Dynamic modeling of degradation data

Abstract

In applications with few or no failures, degradation data can provide more reliability information than traditional censored failure-time data. In this paper, the authors present a dynamic model of degradation data comparing to the general ones available in literature. Random fatigue crack growth is illustrated in detail as an example of degradation data problem. The proposed model is ready to be generalized to accelerated life testing (ALT) analysis under various testing conditions.