{"title":"A Microstrip Fixture Design for Power GaAs Fets","authors":"R. Lane","doi":"10.1109/ARFTG.1989.323933","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323933","url":null,"abstract":"Small signal,(low power) devices can very adequately be In the new microstrip design the chip is die attached directly to a gold plated copper or brass carrier which is in intimate thermal contact with a finned aluminum heat sink. This results in an \"unblown\" thermal resistance of 3.S°C/Watt and a \"blown\" Rth of 1,6OC/Watt.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128581326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Nonlinear Analysis and Simulation of a Fet Oscillator","authors":"M. Odyniec","doi":"10.1109/ARFTG.1989.323944","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323944","url":null,"abstract":"The aim of the paper is to present methods of nonlinear analysis and show how can they be applied to oscillator design. We start with a simple but general circuit and we reduce the circuit to generalized van der Pol equations. We then apply the method of averaging and that of harmonic balance . The methods allow us to estimate power and frequency of oscillations. We also show how those two can be affected by the operating point. HP microwave nonlinear sirnulator. In particular the llsddl(l arbitrary nonlinear device)allows us to simplify the FET oscillator and to compare it directly with theoretical results.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133657257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Lewis, R. Sweeney, P. Lorch, R. McAleenan, Gary Hewitt, Tim Semones
{"title":"High-Throughput, Multi-Function, On-Wafer Test System","authors":"G. Lewis, R. Sweeney, P. Lorch, R. McAleenan, Gary Hewitt, Tim Semones","doi":"10.1109/ARFTG.1989.323939","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323939","url":null,"abstract":"analyzing and solving numerous hardware and software test issues, and it requires a thorough knowledge of the entire test environment. The most effective way to address the variety of issues is to create a partnership between several companies (hardware and software vendors and end users). In this spirit, ITT, HP, IMS and Cascade are working together to create an on-wafer RF test environment which addresses high throughput, low cost military test needs. HP is chartered with developing the test system hardware, Cascaded is chartered with developing the test executive software (test plan editor, probe plan editor, display utilities, etc.), IMS is chartered with developing the software measurement modules (S Parameters, NF, PldB, etc.), and ITT will integrate and evaluate the entire system. The objective of our efforts is to create a software reconfigureable, high throughput, on-wafer test system that can characterize all MMICs (including power amplifier ICs) at the lowest possible per unit test cost.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128376007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Calibration and Measurement of Ceramic Microstrip Circuits Using a Wafer Probe Station","authors":"J. Wallace, G. A. Ellis","doi":"10.1109/ARFTG.1989.323934","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323934","url":null,"abstract":"Two methods for calibration and measurement of microstrip circuits fabricated on 10 mil thick alumina will be presented. The first method may be used from 7 to 30 GHz. The second method is best suited for measurements below 10 GHz. The basic measurement configuration consisted of: 1) an automatic network analyzer with thru-reflect-line (TRL) [l] calibration capability; 2) wafer probe station and coplanar probe heads normally used for measurement of GaAs circuits; and 3) microstrip TRL calibration standards with coplanar to microstrip transitions. Data will be presented on two types of coplanar to microstrip transitions including: 1) circuit dimensions; 2) transition data calibrated to the coplanar probe tips; 3) calibration data using microstrip TRL calibrations; 4) repeatability data of the transitions including circuit to circuit variations and substrate to substrate variations; and 5) error estimates.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131073752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Time Domain Reflectometry Applied to MMIC Passive Component Modeling","authors":"C. Beccari, A. Ferrero, U. Pisani","doi":"10.1109/ARFTG.1989.323935","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323935","url":null,"abstract":"The time domain facilities of a network analyzer, combined with the tools of network synthesis, were recently used for experimental modeling of discontinuities in an S-parameter measurement set, so as to allow the instrument calibration directly to the ports of the device under test. The technique proved to be very useful in those cases where the discontinuities, that lie before the unknown device, cannot be isolated by the usual calibration methods, and therefore, since network synthesis deals only with frequency domain information, it is impossible to optimize the model's parameters, since they are affected by errors due to discontinuities. This paper describes a procedure which allows to isolate the response of the device under test, and to derive its complete model; when it to reach a reasonable accuracy it gives anyway a topology, which is a good starting point for other optimization routines that can be used for obtaining a better match, on a broad frequency band. This can be accomplished by optimzing the first approach topology to which other circuit elements have been added, so as to take into account second order effects especially at the higher frequencies. The technique was applied to model and characterize passive discrete components used in MMIC. The experimental results show the validity of the approach.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133729626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"General Purpose Automatic Microwave Measurements","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1989.323942","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323942","url":null,"abstract":"The general purpose features required for automatic microwave measurements will be described. These features include calibration, measurement, storage of test procedures and output of date. The calibration would have different features for specific analyzers, but the other features would be dependent only upon the controller used. In addition to storing the calibration, the ability to recall the calibrating parameters from a file for restoring the internal calibration is featured. A feature to analyze the calibrating error terms with a printout asures the instrument is performing satisfactorily. The input and output devices and directories should be reassignable at the operator's desire. A general purpose subroutine called Set_drives assigns three different directories/devices for the keys to control the output later on in the program. These three keys are labelled [PROGRAM] [DATA] [ALTERNATE]. Whenever there is a choice, these three keys will be displayed with an optional key called [OTHER]. The \"OTHER\" key will reassign the keys to these keys to a new directory or device. The directory system for the SRM is handled such that if a directory is given, the device \"REMOTE\" is assumed and is not displayed under the keys. This subroutine works on all Hewlett Packerd Controllers. In addition to checking for the validity of a file name by parsing it from its directory and device assignments, the program also checks to see if the data file type is appropriate.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123412348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improved Waveguide Calibration of Vector Network Analyzers in WR15","authors":"P. Gianfortune, M. Radmanesh","doi":"10.1109/ARFTG.1989.323943","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323943","url":null,"abstract":"This paper discusses factors affecting the accuracy of Vector Network Analysis in millimeter waveguides. Among these are accuracy improvements provided by a new precision WR15 waveguide flange which maintains compatibility with the current UG-385/U flanges. The new wR15 waveguide flange design offers much improved performance in the frequency range of 50 to 75 GHz. Measurement results for flange repeatability along with accuracy results for residual directivity and source match, both for Maury and UG-385/U standard flanges, are presented.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127567280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using a Load Tuner to Improve the Accuracy of Noise Characterization","authors":"G. Simpson, W. E. Pastori","doi":"10.1109/ARFTG.1989.323941","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323941","url":null,"abstract":"In principle, the noise figure of any microwave device is independent of load impedance; however, because of error sensitivities, a load tuner is required to achieve best noise measurement accuracy. This is because a high ouput reflection coefficient of a device under test can greatly increase the measurement receiver noise figure. This paper also presents a direct method of detecting and avoiding oscillations due to simultaneous input and output tuning.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124758364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Versatile 60 GHz Test Fixture","authors":"W. Oldfield","doi":"10.1109/ARFTG.1989.323932","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323932","url":null,"abstract":"A microstrip and co-planar waveguide test fixture which operates to 60 GHz is described and data is presented. The fixture does not require mounting blocks and can test a large variety of shapes and sizes of substrates. The fixture is useful for both scalar and vector measurement systems.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133932451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated T/R Module Testing for the Spaceborne Imaging Radar C (SIR-C) Antenna Subsystem","authors":"V. A. Hirsch, T. Miers, J. R. Coffin","doi":"10.1109/ARFTG.1989.323937","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323937","url":null,"abstract":"This paper describes automated transmit and receive test systems for measuring L- and C-band T/R modules used in the Spaceborne Imaging Radar C (SIR-C) antenna subsystem. The SIR-C antenna subsystem is an active phase array that includes 756 distributed L- and C-band T/R modules. Automated microwave testing of each T/R module is essential to reduce test time, to assemble a data base for module comparisons and to ensure that performance specifications are met. The receive test system obtains complete low noise amplifier S-parameters and noise figure. The transmit test system measures peak output power and pulsed insertion phase at power levels greater than 50 watts. Details of the test systems designs are presented along with test results from a group of L-band engineering T/R module units.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128452214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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