IEEE International Electron Devices Meeting 2003最新文献_第7页

Ambient intelligence - key technologies in the information age 环境智能——信息时代的关键技术

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269154

W. Weber, C. Braun, R. Glaser, Y. Gsottberger, M. Halik, S. Jung, H. Klauk, C. Lauterbach, G. Schmid, X. Shi, T. Sturm, G. Stromberg, U. Zschieschang

引用次数: 21

Thousands of microcantilevers for highly parallel and ultra-dense data storage 数以千计的微悬臂用于高度并行和超密集的数据存储

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269392

P. Vettiger, T. Albrecht, M. Despont, U. Drechsler, U. Durig, B. Gotsmann, D. Jubin, W. Haberle, M. Lantz, H. Rothuizen, R. Stutz, D. Wiesmann, G. Binnig, P. Bachtold, G. Cherubini, C. Hagleitner, T. Loeliger, A. Pantazi, H. Pozidis, E. Eleftheriou

引用次数: 9

Mixed-signal performance of sub-100nm fully-depleted SOI devices with metal gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions 具有金属栅极、高K (HfO/sub 2/)介电和高源极/漏极扩展的亚100nm全耗尽SOI器件的混合信号性能

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269441

A. Vandooren, Aaron Thean, Y. Du, I. To, J. Hughes, Tab A. Stephens, M. Huang, S. Egley, M. Zavala, K. Sphabmixay, A. Barr, T. White, S. Samavedam, Leo Mathew, J. Schaeffer, D. Triyoso, M. Rossow, D. Roan, Daniel T. Pham, Raj Rai, Bich-Yen Nguyen, B. E. White, Marius K. Orlowski, A. Duvallet, Thuy B. Dao, J. Mogab

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引用次数: 30

Universal recovery behavior of negative bias temperature instability [PMOSFETs] 负偏置温度不稳定性的普遍恢复行为[pmosfet]

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269294

S. Rangan, N. Mielke, E.C.C. Yeh

引用次数: 290

Record efficiency and gain at 2.1 GHz of high power RF transistors for cellular and 3G base stations 为蜂窝和3G基站记录2.1 GHz高功率射频晶体管的效率和增益

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269298

H. Brech, W. Brakensiek, D. Burdeaux, W. Burger, C. Dragon, G. Formicone, B. Pryor, D. Rice

引用次数: 40

Dopant redistribution effects in preamorphized silicon during low temperature annealing 预非晶硅低温退火过程中掺杂剂重分布效应

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269328

V. Venezia, R. Duffy, L. Pelaz, M. Aboy, A. Heringa, P. Griffin, C. Wang, M. Hopstaken, Y. Tamminga, T. Dao, B. Pawlak, F. Roozeboom

引用次数: 5

Sub-10-nm planar-bulk-CMOS devices using lateral junction control 采用横向结控制的亚10nm平面块体cmos器件

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269446

H. Wakabayashi, S. Yamagami, N. Ikezawa, A. Ogura, M. Narihiro, K. Arai, Y. Ochiai, K. Takeuchi, Toyoji Yamamoto, T. Mogami

引用次数: 69

A self-consistent junction temperature estimation methodology for nanometer scale ICs with implications for performance and thermal management 纳米级集成电路的自一致结温估计方法及其对性能和热管理的影响

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269421

K. Banerjee, Sheng-Chih Lin, A. Keshavarzi, S. Narendra, V. De

引用次数: 61

Nanowires as building blocks for nanoelectronics and nanophotonics 纳米线作为纳米电子学和纳米光子学的基石

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269284

C. Lieber

引用次数: 11

Reliability study of CMOS FinFETs CMOS finfet可靠性研究

IEEE International Electron Devices Meeting 2003 Pub Date : 2003-12-08 DOI: 10.1109/IEDM.2003.1269206

Yang-Kyu Choi, Daewon Ha, E. Snow, J. Bokor, T. King

引用次数: 65