The failure of MTTF in availability evaluation

Hairong Sun, J.J. Han
{"title":"The failure of MTTF in availability evaluation","authors":"Hairong Sun, J.J. Han","doi":"10.1109/RAMS.2002.981655","DOIUrl":null,"url":null,"abstract":"In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability are not particularly informative and fail to evaluate the product with time-varying failure rate and short upgrading interval.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2002.981655","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability are not particularly informative and fail to evaluate the product with time-varying failure rate and short upgrading interval.
MTTF在可用性评估中的失败
本文提出用一个截形浴盆来模拟完全老化产品的故障率。我们揭示了一些反直觉的观察结果,例如,增加MTTF并不一定会增加产品生命周期内的平均可用性和瞬时可用性,而平均可用性和瞬时可用性可以在不改变MTTF的情况下得到改善。MTTF和稳态可用性不是特别有用,不能评估时变故障率和短升级间隔的产品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信