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Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)最新文献

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Investigating a specific class of software reliability growth models 研究一类特定的软件可靠性增长模型
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981649
P.A. Keiller, T. Mazzuchi
{"title":"Investigating a specific class of software reliability growth models","authors":"P.A. Keiller, T. Mazzuchi","doi":"10.1109/RAMS.2002.981649","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981649","url":null,"abstract":"The performance of a subset of the software reliability growth models is investigated using various smoothing techniques. The method of parameter estimation for the models is the maximum likelihood method. The evaluation of the performance of the models is judged by the relative error of the predicted number of failures over future time intervals relative to the number of failures eventually observed during the interval. The use of data analysis procedures utilizing the Laplace trend test are investigated. These methods test for reliability growth throughout the data and establish \"windows\" that censor early failure data and provide better model fits. The research showed conclusively that the data analysis procedures resulted in improvement in the models' predictive performance for 41 different sets of software failure data collected from software development labs in the United States and Europe.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114416480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Validation of guidance control software requirements specification for reliability and fault-tolerance 制导控制软件可靠性和容错性要求规范的验证
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981660
Frederick T. Sheldon, H. Kim
{"title":"Validation of guidance control software requirements specification for reliability and fault-tolerance","authors":"Frederick T. Sheldon, H. Kim","doi":"10.1109/RAMS.2002.981660","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981660","url":null,"abstract":"A case study was performed to validate the integrity of a software requirements specification (SRS) for guidance control software (GCS) in terms of reliability and fault-tolerance. A partial verification of the GCS specification resulted. Two modeling formalisms were used to evaluate the SRS and to determine strategies for avoiding design defects and system failures. Z was applied first to detect and remove ambiguity from a part of the natural language based (NL-based) GCS SRS. Next, statecharts and activity-charts were constructed to visualize the Z description and make it executable. Using this formalism, the system behavior was assessed under normal and abnormal conditions. Faults were seeded into the model (i.e., an executable specification) to probe how the system would perform. The result of our analysis revealed that it is beneficial to construct a complete and consistent specification using this method (Z-to-statecharts). We discuss the significance of this approach, compare our work with similar studies, and propose approaches for improving fault tolerance. Our findings indicate that one can better understand the implications of the system requirements using Z-statecharts approach to facilitate their specification and analysis. Consequently, this approach can help to avoid the problems that result when incorrectly specified artifacts (i.e., in this case requirements) force corrective rework.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"172 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124198772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Electronic packaging adhesive fatigue life prediction using thermal cycling step-stress testing 热循环阶跃应力试验预测电子封装胶粘剂疲劳寿命
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981713
X. Tian, J. Prince
{"title":"Electronic packaging adhesive fatigue life prediction using thermal cycling step-stress testing","authors":"X. Tian, J. Prince","doi":"10.1109/RAMS.2002.981713","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981713","url":null,"abstract":"In this research, a methodology of using step-stress thermal cycling to predict fatigue life for a specific electronic packaging adhesive is established. Numerical solutions are generated using FEA software and these data are compared to test data.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115671123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The failure of MTTF in availability evaluation MTTF在可用性评估中的失败
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981655
Hairong Sun, J.J. Han
{"title":"The failure of MTTF in availability evaluation","authors":"Hairong Sun, J.J. Han","doi":"10.1109/RAMS.2002.981655","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981655","url":null,"abstract":"In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability are not particularly informative and fail to evaluate the product with time-varying failure rate and short upgrading interval.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126700436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Generalized imperfect coverage phased-mission analysis 广义不完全覆盖阶段任务分析
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981628
L. Xing, J. Dugan
{"title":"Generalized imperfect coverage phased-mission analysis","authors":"L. Xing, J. Dugan","doi":"10.1109/RAMS.2002.981628","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981628","url":null,"abstract":"This paper presents a generalized phased-mission reliability and performance analysis. The methodology accounts for two-level imperfect fault coverage, which arises from the combination of traditional imperfect coverage and more general than OR-ed combinatorial phase requirements in the phased mission system. In addition, this method is capable of evaluating a wider range of more practical systems with less restrictive mission requirements and offering more human-friendly performance evaluation as compared to the existing methods. A three phased mission example system is analyzed to illustrate the methodology and numerical results axe presented to demonstrate the effects of the generalized imperfect coverage on system unreliability. As shown through the example, the authors' method has low computational complexity and is easy to implement.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126720935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Scenario-based unit testing for reliability 基于场景的可靠性单元测试
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981646
S. Kuball, G. Hughes, I. Gilchrist
{"title":"Scenario-based unit testing for reliability","authors":"S. Kuball, G. Hughes, I. Gilchrist","doi":"10.1109/RAMS.2002.981646","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981646","url":null,"abstract":"Statistical software testing (SST) is an important means for the quantification of software dependability. The concept of SST is that the software is executed on statistically generated test-cases that simulate the software's operating environment. As opposed to SST tests, coverage tests are engineered to execute each statement, decision, Boolean expression etc. at least once. Coverage testing is required by many standards, SST is not required by the standards. Coverage testing however cannot quantify reliability. In this paper, we want to investigate how to link these two important testing strategies. We want to maintain the features of SST, which allow us to quantify dependability, but combine them with a view towards code-coverage. The aim is to not only perform SST, but perform SST on the full code and thus achieve a dependability estimate that is attached to all code-parts. We demonstrate on a software example, taken from the protection system of a heavy water reactor, how to achieve this, by creating a link between the structure of the software input-space and the structure of the code.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127208252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Research on the model and software package for ship reliability analysis 船舶可靠性分析模型及软件包的研究
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981672
Yi Hong, Z. Yufang, Liu Changchun, C. Mingjun
{"title":"Research on the model and software package for ship reliability analysis","authors":"Yi Hong, Z. Yufang, Liu Changchun, C. Mingjun","doi":"10.1109/RAMS.2002.981672","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981672","url":null,"abstract":"This article mainly discusses the model and software package for calculating ship reliability. Combining the fault tree analysis (FTA) method with multi-stage numerical simulation, the authors discussed the model and software package that can be used to calculate various parameters of ship reliability, such as mission reliability, operation readiness, etc. Further, the authors apply multi-stage numerical simulation into systems analysis and provide a new method to evaluate the reliability of repairable systems. An example of calculating the mission reliability of a submarine is given at the end.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131581779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhancing product reliability using REMM 使用REMM提高产品可靠性
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981670
J. Marshall, L. Walls, J. Jones
{"title":"Enhancing product reliability using REMM","authors":"J. Marshall, L. Walls, J. Jones","doi":"10.1109/RAMS.2002.981670","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981670","url":null,"abstract":"The REMM (reliability enhancement methodology and modelling) methodology which provides guidelines on how to use existing reliability tools more effectively should ensure greater product reliability, reduce costs of rework and spares provisioning and provide greater customer confidence and satisfaction. Use of the REMM statistical model provides an assessment of reliability that encourages designers to consider how their designs may perform in the field. Consequently they may use the model as a tool for enhancing design reliability. The REMM demonstrator is designed to aid the engineer in two ways. Firstly to give guidance on a range of reliability techniques and secondly to enable increasingly realistic estimates of equipment reliability to be made as the product evolves from proposal to in-service equipment. The purpose of the demonstrator is to aid engineering staff in the creation of a reliability case for an airborne electronic equipment or system. The case is envisaged as consisting of a reliability plan and an associated review, documenting how well the plan was implemented.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130917908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Supply chain reliability for contingency operations 应急操作的供应链可靠性
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981621
M. U. Thomas
{"title":"Supply chain reliability for contingency operations","authors":"M. U. Thomas","doi":"10.1109/RAMS.2002.981621","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981621","url":null,"abstract":"A contingency is a randomly occurring crises event such as a national disaster, civil disorder, or military invasion that creates a major threat to the safety and security of a population that requires immediate responsive operations that include the development and maintenance of supply chains to provide the logistics support functions. A method for quantifying the reliability of supply chains for contingency logistics systems is developed based on reliability interference theory. Supply chain reliability is defined as the probability of the chain meeting mission requirements to provide the required supplies to the critical transfer points within the system. The authors consider a flow of supplies that are deployed to a distribution center from which allocations are then made to n sites, each being engaged at a high operational tempo to meet the mission requirements of the contingency.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115196082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 109
Comparison of reliability and availability evaluation techniques for distribution network systems 配电网系统可靠性与可用性评估技术的比较
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Pub Date : 2002-08-07 DOI: 10.1109/RAMS.2002.981703
E. Carpaneto, A. Mosso, A. Ponta, E. Roggero
{"title":"Comparison of reliability and availability evaluation techniques for distribution network systems","authors":"E. Carpaneto, A. Mosso, A. Ponta, E. Roggero","doi":"10.1109/RAMS.2002.981703","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981703","url":null,"abstract":"This study, managed by AEM (Azienda Energetica Metropolitana) Torino, Italy, in co-operation with the Polytechnic of Turin, analyses and compares different methods of reliability evaluation for medium-voltage power distribution systems (MVDS). The purpose was to obtain a suitable analysis tool based on methods able to join precise results and fast elaboration. Many studies can be found in literature on classical methods using theoretical digression and providing simple practical examples. This study has a practical connotation (AEM applications in the Turin 27 kV, 22 kV and 6.3 kV distribution systems) and intends to compare different methods considering the effects of their simplifying hypotheses. After description and comparison of the theoretical bases, each proposed technique has been implemented and used to evaluate reliability indices of illustrative networks.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"153 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121264871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
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