P. Saha, A. Banerjee, P. Bhattacharyya, A. Dandapat
{"title":"Vedic Divider: Novel Architecture (ASIC) for High Speed VLSI Applications","authors":"P. Saha, A. Banerjee, P. Bhattacharyya, A. Dandapat","doi":"10.1109/ISED.2011.62","DOIUrl":"https://doi.org/10.1109/ISED.2011.62","url":null,"abstract":"Vedic Mathematics is the ancient methodology of Indian mathematics which has a unique computational technique for calculations based on 16 Sutras (Formulae). Novel divider architecture for high speed VLSI application using such ancient methodology is presented in this paper. Propagation delay and dynamic power consumption of a divider circuitry were minimized significantly by removing unnecessary recursion through Vedic division methodology. The functionality of these circuits was checked and performance parameters like propagation delay and dynamic power consumption were calculated by spice spectre using 90nm CMOS technology. The propagation delay of the resulting 16-bit binary dividend by an 8-bit divisor circuitry was only ~10.5ns and consumed ~24µW power for a layout area of ~10.25 mm2. By combining Boolean logic with ancient Vedic mathematics, substantial amount of iteration were eliminated that resulted in ~45% reduction in delay and ~30% reduction in power compared with the mostly used (Digit Recurrence, Convergence & Series Expansion) architectures.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130982479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects","authors":"Debaprasad Das, H. Rahaman","doi":"10.1109/ISED.2011.54","DOIUrl":"https://doi.org/10.1109/ISED.2011.54","url":null,"abstract":"We present the effects of cross talk in graphene nanoribbon (GNR) interconnects for 16 nm technology node. This is the first time that the cross talk analysis is presented in GNR interconnects. The electrical equivalent model is used to derive the electrical circuit parameters for GNR interconnects and cross talk analysis is performed for noise, and overshoot/undershoot analysis. The results are compared with that of copper (Cu) and multi-wall carbon nanotube (MWCNT) based interconnects. The near-end cross talk noise and overshoot/undershoot are greater in GNR as compared to that of Cu and MWCNT based interconnects, whereas the far-end noise and overshoot/undershoot in GNR are smaller as compared to Cu and greater as compared to that of MWCNT based interconnects. The impact of overshoot/undershoot on the gate oxide of MOS devices has been investigated and it is found that GNR based interconnect has two orders of magnitude less failure-in-time rate than Cu interconnects.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123824912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits","authors":"D. Kole, H. Rahaman, D. K. Das, B. Bhattacharya","doi":"10.1109/ISED.2011.69","DOIUrl":"https://doi.org/10.1109/ISED.2011.69","url":null,"abstract":"This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115020587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Statistical Blockade Method for Fast Robustness Estimation and Compensation of Nano-CMOS Arithmetic Circuits","authors":"Luo Sun, J. Mathew, D. Pradhan, S. Mohanty","doi":"10.1109/ISED.2011.64","DOIUrl":"https://doi.org/10.1109/ISED.2011.64","url":null,"abstract":"The challenges for nano-CMOS based design engineers have been aggravated due to the introduction of variability into the design phase. One of the ways to understand the circuit behaviors under process variation is to analyze the rare events that may be originated due to such process variation. A method named Statistical Blockade (SB) has been proposed to estimate the rare events statistics especially for high-replication circuits. It has shown much faster speed than traditional exhaustive Monte Carlo simulation. The full Monte Carlo simulation may estimate the tolerant ability for the designs of different CMOS logic styles by estimating the statistics (e.g. mean, variance, and standard deviation) of the circuit specification. However, it is immensely computationally expensive, can be infeasible for large circuits, and may consume significant man hours in the ever shortening time-to-market. Therefore, the fast robustness comparison for different designs are performed with Intelligent Statistical Blockade (ISB) method. In the ISB method, the tail part of the whole distribution is used in estimation, thereby saving time. In this paper, the ISB method is proposed to compare arithmetic circuits designs. An adder with different logic styles is considered as an example of arithmetic circuit. The novel method with ISB shows much faster than standard Monte Carlo simulation. Furthermore, for the chosen design which is proved to be robust even in worst-case, the optimal body bias voltage is applied to improve the performance and power while reducing the variability with Adaptive Body Bias (ABB) technique.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128440797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Oleg Garitselov, S. Mohanty, E. Kougianos, Priyadarsan Patra
{"title":"Bee Colony Inspired Metamodeling Based Fast Optimization of a Nano-CMOS PLL","authors":"Oleg Garitselov, S. Mohanty, E. Kougianos, Priyadarsan Patra","doi":"10.1109/ISED.2011.13","DOIUrl":"https://doi.org/10.1109/ISED.2011.13","url":null,"abstract":"The design and optimization complexity of analog/mixed-signal (AMS) components causes significant increase in the design cycle as the technology progresses towards deep nanoscale. This paper presents a two-tier approach to significantly reduce the design cycle time by combining accurate metamodeling and intelligent optimization. The paper first presents metamodeling which is a surrogate model of a parasitic-aware SPICE model of the circuit in order to simplify the optimization calculations and minimize the design space exploration time. The paper then introduces the Bee Colony Optimization (BCO) algorithm for nano-CMOS AMS circuit optimization. To best of the authors' knowledge, this is the first research combining metamodel and BCO for AMS design space exploration. The proposed design optimization flow is used on 5 metamodels with 21 design parameters each, corresponding to 5 distinct Figures of Merit (FoMs) to conduct multi objective optimization. A 180 nm LC-VCO PLL frequency generation circuit is used as case study. The optimization achieved approx. 90% power and 52% jitter reduction while keeping locking time constraints on the system. In comparison to an exhaustive simulation approach, metamodeling is 10^20 times faster.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123096179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Performance Analysis of Ultra Low-Power Mixed CNT Interconnects for Scaled Technology","authors":"S. Pable, M. Hasan, M. Kafeel","doi":"10.1109/ISED.2011.74","DOIUrl":"https://doi.org/10.1109/ISED.2011.74","url":null,"abstract":"Ultra low power -- efficient VLSI circuits design received wide attention due to rapid growth of portable applications. The portable domain places inflexible constraint on the power consumption. Though, device operating in sub threshold region shows huge potential towards satisfying the ULP requirement, it holds lots of difficult design issues. As integration density of interconnects increases at every technology node, increased delay and cross talk effects may becomes a more challenging design problem particularly for sub threshold interconnects. Nanometer sub threshold global interconnect faces sub threshold driver design challenges and problems due to increased interconnect capacitance. This paper examined and compared the effect of cross talk on delay for mixed wall carbon nano tube and Cu interconnects. This work reports new aspect ratio for global interconnect to reduce the effect of cross talk on interconnect performance under sub threshold conditions.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114822567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Energy Efficient Memory Authentication Mechanism in Embedded Systems","authors":"Satyajeet Nimgaonkar, M. Gomathisankaran","doi":"10.1109/ISED.2011.34","DOIUrl":"https://doi.org/10.1109/ISED.2011.34","url":null,"abstract":"The pervasiveness of modern day embedded systems has led to the storing of huge amount of sensitive information in them. These embedded devices have to often operate under insecure environments and hence are susceptible to software and physical attacks. Hence security becomes a prime concern in embedded systems. Although a lot of hardware cryptographic techniques have been proposed to provide high levels of security, they are hampered by the trade-offs created by the energy constraints in embedded systems. In this paper, we propose an Energy Efficient Memory Integrity Verification Mechanism that can adaptively tune a Memory Integrity Verification Module( MIV) to a Sensor Module(SM). This drastically reduces the energy overheads imposed on an embedded system as compared to the conventional security mechanisms. The simulation results help us conclude that the average energy saved in our mechanism ranges from 88% to 99%. This is much higher as compared to the results achieved in baseline simulations with traditional memory integrity verification techniques.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131915312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Versatile Battery Chargers for New Age Batteries","authors":"H. Joshi, M. Baghini","doi":"10.1109/ISED.2011.71","DOIUrl":"https://doi.org/10.1109/ISED.2011.71","url":null,"abstract":"This paper proposes two designs for a versatile charger capable of charging a range of batteries ranging from the conventional Li ion and Ni-Cd batteries to the more recent thin film batteries. The charger is equipped with a low power micro controller which enables the user to specify the kind of battery to be charged as well as calibrate the current and the voltage levels. The charger is capable of working in both, the Constant Current (CC) as well as the Constant Voltage (CV) mode. The constant current mode has the options of trickle charge and fast charge, the values of which can be calibrated beforehand. The charger implements a simple and efficient algorithm using the micro controller to decide the charging methodology and also detect end-points to avoid overcharging. One of the designs offers a very high accuracy of 0.02%/V in the charging current across input voltage values ranging from 2V to 5.5V, while the other has a power consumption of less than 1mW (for charging at 3V and current values of the order of a few microamperes), which opens up the possibility of powering the device using energy harvesting sources.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121678116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Harmonically Superior Switching Modulator with Wide Baseband and Real-Time Tunability","authors":"H. Patangia, S. Gourisetti","doi":"10.1109/ISED.2011.65","DOIUrl":"https://doi.org/10.1109/ISED.2011.65","url":null,"abstract":"The paper proposes a class of switching modulators with reduced harmonics to allow a wide base band. In an ordinary switching modulator, the harmonics are rich and the operating bandwidth is rather limited. Here we are advancing a harmonic elimination technique to place the unwanted harmonics at a frequency farther away from the fundamental. It is a novel PWM method where a reference sinusoid with the desired modulating frequency is compared against a complex periodic signal with the same time period as the reference. The modulator can be designed to function as a single frequency converter if the comparing waveform has frequency contents much higher than the reference. Simulation and experimental studies verify the proposed approach.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122820179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Performance-Power Design Space Exploration in a Hybrid Computing Platform Suitable for Mobile Applications","authors":"R. Jayaraman, Handi Kartadihardja, D. Maskell","doi":"10.1109/ISED.2011.55","DOIUrl":"https://doi.org/10.1109/ISED.2011.55","url":null,"abstract":"Mobile platforms have started to employ FPGA based hardware accelerators to address the ever-increasing demand for computing performance. For many applications, the use of an operating system on the hardware platform proves beneficial for reasons of better resource management and more robust security. This paper evaluates the performance-power implications in a signal processing algorithm with respect to the introduction of Linux OS on two different architectures (a CPU-based and an FPGA-based hybrid architecture). The results reveal that there is a 22 times improvement in energy budget between the CPU-based implementation and the FPGA-based hybrid implementation, with a negligible performance degradation due to the introduction of Linux OS.","PeriodicalId":349073,"journal":{"name":"2011 International Symposium on Electronic System Design","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125465315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}