2006 67th ARFTG Conference最新文献

{"title":"The role of channel frequency response estimation in the measurement of RF impairments in OFDM systems","authors":"H. Arslan, D. Singh","doi":"10.1109/ARFTG.2006.4734393","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734393","url":null,"abstract":"In this paper, the effect of channel response on the measurement of analog front-end impairments is discussed. It will be shown that accurate channel estimation is an integral part of many measurements. Specifically, an OFDM based WiMAX system is considered. Two case studies that describe the relations between channel estimation and transmitter quality measurements are given.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129811113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Broadband high power amplifiers for instrumentation","authors":"F. Sechi, M. Bujatti","doi":"10.1109/ARFTG.2006.4734342","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734342","url":null,"abstract":"Microwave power amplifiers designed for instrumentation are characterized by a range of properties which sets them apart from other types of applications. Broad bandwidths are generally desired, and so are low noise (both in amplitude and phase), high stability, and low spurious responses. High reliability is a plus for most applications, but in this case ease of repair is also quite significant and so is the ability to maintain some working capability in case of failure (the so-called graceful degradation). When a measurement is performed by transmitting and receiving a signal, the ability to turn off and on the amplifier at a fast rate may dramatically improve the instrument sensitivity and fast pulsing can be a very desirable option. All of these characteristics are much more favorable in Solid State Power Amplifiers (SSPAs) than in traveling wave tubes (TWTs) and the former are generally the preferred choice unless an unusually high power output is required.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122283710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An improved multiline TRL method","authors":"J.E. Zuiga-Juarez, J. Reynoso‐Hernández, M. C. Maya‐Sanchez","doi":"10.1109/ARFTG.2006.4734363","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734363","url":null,"abstract":"This paper presents a multiline TRL (Thru-Reflect Line) method that is based on a straightforward de-embedding method and a reliable method for determining a each frequency the value of a/c, b, and e-¿1 terms. The main features of the proposed multiline TRL are: a) The transmission line propagation constant is not used, therefore the physical lengths of the lines are not needed, and b) The Gauss-Markov method is used only to estimate the best values of the constants a/c and b. The S parameters of an offset short, an offset open, and a load, measured in the frequency range of 1-50 GHz, corrected with the multiline TRL method from NIST and the multiline TRL method from CICESE agree each other.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127440542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Coplanar microwave probe characterization: Caveats and pitfalls","authors":"U. Arz, D. Schubert","doi":"10.1109/ARFTG.2006.4734384","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734384","url":null,"abstract":"In this paper, we investigate the wideband microwave properties of standard coplanar microwave probes using popular one- and two-port measurement methods. We illustrate the importance of accurate standard definitions and demonstrate the impact of: the substrate material on the probe characteristics in a frequency range up to 50 GHz.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122583627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Load-pull measurement comparison of a LDMOS device with two-tone and digitally modulated stimuli","authors":"P. Ghanipour, S. Stapleton, Jong‐Heon Kim","doi":"10.1109/ARFTG.2006.4734347","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734347","url":null,"abstract":"A large-signal fully automated load-pull system for characterization of adjacent channel power for wideband code-division multiple-access (WCDMA) based wireless communication systems, with varying peak-to-average ratios (PAR) is described. Load-pull measurements are used to determine optimum load impedances for power gain and adjacent channel power ratio (ACPR) in an LDMOS stimulated with WCDMA sources with five different PAR values. The results are compared to load-pull measurements of gain and third-order intermodulated products, based on a two-tone source signal. The results indicate that the optimum match impedance changes depending on whether a two-tone or a digitally modulated source is used as a stimulus. Furthermore, it is shown that the optimum load impedance for power gain and ACPR is also dependant on the PAR of a digitally modulated signal. It is shown, that the change in the optimum load match for the different types of signals is significant enough to warrant further investigation.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125886680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Improving loadpull measurement time by intelligent measurement interpolation and surface modeling techniques","authors":"P. Hart, J. Wood, B. Noori, P. Aaen","doi":"10.1109/ARFTG.2006.4734346","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734346","url":null,"abstract":"In this paper we show how a thin-plate spline approximation can be used to generate a model of the measured response surface of a load-pull measurement over a much-reduced number of impedance points with no significant loss of accuracy. Further, interpolation between these model surfaces is possible, generating accurate drive-up characteristics. This has enabled accurate load-pull characterizations to be made in a fraction of the usual time.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124068610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Statistical evaluation of finite length digital modulation sequences","authors":"P. Draxler, P. Asbeck","doi":"10.1109/ARFTG.2006.4734401","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734401","url":null,"abstract":"By using properly selected test waveforms, one can accurately evaluate power amplifier performance for operation with digitally modulated signals. The waveforms must balance instrumentation constraints (such as fixed length sequences and circularity) against requirements to represent waveforms from the field (such as matching peak to average ratio, and spectral shape). This paper focuses on two-carrier WCDMA signals and uses the normalized power RMS error metric to quantify the impact of decresting. Additionally, the ensemble CCDF variation (ECV) plot is introduced as a qualitative tool to evaluate the differences between finite length test waveforms and fielded waveforms.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127808760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Estimation of uncertainty of calibration for loop antennas by three-antenna method using automatic network analyzer","authors":"M. Ishii, K. Komiyama","doi":"10.1109/ARFTG.2006.4734367","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734367","url":null,"abstract":"Loop antennas are used to measure the magnetic field emitted from electric and electronic devices, power-transmission lines and so on. The antenna factor of a receiving loop antenna must be accurately calibrated as one of antenna's characteristics. The common loop antenna with the diameter of several ten cm is electrically small antenna when it is used for the frequency lower than 30 MHz. In such a low frequency range, the major measurement method is \"Standard Field Method \". The current detector using thermo-couple is used to decide the exciting current of transmitting loop antenna. The generated magnetic field is utilized to measure the antenna factor of receiving loop antenna. The fragile structure is one of the drawbacks to keep stability and reproducibility. Besides, a common technique of three antenna measurement is promising for a reliable method for loop antenna measurement. We adopted the technique and examined the uncertainty of the loop antenna measurement using ah automatic network analyzer. In this paper, we discuss the uncertainty of \"3-Antenna Method\", for loop antenna calibration. The \"Standard Field Method \" is commonly used, and a current detector with a thermocouple is used. It is easily damaged by the exciting current itself because strong current (sometimes about 1 A) is needed to make the magnetic field enough for measurement. However, in \"3-Antena Method\", it is possible to use an automatic vector network analyzer. So it is expected that we can obtain a wide dynamic-range and stability by automatic measurement. The magnetic antenna factor of a loop antenna is defined as the ratio of the incident plane magnetic field strength to the output voltage across the load impedance (50 ?). However, it is difficult to apply such actual plane wave to a loop antenna and to realize far-field condition in the low frequency. Consequently there is non-uniformly distributed magnetic field inside the loop. Therefore the average magnetic field inside the receiving loop antenna is ordinarily used instead of the ideal plane magnetic field. We adopted this average magnetic field for \"3-Antenna Method\" to calibrate loop antennas. The target of the paper is the evaluation of \"3-Antenna Method\" using the averaged magnetic field and the estimation of uncertainties for this calibration method using automatic vector network analyzer.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128198627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Cold-source measurements for noise figure calculation in spectrum analyzers","authors":"N. Otegi, J. Collantes, M. Sayed","doi":"10.1109/ARFTG.2006.4734387","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734387","url":null,"abstract":"A detailed analysis of the suitability of cold source based noise figure measurements in a spectrum analyzer is given in this paper. This technique presents some advantages in comparison to classical Y-factor techniques when dealing with problems related to device input match. A fully corrected noise figure calculation procedure, complemented with vector corrections and receiver noise calibration, is analyzed. For that, a noise calibration of the spectrum analyzer receiver, based upon analytical calculation, is given.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122543601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Power accuracy and source-pull effect for a high-power RF generator","authors":"Yufeng Han, A. Radomski, Y. Chawla, J. Valcore, S. Polizzo","doi":"10.1109/ARFTG.2006.4734348","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.4734348","url":null,"abstract":"RF high-power generators are extensively used for plasma etching technologies. In order to achieve high quality for the Silicon wafer process, power accuracy and stability become critical requirements for RF generators. Since a plasma chamber is regarded as a nonlinear active load, load-pull effect has been investigated thoroughly in recent years. However, power measurement is not just related to load situations. Source mismatch also plays an important role for power stability and accuracy. In this paper, power accuracy for a high-power RF generators is investigated through theoretical estimation and direct experiments. For low-reflection loads, the source-mismatch effect is dominant in power measurement error when a calibrated V-I probe is used for reflection and power measurement. In order to investigate this effect, a series of load-pull experiments have been made on a commercial RF generator with power feedback. It is shown that a given source mismatch can be greatly reduced through power feedback [14][15]. The remaining source mismatch effect becomes a comprehensive result related to three factors: the dynamics of nonlinear capacitance of the power transistors, static mismatch from the output filters and the load situation. Between the source mismatch and load reflection, there are some interesting relationships that can be used to correct the power error and thus improve system performance for the generator.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123337274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}