可逆电路缺门故障检测自动测试集的推导

2011 International Symposium on Electronic System Design Pub Date : 2011-12-19 DOI:10.1109/ISED.2011.69

D. Kole, H. Rahaman, D. K. Das, B. Bhattacharya

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引用次数: 7

摘要

本文提出了一种可逆量子电路中测试集生成的新技术。该算法的发展是为了导出自动测试集(ATS)，用于检测所有部分缺门故障，所有单个缺门故障和多个缺门故障，在一个(n x n)可逆电路中实现k-CNOT门。本文还报道了一些基准电路的实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits

This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.

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2011 International Symposium on Electronic System Design

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