{"title":"Reliability quantification of induction motors-accelerated degradation testing approach","authors":"Wendai Wang, D. Dragomir-Daescu","doi":"10.1109/RAMS.2002.981662","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981662","url":null,"abstract":"Characterizing life of cheap, highly reliable devices, such as small induction motors, is a challenge due to cost and time restriction. Accelerated degradation testing (ADT) provides a way to predict its life cost- and time-effectively. Having time tracking on degradation signals within relatively short test duration, the reliability can be estimated through accelerated degradation testing, even without any failures. ADT on induction motors have been conducted in the GE R&D Center to quantify the motor reliability. A new degradation index, the Orbit Area, for the induction motors is proposed, which turns out to be one of the most reliable indices for time tracking motor bearing wear. Signal processing method for extracting this degradation index from measured signals was developed. A time-to-degradation model is constructed based on the physics of failure and test observations. Maximum likelihood estimation is employed to analyze test data. The reliability of the motors is finally predicted through the obtained degradation model. Several issues regarding ADT and lessons learned are also discussed in the paper.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125051990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Intellectual capital: utilizing the Web for knowledge management and data utilization in reliability engineering","authors":"A. Mettas, D. Rock","doi":"10.1109/RAMS.2002.981671","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981671","url":null,"abstract":"Intellectual capital is one of the most important assets in successful companies. An important part of this intellectual capital is the product quality and reliability intellectual capital that is comprised of \"lessons learned\", corrective actions taken, best practices, data regarding customer perception and customer feedback as it relates to different products, and most importantly accurate reliability metrics on deployed parts, components and systems. Managing this knowledge, experience and information should be a high priority in both large-scale and small-scale companies. This paper presents a description of the conception and implementation of three web-based systems for the management of reliability and quality information. These are: (1) a simple internal tracking system (ITS) developed to manage customer support and anomaly tracking data for a software development company; (2) the evolution of this concept into a more complex and powerful quality tracking and management system (QTMS) capable of meeting the failure reporting, corrective action and customer support needs of both large and small companies with diverse product lines and product configurations; (3) a Web-based reliability/quality dashboard for automated analysis and presentation of the reliability and quality data captured by systems like the ITS and QTMS. The three Web-based systems presented in this paper were initially developed by and used by ReliaSoft Corporation with great success and user acceptance. This success led to subsequent modifications, adaptations and deployments of similar systems at other companies.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125884634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An integrated measure of software maintainability","authors":"K. Aggarwal, Yogendra Pratap Singh, J. Chhabra","doi":"10.1109/RAMS.2002.981648","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981648","url":null,"abstract":"For large software systems, the maintenance phase tends to have comparatively much longer duration than all the previous life-cycle phases taken together, obviously resulting in much more effort. A good measure of software maintainability can help better manage the maintenance phase effort. Software maintainability cannot be adequately measured by only source code or by documents. The readability and understandability of both source code and documentation should be considered to measure the maintainability. This paper proposes an integrated measure of software maintainability. The paper also proposes a new representation for rule base of fuzzy models, which require less space for storage and will be efficient in finding the results in the simulation. The proposed model measures the software maintainability based on three important aspects of software-readability of source code (RSC), documentation quality (DOQ), and understandability of software (UOS). Keeping in view the nature of these parameters, a fuzzy approach has been used to integrate these three aspects. A new efficient representation of rule base has been proposed for fuzzy models. This integrated measurement of software maintainability, which to our knowledge is a first attempt to quantify integrated maintainability, is bound to be better than any other single parameter maintainability measurement approach. Thus the output of this model can advise the software project managers in judging the maintenance efforts of the software.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130290004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A study of online maintenance practices at US nuclear plants","authors":"J.C. Lin","doi":"10.1109/RAMS.2002.981611","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981611","url":null,"abstract":"This paper discusses the insights gained from a study of the online maintenance (OLM) practices at selected US nuclear power plants. OLM has been practiced extensively in the US to shift some of the outage work to be performed during power operations. By reducing the outage work scope and performing more OLM, nuclear power plants can significantly reduce generation loss resulting from planned maintenance during outage. This is becoming increasingly important in a deregulated, competitive market environment for electric power supply. The workweek concept and rolling schedule are some of the aspects of OLM that makes the performance of OLM easier to implement. The scope of OLM, however, has to be carefully reviewed to ensure that reliability improvements resulting from OLM are not offset by extended unavailability of the safety systems or other undue operational risks.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130306356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dynamic modeling of degradation data","authors":"Mingxiao Jiang, Yongcang Zhang","doi":"10.1109/RAMS.2002.981709","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981709","url":null,"abstract":"In applications with few or no failures, degradation data can provide more reliability information than traditional censored failure-time data. In this paper, the authors present a dynamic model of degradation data comparing to the general ones available in literature. Random fatigue crack growth is illustrated in detail as an example of degradation data problem. The proposed model is ready to be generalized to accelerated life testing (ALT) analysis under various testing conditions.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127783929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of semi-Markov process and CTMC to evaluation of UPS system availability","authors":"Liang Yin, R. M. Fricks, Kishor S. Trivedi","doi":"10.1109/RAMS.2002.981706","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981706","url":null,"abstract":"In this paper, the authors develop analytical models for the study of the dependability characteristics of systems with uninterruptible power supply (UPS) units. Dependability of systems with UPS cannot be modeled exactly using the prevalent Markov modeling approaches. They develop and solve two approximations to this problem. The first model assumes that battery units will be fully recharged before the next failure occurs. With this assumption, a semi-Markov process (SMP) model is developed and solved to provide formulae to compute availability measures (transient and steady-state), reliability and mean time to failure (MTTF). Another approximation based only on Markov modeling theory is then proposed. The authors show how all the measures can also be computed using the continuous-time Markov chain (CTMC) approach, and also compare some of its results with the equations developed. In practical applications, the closed-form formulae for A(t), A and MTTF are very useful in combination with other system equations in a reliability block diagram or fault-tree. On the other hand, the Erlang approximation is easy to use when one has Markov chain solvers (e.g., the SPNP or SHARPE modeling packages) available for computing dependability measures.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132535267","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability stress test method: impact on the new product introduction process, time to market, field reliability impact and reliability assessment","authors":"S. Jawaid, J. Ferguson, S. Zaki","doi":"10.1109/RAMS.2002.981663","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981663","url":null,"abstract":"A comprehensive reliability stress test program is not a trivial undertaking. The shake and bake approach without a complete understanding of the failure modes and mechanisms, the design and technology limitations and potential, and the reliability objectives may buy a few short term gains and success stones, but for a longer term, could be a costly proposition.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131441719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Integrated modelling of system functional, maintenance & environmental factors","authors":"J.A. Jones, L. Warrington, N. Davis","doi":"10.1109/RAMS.2002.981674","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981674","url":null,"abstract":"In order to ensure that the Ultra Reliable Aircraft Model (URAM) simulates maintenance free operation (MFOP) with sufficient fidelity, it has been necessary to model component reliability as modified by usage and stress during operational activity, to incorporate complex system functional definitions, and to allow flexible treatment of maintenance. The methods chosen allocate components into three distinct groupings that reflect these relationships. They allow the simulation to explore the interrelationship between these issues and they ensure that the simulation can meet the requirements of being a total scenario simulation.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128467420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of Bayes statistics to reduce sample-size, considering a lifetime-ratio","authors":"A. Krolo, B. Rzepka, B. Bertsche","doi":"10.1109/RAMS.2002.981705","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981705","url":null,"abstract":"Due to short development schedules, the amount of time available for testing is often unequal to the required lifetime of the product. Either a reduction or increase of the test time affects the confidence level of the reliability test. In this paper, the so-called \"lifetime-ratio\" is introduced for the Kleyner et al. method and for the Bayes approach, which uses a uniform distribution as prior knowledge. With the lifetime-ratio, it is possible to consider a case where the test time is unequal to the projected lifetime. Apart from the simple case of the success run, the authors also took into account that failures may occur during the test. In addition, they showed that the lifetime-ratio is dependent on the number of items that must be tested for a required reliability and on the desired confidence level.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127537477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Making the (business) case for software reliability","authors":"T. Mcgibbon, D. Nicholls","doi":"10.1109/RAMS.2002.981656","DOIUrl":"https://doi.org/10.1109/RAMS.2002.981656","url":null,"abstract":"A business case can be developed to justify the use of higher reliability software to senior management based on the potential profits and improved market position associated with improved software development processes that use software process improvement (SPI) techniques, Results from the literature that demonstrate a positive return on investment (ROI) resulting from SPI program initiatives suggest that the highest potential ROI comes from -SPJ initiatives aimed at the earliest stages of software development. Established analytical reliability techniques are well-suited to supporting development of inherently reliable software early in the life cycle. A spreadsheet-based model developed by the Data and Analysis Center for Software (DACS) to assess the ROI, as well as secondary benefits and risks resulting from various types and levels of SPI, demonstrates the relationship of improved software reliability to the financial bottom line. Future capabijities of the DACS model will leverage new data to expand and refresh the existing model.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114519477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}