{"title":"差分放大器的负载-拉力测量","authors":"D. Kother, J. Berben","doi":"10.1109/ARFTG.2006.4734388","DOIUrl":null,"url":null,"abstract":"Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.","PeriodicalId":345451,"journal":{"name":"2006 67th ARFTG Conference","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Load-pull measurements of differential amplifiers\",\"authors\":\"D. Kother, J. Berben\",\"doi\":\"10.1109/ARFTG.2006.4734388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.\",\"PeriodicalId\":345451,\"journal\":{\"name\":\"2006 67th ARFTG Conference\",\"volume\":\"110 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 67th ARFTG Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2006.4734388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 67th ARFTG Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.4734388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave systems make more and more use of SiGe devices, which are build with differential connections. Unfortunately, the commercially available measurement systems are mostly developed for single-ended interconnects. For the linear characterization of circuits this is not a restriction. By measurements of all single-ended S-parameters the complete description of the devices is available. But, for large-signal operation such an approach of superposing 2-part measurements is not longer possible. A direct method to determine the properties with simultaneous drive signals at input ports and measuring both output signals in amplitude and phase is required.