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2011 9th East-West Design & Test Symposium (EWDTS)最新文献

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Thermal analysis of the ball grid array packages 球栅阵列封装的热分析
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116604
K. Petrosyants, N. I. Rjabov
{"title":"Thermal analysis of the ball grid array packages","authors":"K. Petrosyants, N. I. Rjabov","doi":"10.1109/EWDTS.2011.6116604","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116604","url":null,"abstract":"New quasi - 3D numerical model for thermal analysis of the BGA packages is presented. The general 3D heat transfer problem is correctly transformed to the set of 2D equations for temperature distributions in different layers of the package. The complexity and CPU time of the thermal analysis are many times reduced. The results of BGA package thermal modeling are presented.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132149526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Configurable architecture for memory BIST 内存BIST的可配置架构
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116571
A. Lotfi, P. Kabiri, Z. Navabi
{"title":"Configurable architecture for memory BIST","authors":"A. Lotfi, P. Kabiri, Z. Navabi","doi":"10.1109/EWDTS.2011.6116571","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116571","url":null,"abstract":"The number of memory components in today's chips is increasing considerably. Through the limitations on area and number of test pins, it is not feasible to use a separate BIST architecture for testing every memory on the chip. Therefore, it is essential to have a configurable BIST architecture. In this paper, a configurable memory BIST architecture that can test different memories having different sizes and configurations with an arbitrary test algorithm is proposed.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114305910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Organization of pipeline operations in mapping unit of the dataflow parallel computing system 数据流并行计算系统映射单元中管道操作的组织
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116570
N. Levchenko, A. Okunev, D. Yakhontov
{"title":"Organization of pipeline operations in mapping unit of the dataflow parallel computing system","authors":"N. Levchenko, A. Okunev, D. Yakhontov","doi":"10.1109/EWDTS.2011.6116570","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116570","url":null,"abstract":"The paper reviews the architecture of dataflow parallel computing system, describes the operation mechanisms of one of the main system modules - the mapping unit. The pipeline mode of mapping unit is considered; an increasing of the capacity associated with the introduction of the pipeline is estimated. The process of step-by-step optimization of pipeline with a description of the bottlenecks and ways to bypass them is shown.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127187165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A programmable BIST with macro and micro codes for embedded SRAMs 嵌入式ram的宏、微代码可编程BIST
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116584
P. Manikandan, Bjørn B. Larsen, E. Aas, Mohammad Areef
{"title":"A programmable BIST with macro and micro codes for embedded SRAMs","authors":"P. Manikandan, Bjørn B. Larsen, E. Aas, Mohammad Areef","doi":"10.1109/EWDTS.2011.6116584","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116584","url":null,"abstract":"This paper presents a programmable built-in self-test (PBIST) methodology for embedded SRAMs. The BIST logic adapts the test controller with micro code encoding technique in order to control test operation sequences. The macro codes are used to select any of seven MARCH algorithms, and detect different faults of the memory under test (MUT). This BIST supports both the test and normal operation modes. The experimental results show that this work gives 17–47% improved area overhead and 16–41% enhanced speed compared to three published results.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126953615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Test set compaction procedure for combinational circuits based on decomposition tree 基于分解树的组合电路测试集压缩程序
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116596
V. Andreeva
{"title":"Test set compaction procedure for combinational circuits based on decomposition tree","authors":"V. Andreeva","doi":"10.1109/EWDTS.2011.6116596","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116596","url":null,"abstract":"In this paper a procedure of compaction a test set for combinational circuits is considered. The compaction procedure is oriented to a test set that represented as set of test cubes. The main idea of compaction a test cubes is to find all maximally compatible subsets by constructing decomposition tree. An irredundant cover of test cubes by all maximally compatible subsets allows finding minimal or close to minimal size of test pattern setting. Experimental results for benchmark circuits demonstrate the efficiency of the suggested compaction procedure.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116588518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
High performance audio processing SoC platform 高性能音频处理SoC平台
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116580
Denis Muratov, V. Boykov, Yuri Iskiv, Igor Smirnov, V. Vertegel, S. Berdyshev, Y. Gimpilevich, Gilad Keren
{"title":"High performance audio processing SoC platform","authors":"Denis Muratov, V. Boykov, Yuri Iskiv, Igor Smirnov, V. Vertegel, S. Berdyshev, Y. Gimpilevich, Gilad Keren","doi":"10.1109/EWDTS.2011.6116580","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116580","url":null,"abstract":"The following article describes a new ASIC hardware platform (MX76k), which will be used to launch current audio enhancement algorithms from Waves Audio (MaxxAudio 3) on a variety of consumer electronics devices. This platform can also be extended for usage in other audio applications.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"298 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116592607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimal schematic design of low-Q IP blocks 低q IP模块的优化原理图设计
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116582
S. Krutchinsky, Mikhail S. Tsybin
{"title":"Optimal schematic design of low-Q IP blocks","authors":"S. Krutchinsky, Mikhail S. Tsybin","doi":"10.1109/EWDTS.2011.6116582","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116582","url":null,"abstract":"Universal procedure of schematic design of compensating feedback loops is offered. The synthesis schemes algorithm with cancellation is formulated. Examples of high-stable circuit with cancellation design are considered and appropriateness of use and development of multidefferential OA as new type of IP blocks of active components is shown.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"287 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132603971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The evidential independent verification of software of information and control systems, critical to safety: Functional model of scenario 对安全至关重要的信息和控制系统软件的证据独立验证:场景的功能模型
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116420
B. Konorev, V. Sergiyenko, G. Chertkov
{"title":"The evidential independent verification of software of information and control systems, critical to safety: Functional model of scenario","authors":"B. Konorev, V. Sergiyenko, G. Chertkov","doi":"10.1109/EWDTS.2011.6116420","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116420","url":null,"abstract":"The results of development of the techniques which form the scenario of target technology ≪Evidential independent verification of I&C Systems Software of critical application≫ and utilities of the scenario support at information, analytical and organizational levels are presented in the article. The result of the scenario implementation is the quantitative definition of latent faults probability and completeness of test coverage for critical software. This technology can be used by I&C systems developers, certification and regulation bodies to carry out independent verification (or certification) during modernization and modification of critical software directly on client objects without intruding (interrupting) in technological processes.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134245311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design 在设计的示意图表示中，对不相关的逻辑设计单元进行有效的选择性压缩和非压缩
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116424
Tarun Kumar Goyal, Amarpal Singh, R. Aggarwal
{"title":"Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design","authors":"Tarun Kumar Goyal, Amarpal Singh, R. Aggarwal","doi":"10.1109/EWDTS.2011.6116424","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116424","url":null,"abstract":"Design for Test (DFT) introduces certain elements such as buffers, inverter-pairs etc, though inconsequential, are integral part of a digital design. However, while debugging a circuit schematically, they waste precious real estate when a designer is mostly interested in the logical design elements. At the same time, it is important that these inconsequential elements are not discarded altogether as they could play an important role in the DFT debugging process such as buffer at pin output that fans out to multiple gates preserving the pin's hierarchical information when a design is flattened into primitives. This paper presents a novel approach that allows a designer to efficiently compact/un-compact inconsequential design components both completely/selectively in the design schematic, thus aiding the structural debugging process.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"2012 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114548969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimal fluctuations for satisfactory performance under parameter uncertainty 在参数不确定的情况下，最优波动可获得满意的性能
2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI: 10.1109/EWDTS.2011.6116590
H. Kadim
{"title":"Optimal fluctuations for satisfactory performance under parameter uncertainty","authors":"H. Kadim","doi":"10.1109/EWDTS.2011.6116590","DOIUrl":"https://doi.org/10.1109/EWDTS.2011.6116590","url":null,"abstract":"Maintaining constant performance in the presence of a set of changes in parameters and unwarranted events has become an essential aspect of present system designs. Knowing a predefined upper limit, for which a drop in performance is said to be satisfactory, enables autonomous systems to perform a control action to mitigate changes that violate such a predefined limit. This paper introduces an analytical model for optimisation of the maximum possible parameter fluctuations that permit robust operation.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116229882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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