{"title":"Field profiling of resonant structure by an active circuit loop method","authors":"C. Jing, T. Wong","doi":"10.1109/ARFTG.2006.4734399","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734399","url":null,"abstract":"In conventional field probing of resonant accelerating structures that are high power RF devices for particle acceleration, the resonator under perturbation is being measured as a passive component by a network analyzer, with the procedure often being referred to as a bead-pull experiment. In this investigation, an alternative approach to measure the perturbed resonator by incorporating it within an oscillator loop is described. It has the advantages of simplicity in design and offering direct readout of the oscillator output frequency, which enables the electric field at the location of the dielectric bead to be readily determined. The theoretical basis and the experimental arrangement are described in detail. Measurement data obtained by this method for the axial field distribution of a resonant cell taken from an L-band coupled-cavity accelerating structure are presented.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134402293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Calibration of six-port reflectometers using null double injection","authors":"D. Hui, R. Weikle","doi":"10.1109/ARFTG.2006.4734368","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734368","url":null,"abstract":"A new method for calibrating six-port reflectometers is presented. The method is based on the principle of ¿null double injection¿, a technique that consists of simultaneously driving the input and test ports of the reflectometer with sources whose relative amplitudes and phases are adjusted to produce nulls at the detector outputs. This six-port-to-four-port reduction technique permits the network constants to be determined simply from ratios of measured power at the remaining (unnulled) ports. Application of the technique to a prototype non-contacting reflectometer is demonstrated. The measurements of reflection coefficient for a set of loads taken by the prototype non-contacting reflectometer using this calibration method show good agreement with the ones by HP 8720C vector network analyzer, with measurement discrepancy less than 2% for 6 dB and 10 dB attenuators and less than 4% for the offset short over the frequency range from 1 GHz to 1.5 GHz.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126177559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automatic root selection for the unknown thru algorithm","authors":"J. Stenarson, K. Yhland","doi":"10.1109/ARFTG.2006.4734366","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734366","url":null,"abstract":"This paper presents a method for automatic root selection in the unknown thru algorithm. The described method can be used for any thru standard that has a simple phase expression. Examples for coaxial, waveguide and waveguide to coaxial adapters are discussed. The paper also includes equations for converting the resulting 7-term error model to the 12-term model commonly used in network analyzers. And also how to combine these steps into a simple algorithm that utilizes as much as possible of the VNA firmware for computations.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129648244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The applicability of Noise Power Ratio (NPR) in real communication signals","authors":"K. Gharaibeh, K. Gard, M. Steer","doi":"10.1109/ARFTG.2006.4734397","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734397","url":null,"abstract":"A study of noise power ratio (NPR) of real communication signals is performed. The analysis of NPR is done using the orthogonalization of the behavioral model which allows the separation of the correlated and uncorrelated components of the nonlinear output. It is shown that NPR measurements using NBGN overestimate in-band distortion of real communication signals. Simulated NPR of a reverse link IS-95 signal is compared to that of narrow band Gaussian noise (NBGN) and verified by measurements.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116253294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multiport S-parameter calculation from two-port network analyzer measurements with or without switch matrix","authors":"H. Heuermann","doi":"10.1109/ARFTG.2006.4734386","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734386","url":null,"abstract":"A simple method to calculate 3- to n-port S-parameters from two-port network analyzer measurements is described. This multiport calculation (MC) procedure supports all two-port calibration methods e.g. SOLT or LMR without any additional standard. Small included approximations have no influence on the quality of practical measurement results. This developed MC-procedure works with vector network analyzers with three or four measurement channels to measure two-port paths of n-port devices with high accuracy. A switch matrix can be used to simplify the measurements. The presented calculation algorithm of the MC-procedure is out-standing regarding the simplicity and numerical robustness. The algorithm allows an easy programming for the correction of measurements of any device independent of the number of ports (3 to n). Experimental results attest the very good precision of MC error corrected measurements.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124616335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Network analyzers from small signal to large signal measurements","authors":"D. Rytting","doi":"10.1109/ARFTG.2006.4734338","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734338","url":null,"abstract":"This paper is a PowerPoint presentation discussing network analyzers. The presentation covers several topics, from large to small signal measurements, error correction, AM to PM compression, hot S22 measurements, load pull measurements and pulse measurements.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124492834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Statistical estimation of the propagation constant in multiline calibrations","authors":"K. Andersson, C. Fager","doi":"10.1109/ARFTG.2006.4734358","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734358","url":null,"abstract":"In this paper we propose a method for improving the accuracy of estimating the propagation constant in multiline calibrations. The method employs an extended Kalman filter to take advantage of the fact that the propagation constant is strongly correlated between frequencies. The method is then compared against the traditional multiline method.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134636612","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using the goodness-of-fit to validate the power sensor linearity specification","authors":"Y. Lee","doi":"10.1109/ARFTG.2006.4734379","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734379","url":null,"abstract":"A microwave power sensor could measure the power levels ranging from 20 dBm to -70 dBm. The linearity is an important specification for accurate power measurements. The estimate of the linearity accuracy of power sensors is well-developed and studied. There are only limited papers and discussions on the validation of the power level linearity. In this report, we are presenting a statistical method, i.e. confidence level (e.g., 95%) and linear regression analysis, to determine the level linearity for a diode sensor. At first, the confidence level.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116354973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Millimeter wave power measurement above 110 GHz","authors":"Y. Lau, T. Denning, C. Oleson","doi":"10.1109/ARFTG.2006.4734350","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734350","url":null,"abstract":"With the power measurement standards above 110 GHz undefined, it is left to individuals to devise the methodology of determining the RF power above 110 GHz. This paper details a simple and repeatable method in measuring RF power up to 1 THz using a calorimeter. Calorimeter power measurement is based on the black body absorption principle - a change in temperature between a known power absorbed to an unknown power absorbed. Performance of various millimeter wave bands RF power data are presented and compared.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116647068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Designing power amplifiers? Use good excitation signals","authors":"L. De Locht, Y. Rolain, G. Vandersteen","doi":"10.1109/ARFTG.2006.4734382","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734382","url":null,"abstract":"The performance of any communication front-end depends largely on the efficiency and the linearity of the power amplifier. Power amplifiers are difficult to design since the available design techniques are not valid for the more complex modulation schemes used nowadays. Therefore, one needs to include information about these complex signals in the design strategy. But this information should be used such that it allows the designer to take good design steps. We reviewed the traditionally used load-pull design technique for power amplifier designs using multi-tone excitation signals to MIMIC the real excitation signals. This approach is illustrated on the loadpull characteristics of a 5 GHz power amplifier in 0.13 ¿m CMOS technology. This example shows the difference in design choices when using the correct excitation signals. Therefore, it illustrates the importance of these methods and the excitation signal used.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130824887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}