{"title":"17GHz RF Front-Ends for Low-Power Wireless Sensor Networks","authors":"Wanghua Wu, M. Sanduleanu, Xia Li, J. Long","doi":"10.1109/BIPOL.2007.4351860","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351860","url":null,"abstract":"A 17 GHz low power radio front-end is presented. Low-power operation is based on minimization of energy/bit, the design metric for low-power radios. Increasing the data rate while reducing the receiver turn-on time is proposed as a method of improving energy efficiency. Circuit design of prototype receiver and transmitter front ends for a 17 GHz ultra low-power radio are presented and discussed. The power gain of the LNA is 12 dB with a minimum noise figure of 3.25 dB. Conversion gain of the RF chain is 30 dB at DC, the measured IIP3 of the Rx chain is -26.3 dBm whereas the maximum saturated output power of the PA is about 5 dBm. The total, measured power consumption is 17.5 mW (@2.5 supply) in the received","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132951299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Distribution of the Collector Resistance of Planar Bipolar Transistors: Impact on Small Signal Characteristics and Compact Modeling","authors":"R. van der Toorn, J. Dohmen, O. Hubert","doi":"10.1109/BIPOL.2007.4351865","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351865","url":null,"abstract":"We investigate the relevance of the distribution of the extrinsic collector resistance of a bipolar transistor with respect to its small signal characteristics. We show that this distribution is relevant to the admittance parameters in general and to the cut-off frequency and unilateral power gain in particular. We present analytical results for ;y-parameters in terms of elements of the small-signal equivalent circuit of the Mextram compact model, extended with distributed extrinsic collector resistance. Hence, our results are relevant to compact modeling, bipolar device technology development and characterization and to design of RF power amplifiers.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122115961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 12-bit 65 MS/s pipeline A/D converter in 0.18 μm SiGe BiCMOS","authors":"S. Devarajan, R. Gutmann, K. Rose","doi":"10.1109/BIPOL.2007.4351837","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351837","url":null,"abstract":"This work discusses the benefits of a SiGe BiCMOS implementation over a CMOS implementation for pipeline A/Ds. While various circuit blocks in a pipeline A/D can benefit from the higher transconductance (gm), higher unity gain frequency (fT) and lower noise of SiGe HBTs, this work focuses on the most critical block in a pipeline A/D, the operational transconductance amplifier (OTA). An OTA employing an all NMOS pre-amplifier followed by a cascoded SiGe HBT stage with actively cascoded PMOS loads is designed. A prototype 12-bit pipeline A/D achieves a measured SNDR of 62.6 dB and a SFDR of 73.4 dB at 65 MS/s with a power dissipation of 325 mW and operates from dual 1.8 V and 3.3 V supplies.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121042767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Knoll, B. Heinemann, Y. Yamamoto, H. Wulf, D. Schmidt
{"title":"PNP SiGe: C HBT Optimization in a Low-Cost CBiCMOS Process","authors":"D. Knoll, B. Heinemann, Y. Yamamoto, H. Wulf, D. Schmidt","doi":"10.1109/BIPOL.2007.4351832","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351832","url":null,"abstract":"We present results of pnp transistor optimization in a low-cost, complementary SiGe:C BiCMOS process. A particular goal was to provide well matched parameters of pnp and npn devices. A high pnp transistor current gain of 100 was reached without compromising the LF noise behavior. Two types of pnp transistors are presented showing BVCEO values of 3.3 V and 4.5 V, respectively, a (BVCEO times fT) product in excess of 260 VGHz, fmax values up to 105 GHz, and a minimum noise figure of 1.2 dB at 5 GHz. These pnp data fit well to the data of the medium-voltage npn transistors also available in this CBiCMOS process.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"2020 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115858962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Hartmann, C. Wagner, K. Seemann, H. Jager, R. Weigel
{"title":"A 77 GHz SiGe Mixer Circuit with LO Active Frequency Multiplier for Automotive Radar","authors":"M. Hartmann, C. Wagner, K. Seemann, H. Jager, R. Weigel","doi":"10.1109/BIPOL.2007.4351870","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351870","url":null,"abstract":"This paper presents a direct-conversion mixer for 77 GHz integrated with an active 4times LO frequency multiplier. The circuit was manufactured using a SiGe technology. Noise figure, conversion gain, linearity and s-parameter measurement results will be shown.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114707670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
E. Gebreselasie, S. Voldman, Z. He, D. Coolbaugh, R. Rassel, T. Kirihata, A. Paganini, C. Cox, S. Mongeon, S. St. Onge, J. Dunn, R. Halbach, J. Lukaitis
{"title":"Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies","authors":"E. Gebreselasie, S. Voldman, Z. He, D. Coolbaugh, R. Rassel, T. Kirihata, A. Paganini, C. Cox, S. Mongeon, S. St. Onge, J. Dunn, R. Halbach, J. Lukaitis","doi":"10.1109/BIPOL.2007.4351878","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351878","url":null,"abstract":"An electrically programmable fuse, known as \"eFUSE,\" is used to provide passive device trimming and circuitry fine tuning for analog and mixed signal applications in silicon germanium BiCMOS technologies will be discussed. Timing analysis, pre-and post-programming electrical characterization, and electro-migration failure analysis will be presented.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121532838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Bazarjani, L. Mathe, D. Yuan, J. Hinrichs, G. Miao
{"title":"High-Voltage Low-Power Analog Design in Nanometer CMOS Technologies","authors":"S. Bazarjani, L. Mathe, D. Yuan, J. Hinrichs, G. Miao","doi":"10.1109/BIPOL.2007.4351857","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351857","url":null,"abstract":"Higher level of integration, lower cost and higher speed are driving CMOS technology deeper into nanometer regime of 65 nm and below. To ensure reliability of these 65 nm devices, power supply is scaled down to 1.2 V. However, certain functions such as high-speed USB and audio CODEC require higher power supply voltages of 3.3 V and 2.1 V. The minimum supply voltage of CODEC is determined by the power that needs to be delivered to the speakers or maximum input signal voltage that needs to be processed. Higher supply voltage provides lower power consumption for many analog functions. In this paper, methods of high voltage analog circuit integration into a 65 nm mixed-signal system are discussed. These integration methods include system in package (SiP) and system on chip (SoC.) SiP offers a low cost and fast to market option for mixed analog/digital integration. In some cases, system on chip (SoC) is desired due to lower power dissipation. High voltage active RC and switched-capacitor circuit design techniques using thin-oxide or combination of thin-and thick-oxide transistors are presented.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130862551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Pourchon, H. Beckrich-Ros, C. Raya, C. Faure, B. Gautheron, J. Blanc, B. Reynard, D. Céli
{"title":"High accuracy temperature bipolar modeling for demanding Bandgap application","authors":"F. Pourchon, H. Beckrich-Ros, C. Raya, C. Faure, B. Gautheron, J. Blanc, B. Reynard, D. Céli","doi":"10.1109/BIPOL.2007.4351864","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351864","url":null,"abstract":"VDD reduction in advanced CMOS IC's push for reduced temperature stability spread of bipolar based BGR. To achieve this goal, a reliable extraction methodology for IC temperature coefficient is detailed. Based on corner lot measurements, a worst-case bipolar model is built. Bandgap circuit measurements are finally compared to statistical simulations.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132980352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Large-Signal Performance, Linearity, and Reliability Characteristics of Aggressively-Biased Cascode SiGe HBTs for Power Amplifier Applications","authors":"C. Grens, J. Cressler, A. Joseph","doi":"10.1109/BIPOL.2007.4351854","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351854","url":null,"abstract":"Power performance, linearity, and reliability are investigated for aggressive VC bias (i.e., under strong base-current reversal and pinch-in) on cascode SiGe HBTs, in order to determine the influence of avalanche effects on PA performance and reliability. Moderate gain and linearity degradation are associated with excessive VC bias (pinch-in), and dynamic stress at high VC shows behavior similar to mixed-mode (simultaneous high JE + high VCB) stress. No significant degradation to PA performance was observed during dynamic stress.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129368942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Doherty Power Amplifier with Collector Current and Voltage Controls for Handset Applications","authors":"H.D. Bui, D. Teeter, D. Widay, S. Mil'shtein","doi":"10.1109/BIPOL.2007.4351847","DOIUrl":"https://doi.org/10.1109/BIPOL.2007.4351847","url":null,"abstract":"A Doherty power amplifier (DPA) with collector current and voltage controls for CDMA and WCDMA |(W)CDMA| application has been investigated and implemented using a standard HBT process. The impact of bias of the peak amplifier on linearity is also discussed. The statistical average current is used to evaluate the current consumption improvement of the DPA with collector current and voltage controls as compared to a single-ended class AB power amplifier.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128571722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}