{"title":"A Fully Automated, Single-Connection Tester for T/R Modules","authors":"G. Sloan, J. M. Simons","doi":"10.1109/ARFTG.1989.323938","DOIUrl":null,"url":null,"abstract":"This paper was written from both a specific and general point of view. The discussion on the tester's instrument integration included an actual block diagram of the Sandia tester; this was done to provide a specific example of how the HP 85110A's access links can be utilized. On the other hand, the de-embedding discussion and analysis was carried out from a general point of view to be of maximum service to the reader: the expression one should use to de-embed a measurement is ultimately a function of the measurement environment and the accuracy desired. For example, the usefulness of some of the approximations was shown to be a function of the instrument's reflection coefficient at the measurement frequency.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"450 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"33rd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323938","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper was written from both a specific and general point of view. The discussion on the tester's instrument integration included an actual block diagram of the Sandia tester; this was done to provide a specific example of how the HP 85110A's access links can be utilized. On the other hand, the de-embedding discussion and analysis was carried out from a general point of view to be of maximum service to the reader: the expression one should use to de-embed a measurement is ultimately a function of the measurement environment and the accuracy desired. For example, the usefulness of some of the approximations was shown to be a function of the instrument's reflection coefficient at the measurement frequency.