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2022 99th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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D-band Free Space Dielectric Characterization of a Low-Cost Ultradense Microdiamond Composite for Heat Spreading 低成本超致密微金刚石复合材料热扩散的d波段自由空间介电特性
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896507
Shu-Ming Chang, Chelsea Swank, A. Kummel, M. Bakir, M. Rodwell, Jim Buckwalter
{"title":"D-band Free Space Dielectric Characterization of a Low-Cost Ultradense Microdiamond Composite for Heat Spreading","authors":"Shu-Ming Chang, Chelsea Swank, A. Kummel, M. Bakir, M. Rodwell, Jim Buckwalter","doi":"10.1109/arftg54656.2022.9896507","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896507","url":null,"abstract":"Low-cost dielectric materials are needed above 100 GHz with low permittivity and loss tangent as well as significant thermal conductivity $(sim 100W/mcdot K)$. A free-space measurement setup is demonstrated to characterize a proposed ultradense diamond composite material at D-band. We leverage free-space calibration with the NIST iterative method to extract the permittivity and loss tangent and compare this approach with other methods. Time-domain gating is employed to reduce the uncertainty in the free space characterization. Our measurement indicates the diamond composite offers a relative permittivity of 3.5 and loss tangent of $3times 10^{-2}$ from 110-140 GHz. To the author’s knowledge, this is the first report of diamond composite compatible with packaging requirements at D-band.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128737932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Single-Element CMOS-LRRM VNA Electronic Calibration Technique 一种单元件CMOS-LRRM VNA电子校准技术
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896578
Jun-Chau Chien, A. Niknejad
{"title":"A Single-Element CMOS-LRRM VNA Electronic Calibration Technique","authors":"Jun-Chau Chien, A. Niknejad","doi":"10.1109/arftg54656.2022.9896578","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896578","url":null,"abstract":"This paper presents a single-element CMOS-based electronic calibration (E-Cal) technique for millimeter-wave VNA measurements. The structure employs a CMOS transmission line loaded with a shunt NMOS transistor at its center tap. By taking advantage of the structure symmetry, the standard LRRM calibration flow can be implemented with the transistor biased at different impedance states. The approach is justified using a 65nm CMOS test chip and the measurements of passive DUTs.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117070938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Parasitic Coupling Effects in Coplanar Short Measurements 共面短测量中的寄生耦合效应
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896513
G. Phung, U. Arz
{"title":"Parasitic Coupling Effects in Coplanar Short Measurements","authors":"G. Phung, U. Arz","doi":"10.1109/arftg54656.2022.9896513","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896513","url":null,"abstract":"On-wafer measurements are indispensable for the characterization of electronic devices at millimeter-wave and terahertz frequencies. Recent investigations have demonstrated parasitic effects stemming e.g. from probes, multimode propagation and crosstalk using line standards as devices under test. However, for short-circuited coplanar structures which are often used as reflect standards in on-wafer calibrations, these parasitic effects have not been thoroughly investigated. Therefore, this paper presents a detailed study of parasitic mode effects in conjunction with probe influences occuring in coplanar short measurements.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127165454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On coupling-related distortion behavior in mm-wave phased arrays 毫米波相控阵耦合畸变特性研究
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896530
J. Martens
{"title":"On coupling-related distortion behavior in mm-wave phased arrays","authors":"J. Martens","doi":"10.1109/arftg54656.2022.9896530","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896530","url":null,"abstract":"Nonlinear coupling and element pulling can be contributors to distortion behavior in mm-wave phased arrays, particularly as sensitive power stages get closer to the antenna as may be more likely at the highest frequencies. Methods for assessing these behaviors may be of value for development and modeling. This paper will look at an element interrogation approach based on separable asymmetric intermodulation distortion measurements to look at angle, position and coupling dependence. The proposed measurement approach is illustrated with example FR2 and V/E/W-band arrays.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125714359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-Sweep vs. Banded Characterizations of a D-band Ultra-Low-Loss SiC Substrate-Integrated Waveguide d波段超低损耗SiC衬底集成波导的单扫与带特性研究
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896408
Lei Li, S. Reyes, M. J. Asadi, D. Jena, H. Xing, P. Fay, J. Hwang
{"title":"Single-Sweep vs. Banded Characterizations of a D-band Ultra-Low-Loss SiC Substrate-Integrated Waveguide","authors":"Lei Li, S. Reyes, M. J. Asadi, D. Jena, H. Xing, P. Fay, J. Hwang","doi":"10.1109/arftg54656.2022.9896408","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896408","url":null,"abstract":"A D-band (110-170GHz)SiC substrate-integrated waveguide (SIW) is characterized on-wafer by two different vector network analyzers (VNAs): a 220-GHz single-sweep VNA and an 110-GHz VNA with WR8 (90-140GHz) and WR5 (140-220GHz) frequency extenders. To facilitate probing, the SIW input and output are transitioned to grounded coplanar waveguides (GCPWs). Two-tier calibration is used to de-embed the SIW-GCPW transitions as well as to extract the intrinsic SIW characteristics. In general, the two VNAs are in agreement and both result in an ultra-low insertion loss of approximately 0.2 dB/mm for the same SIW, despite stitching errors at band edges.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"234 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131637103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of (Bi)CMOS Technologies 用于精确表征(Bi)CMOS技术的宽带毫米波集成无源调谐器
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/arftg54656.2022.9896490
M. Margalef-Rovira, C. Maye, I. Alaji, S. Lépilliet, D. Gloria, G. Ducournau, C. Gaquière
{"title":"Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of (Bi)CMOS Technologies","authors":"M. Margalef-Rovira, C. Maye, I. Alaji, S. Lépilliet, D. Gloria, G. Ducournau, C. Gaquière","doi":"10.1109/arftg54656.2022.9896490","DOIUrl":"https://doi.org/10.1109/arftg54656.2022.9896490","url":null,"abstract":"This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a transmission line. Thanks to the use of an external short-circuited probe, the effective length of the transmission line can be modified, leading to a phase shift of the reflection coefficient while the attenuator controls its magnitude. Measurement-based results are presented to prove the precision obtained using the external short-circuited probe, while simulation-based results show the performance of the overall system. The system allows complete coverage of the 140-220 GHz band with 2. 5-4.2dB maximum reflection coefficients and minimum reflection coefficients greater than 20 dB, which can be continuously tuned. On the other hand, thanks to the short-circuited probe, virtually, continuous tuning of the phase is also achievable.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125341528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effective AM/AM and AM/PM curves derived from EVM simulations or measurements on constellations 有效调幅/调幅和调幅/PM曲线由EVM模拟或星座测量得到
2022 99th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-06-24 DOI: 10.1109/ARFTG54656.2022.9896478
J. Sombrin
{"title":"Effective AM/AM and AM/PM curves derived from EVM simulations or measurements on constellations","authors":"J. Sombrin","doi":"10.1109/ARFTG54656.2022.9896478","DOIUrl":"https://doi.org/10.1109/ARFTG54656.2022.9896478","url":null,"abstract":"Non-linear amplifiers distort signal constellations through their amplitude (AM/AM) and phase (AM/PM) curves versus input amplitude. This causes an increase in the average Error Vector Magnitude (EVM) of the amplified signal. Most commercial EVM simulation software and measurement devices display the ideal and distorted constellations. When computing separate EVMs for each value of ideal symbol power, it is possible to obtain a representation of the effect of AM/AM and AM/PM curves on the constellation. A new type of display, with the distorted constellation folded up on the real axis, is proposed to get a direct representation of the amplifier non-linearity. This can also be used for nonlinear equalization of the signal to improve the EVM.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131774573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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