差分放大器的负载-拉力测量

D. Kother, J. Berben
{"title":"差分放大器的负载-拉力测量","authors":"D. Kother, J. Berben","doi":"10.1109/ARFTG.2006.4734388","DOIUrl":null,"url":null,"abstract":"Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Load-pull measurements of differential amplifiers\",\"authors\":\"D. Kother, J. Berben\",\"doi\":\"10.1109/ARFTG.2006.4734388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.\",\"PeriodicalId\":345451,\"journal\":{\"name\":\"2006 67th ARFTG Conference\",\"volume\":\"110 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 67th ARFTG Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2006.4734388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 67th ARFTG Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.4734388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

微波系统越来越多地使用SiGe器件,这些器件采用差分连接方式构建。不幸的是,商业上可用的测量系统大多是为单端互连而开发的。对于电路的线性特性,这不是一个限制。通过测量所有单端s参数,可以得到器件的完整描述。但是,对于大信号操作,这种叠加两部分测量的方法已经不可能了。需要一种直接的方法来确定输入端口同时驱动信号并测量输出信号的幅度和相位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Load-pull measurements of differential amplifiers
Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信