E. Gebreselasie, S. Voldman, Z. He, D. Coolbaugh, R. Rassel, T. Kirihata, A. Paganini, C. Cox, S. Mongeon, S. St. Onge, J. Dunn, R. Halbach, J. Lukaitis
{"title":"Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies","authors":"E. Gebreselasie, S. Voldman, Z. He, D. Coolbaugh, R. Rassel, T. Kirihata, A. Paganini, C. Cox, S. Mongeon, S. St. Onge, J. Dunn, R. Halbach, J. Lukaitis","doi":"10.1109/BIPOL.2007.4351878","DOIUrl":null,"url":null,"abstract":"An electrically programmable fuse, known as \"eFUSE,\" is used to provide passive device trimming and circuitry fine tuning for analog and mixed signal applications in silicon germanium BiCMOS technologies will be discussed. Timing analysis, pre-and post-programming electrical characterization, and electro-migration failure analysis will be presented.","PeriodicalId":356606,"journal":{"name":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.2007.4351878","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
An electrically programmable fuse, known as "eFUSE," is used to provide passive device trimming and circuitry fine tuning for analog and mixed signal applications in silicon germanium BiCMOS technologies will be discussed. Timing analysis, pre-and post-programming electrical characterization, and electro-migration failure analysis will be presented.