{"title":"A Monte Carlo analysis of VNA-based time domain uncertainties","authors":"J. Martens","doi":"10.1109/ARFTG.2006.4734355","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734355","url":null,"abstract":"While VNA-based time domain measurements have been in use for decades, an uncertainty analysis has often been limited to the concept of an `average¿ of frequency domain uncertainties. There is some evidence that this is too restrictive a view and that there is a need for a better framework to understand the dependencies. A physical model-based Monte Carlo analysis concept will be presented here that illustrates the wide disparity in how certain frequency-domain uncertainty concepts propagate to the time domain. Among these findings is that some classical match and directivity components are often suppressed while certain drift components can be accentuated.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128280923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using simple calibration load models to improve accuracy of Vector Network Analyzer measurements","authors":"N. Ridler, N. Nazoa","doi":"10.1109/ARFTG.2006.4734353","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734353","url":null,"abstract":"A simple technique is presented that significantly improves the performance of some conventional. vector network analyzer (VNA) calibration routines. This, in turn, provides greater accuracy of measurement for the calibrated VNA. The technique relies on using `traceable¿ measurements at DC and high frequencies to characterize the VNA¿s load standard, used during calibration, in terms of polynomial fits to the measurement data. The method can be applied to calibration schemes that use a load (i.e. a `match¿) to provide an assumed known value of reflection during the calibration process (e.g. SOLT, TRM, LRM, etc). The method can be implemented in most types of commonly used transmission lines (e.g. coaxial line, co-planar waveguide, micro-strip, etc). The paper gives results illustrating the performance of the technique applied to a VNA operating to 3 GHz in coaxial line, calibrated using the SOLT technique.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116074663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Wideband characterization of a Doherty amplifier using behavioral modeling","authors":"D. Wisell, M. Isaksson, N. Keskitalo, D. Ronnow","doi":"10.1109/ARFTG.2006.4734374","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734374","url":null,"abstract":"A Doherty amplifier was investigated using behavioral amplifier modeling techniques. A measurement system for simultaneous wide bandwidth (>100 MHz) and large dynamic range (-70 dBc ACLR) sampled measurements that are needed for the behavioral modeling is presented. Both the measurement system and the performance of the Doherty amplifier are described. The findings are that the well known and widely used parallel Hammerstein model, also denoted the memory polynomial model, is well suitable also for modeling and predistortion of Doherty amplifiers, and that a Doherty amplifier can be designed with only minor memory effects. This is seen in the modeling error, which is reduced by 13 dB, compared with a constant gain, using a memoryless polynomial model and only 6 dB further by adding memory to the model.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122455739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical fiber link 1-pass 2-port antenna measurement system","authors":"S. Kurokawa, M. Hirose, K. Komiyama","doi":"10.1109/ARFTG.2006.4734395","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734395","url":null,"abstract":"We have proposed the optical fiber link antenna measurement system that can measure the calibrated S11 and S21 between two antennas under test (AUT) after OSLT calibration in one-pass two-port system. Our system consists of the transmitting and receiving optical-fiber link systems. The transmitting system consists of the electro-absorptive modulator, erbium doped fiber optical amplifier (EDFA), optical fiber, zero biased uni-traveling-carrier photodiode (UTC-PD), small type bi-directional coupler, and two optical reflection type Mach-Zehnder LiNbO3 optical intensity modulators (LN-modulators) with 50 ohm loads. The system can detect the reflection signal from the transmitting AUT and the reference signal toward the AUT. The receiving system consists of an optical reflection type LN-modulator and the optical field measurement system, to measure the transmission signal through the receiving AUT. Our system can measure the reference signal, the reflection signal, and the transmission signal in one-pass two-port model between the two AUTs. Then OSLT calibration can be adopted. In this paper, in order to demonstrate the validity of our optical fiber link system, we compare the calibrated S11 and S21 results of two UHALP9108A 1 Log-periodic antennas by our proposed optical-fiber link system with the ones by the conventional coaxial cable system in frequency-domain and time-domain measurements. The results clearly indicate that our proposed system can be used to evaluate the S11 and S21 of the AUT at the frequency range from 300 MHz to 1800 MHz without coaxial cables.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126539538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Blanchet, H. Bousbia, D. Barataud, J. Nebus, D. Pache
{"title":"The locus of points of constant output VSWR around the load optimal impedance: Evaluation of power transistors robustness","authors":"F. Blanchet, H. Bousbia, D. Barataud, J. Nebus, D. Pache","doi":"10.1109/ARFTG.2006.4734357","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734357","url":null,"abstract":"This paper determines the locus of points of constant output voltage standing wave ratio (VSWR) around the load optimal impedance at the fundamental frequency. This resolution is very helpful to determine the power transistors robustness. To illustrate this, some measurements results are presented on a Si/SiGe HBT of STMicroelectronics technology. The measurements are realized on two multi-harmonic load-pull test-benches: one passive and one active.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114336652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Vandermot, W. van Moer, J. Schoukens, Y. Rolain
{"title":"Understanding the nonlinearitY of a mixer using multisine excitations","authors":"K. Vandermot, W. van Moer, J. Schoukens, Y. Rolain","doi":"10.1109/IMTC.2006.328451","DOIUrl":"https://doi.org/10.1109/IMTC.2006.328451","url":null,"abstract":"In this paper a measurement technique is proposed to verify whether the ¿nonideal nonlinearities¿ of mixers are introduced before or after the ideal multiplier. To prove the concept of the proposed approach, simulations are used to show how the system reacts on a special odd multisine excitation. This allows to predict the contributions of the nonideal nonlinearities in the output spectrum of the mixer. A real mixer is then excited with a special odd multisine and measured with a 2-port Large Signal Network Analyzer (LSNA) [1]. The measurement results are compared to the simulations to validate this technique, which technique allows to get more insight in the nonideal nonlinear behavior of mixers.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129963554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurements and design of high power devices and systems","authors":"Ken Wong","doi":"10.1109/arftg.2006.4734332","DOIUrl":"https://doi.org/10.1109/arftg.2006.4734332","url":null,"abstract":"","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129919675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}