracker Upgrade","authors":"Z. Chen, M. Barbero, P. Barrillon, C. Bespin, S. Bhat, P. Breugnon, I. Caicedo, Y. Degerli, S. Godiot, T. Hemperek, T. Hirono, F. J. Iguaz, H. Krüger, P. Pangaud, Rozanov Alexandre, P. Rymaszewski, P. Schwemling, M. Vandenbroucke, T. Wang, Wermes Norbert","doi":"10.22323/1.343.0156","DOIUrl":"https://doi.org/10.22323/1.343.0156","url":null,"abstract":"A major upgrade for the ATLAS Inner Tracker at the Large Hadron Collider (LHC) is scheduled in 2026. Depleted CMOS pixel sensors on high resistivity substrates in LFoundry 150 nm technology are an interesting option for this upgrade. Recently two large demonstrators, one based on a hybrid concept called LF-CPIX and the other based on a fully monolithic concept called LF-Monopix have been produced. Both prototypes were characterized in the lab and after irradiation up to 160 MRad under CERN’s 24 GeV Proton Synchrotron beam. In this work, we will describe the behavior under radiation of the two prototypes.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121893592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
High-Voltage Silicon JFET for HV Multiplexing for the ATLAS MicroStrip Staves 用于ATLAS微带板的高压多路复用的高压硅JFET
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0030
G. Giacomini, Wei Chen, D. Lynn
{"title":"High-Voltage Silicon JFET for HV Multiplexing for the ATLAS MicroStrip Staves","authors":"G. Giacomini, Wei Chen, D. Lynn","doi":"10.22323/1.343.0030","DOIUrl":"https://doi.org/10.22323/1.343.0030","url":null,"abstract":"We present a new kind of silicon device: a High-Voltage vertical JFET, originally conceived as a candidate for the High-Voltage Multiplexing switch in the ATLAS upgrade of the silicon microstrip Inner Tracker (ITk). The development of the geometry as well as of the technology process flow was carried out by the help of numerical simulations, which confirmed the feasibility of such a device. Using a planar process flow, both n-type and p-type HV-JFETs have been successfully fabricated in the silicon processing facility of Brookhaven National Laboratory, starting from epitaxial wafers which have been grown according to strict specifications. Probe station measurements of un-irradiated devices show low leakage current and high breakdown voltage (up to 600V) in the OFF state, and high currents in the ON state. These JFETs, thus, satisfy most of the specs required by the HV Multiplexing switch. However, only irradiation campaigns with protons and neutrons will assess their suitability as rad-hard switches.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123384536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Quality-Assurance Test of the ATLAS New Small Wheel Read-Out Controller ASIC ATLAS新型小轮读出控制器ASIC的质量保证测试
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0081
S. Popa, S. Martoiu, M. Luchian, R. Coliban, M. Ivanovici
{"title":"The Quality-Assurance Test of the ATLAS New Small Wheel Read-Out Controller ASIC","authors":"S. Popa, S. Martoiu, M. Luchian, R. Coliban, M. Ivanovici","doi":"10.22323/1.343.0081","DOIUrl":"https://doi.org/10.22323/1.343.0081","url":null,"abstract":"The Read-Out Controller (ROC) ASIC will be used to store, de-randomize, aggregate, filter and form complex packets with the digitized data coming from the New Small Wheel (NSW) muon detectors of the ATLAS experiment. The ASIC test setup is based on a Xilinx Kintex Ultrascale FPGA evaluation board, implementing input data streams emulators and output data analyzers for functional verification which are controlled and monitored by a MicroBlaze microprocessor. The jitter and skew of the ASIC’s PLL outputs are measured using oscilloscopes and logic analyzers. The design validation, test procedure and quality-assurance mass-testing results are presented.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116434593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Radiation tests and production test strategy for the ALICE TOF readout upgrade board ALICE TOF读出升级板的辐射测试和生产测试策略
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0025
D. Falchieri
{"title":"Radiation tests and production test strategy for the ALICE TOF readout upgrade board","authors":"D. Falchieri","doi":"10.22323/1.343.0025","DOIUrl":"https://doi.org/10.22323/1.343.0025","url":null,"abstract":"The readout board for the ALICE TOF detector named DRM2 is now in the production phase: 88 boards are being produced (72 are needed in the experiment). Since the board will operate in a radiation environment (0.13 krad total dose expected in 10 years and a flux of 0.26 KHz/cm of hadrons with energy above 20 MeV), a complete irradiation campaign at the component level was performed. In this paper the focus is on the irradiation tests on a Microsemi Igloo2 FPGA and two different types of Avago SFP optical transceivers using a 100 MeV proton beam, available at the facility operated by INFN-TIFPA at the Centro di Protonterapia in Trento. This paper also focuses on the board production test strategy. Topical Workshop on Electronics for Particle Physics (TWEPP2018) 17-21 September 2018 Antwerp, Belgium","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"153 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114433660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ATLAS Phase-II-Upgrade Pixel Demonstrator Read-out ATLAS第二阶段升级像素演示器读出
Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) Pub Date : 2019-05-20 DOI: 10.22323/1.343.0046
E. Buschmann
{"title":"ATLAS Phase-II-Upgrade Pixel Demonstrator Read-out","authors":"E. Buschmann","doi":"10.22323/1.343.0046","DOIUrl":"https://doi.org/10.22323/1.343.0046","url":null,"abstract":"The ATLAS tracking system will be replaced by the all-silicon inner-tracker (ITk) consisting of pixels and strips in the course of the HL-LHC upgrade until 2026. The readout of the ITk pixel system will be most challenging in terms of data rate. First test of readout concepts are performed with the ITk Pixel Demonstrator, a system composed of several ITk-style modules with in total 120 readout chips. Their readout is realised with data aggregation via GBTx chips transmitting data optically to ATCA-boards acting as off-detector components.","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"105 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131652548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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