{"title":"Recent Trends in Microwave ATE Systems","authors":"C. Morgan","doi":"10.1109/ARFTG.1989.323936","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323936","url":null,"abstract":"Programmable instruments and test systems have assumed a very important role in the last few years. While they are more expensive than their non-programmable counterparts, the cost is easily justified when the same test must be performed repeatedly. Often the most cost-effective approach to automated testing is to purchase a turnkey system from a vendor that supplies all or most of the critical components. This will help ensure that idiosyncrasies between individual components (computer, software, instruments, and peripherals) are circumvented. If purchase of a turnkey system is not possible, several recent industry trends should ease the system integrator's task. 1) A variety of interface options now exist (IEEE 488, RS-232, VXI, etc.). 2) Emergence of common programming protocol or bus languages for instruments (IEEE 488.2 and MATE/CIIL). 3) Instruments are acquiring intelligent signal processing routines, thus easing the burden on the programmer and instrument controller. 4) Decision-making capability, in the form of downloadable macros, will allow more efficient use of the instrument controller and IEEE 488 bus. 5) Availability of programming tools for those who are using the PC as a system controller (GURU II, ASYST, Lab Windows, EZTEST, etc.). There are still obstacles to be overcome when configuring and programming test equipment for a particular application. With recent industry trends, however, the task is becoming much easier and the benefits much greater.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125674501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Weil, F. Marler, J. Major, M. Weidman, D. Russell
{"title":"Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz","authors":"C. Weil, F. Marler, J. Major, M. Weidman, D. Russell","doi":"10.1109/ARFTG.1989.323940","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323940","url":null,"abstract":"The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representative measurement data are presented that demonstrate that these systems yield results that do not differ significantly from those obtained using older measurement systems. Some discussion of measurement uncertainties is also included.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132502697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Fully Automated, Single-Connection Tester for T/R Modules","authors":"G. Sloan, J. M. Simons","doi":"10.1109/ARFTG.1989.323938","DOIUrl":"https://doi.org/10.1109/ARFTG.1989.323938","url":null,"abstract":"This paper was written from both a specific and general point of view. The discussion on the tester's instrument integration included an actual block diagram of the Sandia tester; this was done to provide a specific example of how the HP 85110A's access links can be utilized. On the other hand, the de-embedding discussion and analysis was carried out from a general point of view to be of maximum service to the reader: the expression one should use to de-embed a measurement is ultimately a function of the measurement environment and the accuracy desired. For example, the usefulness of some of the approximations was shown to be a function of the instrument's reflection coefficient at the measurement frequency.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"450 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116332451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
