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An automated VCOs characterization system 一个自动化的VCOs表征系统
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734392
J.-F.J. Nowakowski
{"title":"An automated VCOs characterization system","authors":"J.-F.J. Nowakowski","doi":"10.1109/ARFTG.2006.4734392","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734392","url":null,"abstract":"In the highly competitive market of RFICs, components test plays a key role. In order to reduce the critical factor time to market, the main objective is to test the most products possible in the least amount of time, for the lowest cost and with the highest accuracy. Automated tests help reaching this goal, for example for VCOs measurements. A fully automated modular test system in industrial R&D laboratory environment has been developed for RF and I/O products. This paper presents a part of this global test system and focuses on VCOs measurements capabilities. Multiple die testing, temperature control, automatic report generation, traceability, large modularity, enhanced accuracy, multiple instruments choice, friendly interface, re use strategy are ones of the main features of this system. Using this solution, measured improvement of productivity is a factor of 12. This system will be extended to other types of RF/PLL/mixed measurements to provide complete characterization solutions. Some switching capabilities will allow mixing different measurements campaigns. The perspectives of this system are thus wide opened.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124836243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modeling the substrate effect of RF MOSFET’s based on four-port measurement 基于四端口测量的射频MOSFET衬底效应建模
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734373
Shih-Dao Wu, G. Huang, K. Liao
{"title":"Modeling the substrate effect of RF MOSFET’s based on four-port measurement","authors":"Shih-Dao Wu, G. Huang, K. Liao","doi":"10.1109/ARFTG.2006.4734373","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734373","url":null,"abstract":"In this paper, several 0.13 μm RF NMOSFET's were characterized by 4-port s-parameter measurement and the parameters of the small-signal equivalent circuit model of the RF MOSFET's were extracted from the 4-port measurement data directly. The frequency range of 4-port measurement is extended from 200 MHz to 20 GHz. While all parameters of the small-signal equivalent circuit model were extracted, the simulated and measured data were compared and found that they agreed with each other within the entire measurement frequency range.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125176416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An enhanced Line-Reflect-Reflect-Match calibration 增强的线反射-反射-匹配校准
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734364
L. Hayden
{"title":"An enhanced Line-Reflect-Reflect-Match calibration","authors":"L. Hayden","doi":"10.1109/ARFTG.2006.4734364","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734364","url":null,"abstract":"This paper reports the results of a detailed study of a commercial implementation of the Line-Reflect-Reflect Match (LRRM) vector network analyzer calibration method with automatic load inductance correction. Limitations in applicability for non-offset standards and when the Line (Thru) standard is electrically long and/or the load inductive reactance is large are examined. An enhanced LRRM (eLRRM) algorithm has been developed providing superior and more predictable results for these less frequently encountered cases. eLRRM is available in a commercial VNA calibration software product.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"23 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116351553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 73
Load-pull measurements of differential amplifiers 差分放大器的负载-拉力测量
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734388
D. Kother, J. Berben
{"title":"Load-pull measurements of differential amplifiers","authors":"D. Kother, J. Berben","doi":"10.1109/ARFTG.2006.4734388","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734388","url":null,"abstract":"Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133563713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Large signal S-parameters 大信号s参数
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734341
M. Odyniec
{"title":"Large signal S-parameters","authors":"M. Odyniec","doi":"10.1109/ARFTG.2006.4734341","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734341","url":null,"abstract":"This paper presents generalization of scattering parameters to nonlinear circuits, overviews their applications and discusses their limitations. Those limitations were not a problem as long as the devices under test were matched at all ports. However the software tools that allow arbitrary settings can be easily misused.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127847157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Tracking the waveform of microwave oscillators 跟踪微波振荡器的波形
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734339
Y. Rolain, W. van Moer, J. Schoukens, R. Pintelon
{"title":"Tracking the waveform of microwave oscillators","authors":"Y. Rolain, W. van Moer, J. Schoukens, R. Pintelon","doi":"10.1109/ARFTG.2006.4734339","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734339","url":null,"abstract":"A fully calibrated measurement of the output waveform of an oscillator is realized. The measurement is performed automatically without the need for synchronization between the oscillator and the LSNA hardware, and allows to track the time variations of the spectrum. The obtained spectral measurements outperform similar measurements that can be performed by a DSO.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128488560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and evaluation of microwave system for drying of textile 纺织品微波干燥系统的设计与评价
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734403
M. Pourová, O. Zak, J. Vrba
{"title":"Design and evaluation of microwave system for drying of textile","authors":"M. Pourová, O. Zak, J. Vrba","doi":"10.1109/ARFTG.2006.4734403","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734403","url":null,"abstract":"In this paper we describe our new results dealing with design and evaluation of microwave industrial applicators used for drying of textile materials. We have designed and evaluated two different types of these applicators: open-resonator-type and waveguide-type one. We describe here basic analytical models of the discussed applicators, results of numerical modelling and experimental evaluation as well. Prototype of microwave drying machine working with microwave power of 17 kW at frequency 2.45 GHz is reported.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115244997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging 高射频功率下s参数测量的去嵌入技术，与热成像相结合
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734356
B. Ivira, F. Ndagijimana, R. Fillit
{"title":"De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging","authors":"B. Ivira, F. Ndagijimana, R. Fillit","doi":"10.1109/ARFTG.2006.4734356","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734356","url":null,"abstract":"This work deals with a method for determining accurately reflection coefficient of one-port devices submitted to high RF power. A de-embedding theory based on S-matrix is carried out for mismatches of the test setup components: power amplifier, power circulator and probe. This bench was designed for reliability issues of RF components. An example of bench application on the new bulk acoustic wave resonator is presented. Those components are now widely used to build RF-filters in wireless-telecommunication systems. Moreover, an infrared camera with high spatial resolution (2 ¿m/pixel) gives complementary information about the temperature induced by self-heating inside probe and device, and its dependence on the RF power.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114785680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Noncontacting measurement of power in microstrip circuits 微带电路中功率的非接触测量
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734377
K. Yhland, J. Stenarson
{"title":"Noncontacting measurement of power in microstrip circuits","authors":"K. Yhland, J. Stenarson","doi":"10.1109/ARFTG.2006.4734377","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734377","url":null,"abstract":"This paper describes the use of a loop coupler probe for noncontacting measurement of power in microstrip circuits. The additional uncertainties, compared to contacting measurements, are investigated. The sensitivity of the coupling to positioning errors gives an uncertainty contribution in the same order as when using galvanically contacting techniques. The uncertainty due to probe directivity is comparable to the uncertainty when galvanically contacting internal parts of the circuit board. The impact of the probe on the waves on the circuit board is also investigated. In addition to the laboratory investigation of a probe, noncontacting measurements on a series produced microwave system are included. They agree well with contacting measurements.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115793829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Nonlinear microwave system characterization based on Higher Order Statistics 基于高阶统计量的非线性微波系统表征
2006 67th ARFTG Conference Pub Date : 2006-06-16 DOI: 10.1109/ARFTG.2006.4734349
J. Martins, N. Carvalho, J. Pedro
{"title":"Nonlinear microwave system characterization based on Higher Order Statistics","authors":"J. Martins, N. Carvalho, J. Pedro","doi":"10.1109/ARFTG.2006.4734349","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734349","url":null,"abstract":"This paper presents a setup for the nonlinear vectorial characterization based on the computation of the input-output signals¿ Higher Order Statistics. This setup assures a high dynamic range in the measurement and a broad useful bandwidth. The phase reference presents no bandwidth constraints since it is obtained directly from the input signal. The proposed setup was validated by simulation and the results state the validity of the method.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115523007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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