{"title":"增强的线反射-反射-匹配校准","authors":"L. Hayden","doi":"10.1109/ARFTG.2006.4734364","DOIUrl":null,"url":null,"abstract":"This paper reports the results of a detailed study of a commercial implementation of the Line-Reflect-Reflect Match (LRRM) vector network analyzer calibration method with automatic load inductance correction. Limitations in applicability for non-offset standards and when the Line (Thru) standard is electrically long and/or the load inductive reactance is large are examined. An enhanced LRRM (eLRRM) algorithm has been developed providing superior and more predictable results for these less frequently encountered cases. eLRRM is available in a commercial VNA calibration software product.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"23 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"73","resultStr":"{\"title\":\"An enhanced Line-Reflect-Reflect-Match calibration\",\"authors\":\"L. Hayden\",\"doi\":\"10.1109/ARFTG.2006.4734364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports the results of a detailed study of a commercial implementation of the Line-Reflect-Reflect Match (LRRM) vector network analyzer calibration method with automatic load inductance correction. Limitations in applicability for non-offset standards and when the Line (Thru) standard is electrically long and/or the load inductive reactance is large are examined. An enhanced LRRM (eLRRM) algorithm has been developed providing superior and more predictable results for these less frequently encountered cases. eLRRM is available in a commercial VNA calibration software product.\",\"PeriodicalId\":345451,\"journal\":{\"name\":\"2006 67th ARFTG Conference\",\"volume\":\"23 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"73\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 67th ARFTG Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2006.4734364\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 67th ARFTG Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.4734364","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An enhanced Line-Reflect-Reflect-Match calibration
This paper reports the results of a detailed study of a commercial implementation of the Line-Reflect-Reflect Match (LRRM) vector network analyzer calibration method with automatic load inductance correction. Limitations in applicability for non-offset standards and when the Line (Thru) standard is electrically long and/or the load inductive reactance is large are examined. An enhanced LRRM (eLRRM) algorithm has been developed providing superior and more predictable results for these less frequently encountered cases. eLRRM is available in a commercial VNA calibration software product.
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