The locus of points of constant output VSWR around the load optimal impedance: Evaluation of power transistors robustness

Abstract

This paper determines the locus of points of constant output voltage standing wave ratio (VSWR) around the load optimal impedance at the fundamental frequency. This resolution is very helpful to determine the power transistors robustness. To illustrate this, some measurements results are presented on a Si/SiGe HBT of STMicroelectronics technology. The measurements are realized on two multi-harmonic load-pull test-benches: one passive and one active.