Lei Chen, X. Wen, Y. You, D. Huang, Changzhi Li, Jinghong Chen
{"title":"A radiation-tolerant ring oscillator phase-locked loop in 0.13µm CMOS","authors":"Lei Chen, X. Wen, Y. You, D. Huang, Changzhi Li, Jinghong Chen","doi":"10.1109/MWSCAS.2012.6291945","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6291945","url":null,"abstract":"Advanced CMOS technologies have demonstrated reduced sensitivity to radiation total-ionization-dose (TID) effect. However, the reduced device dimensions can significantly increase the circuit sensitivity to transient radiation effects. This paper presents a radiation-tolerant ring oscillator Phase-Locked Loop (PLL) designed in a commercial 0.13 μm CMOS process. The PLL is designed for radiation-tolerant high-speed serial link applications. It operates over a frequency range of 1.1 GHz to 4.4 GHz with an RMS jitter of 1.8 ps at 3.125 GHz. The phase frequency detector (PFD) and frequency divider (FD) are designed with a novel D-flip-flop (DFF) that is robust to single event radiation effects (SEEs). The voltage-controlled oscillator (VCO) is designed with two ring oscillators cross-coupled thus compensating each other with the radiation-induced transient currents. Each ring oscillator has its own control voltage driven by an independent charge pump and loop filter. The redundancy helps to mitigate radiation strikes on the VCO control voltage. Simulation results show that the proposed PLL demonstrates radiation immunity for critical charge values up to 250 fC and can recover quickly from radiation strikes on its sensitive nodes. The PLL operates under a 1.2 V power supply and consumes 40 mW of power.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124490015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Charge-pump based switched-capacitor gain stage","authors":"Alireza Nilchi, D. Johns","doi":"10.1109/MWSCAS.2012.6292018","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292018","url":null,"abstract":"A low-power switched-capacitor (SC) gain stage based on a capacitive charge-pump (CP) is proposed. It is shown that the CP gain stage achieves the same input-referred thermal noise as a conventional SC gain circuit, while consuming significantly lower power. The effect of parasitic capacitances on the CP gain circuit is discussed. Simulation results confirming the improved power/performance trade-off of the CP gain stage over the conventional approach are provided.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124694388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Kishine, H. Inaba, Y. Ohtomo, M. Nakamura, Mitsuo Nakamura
{"title":"Design method for an over-IO-Gb/s CMOS CML buffer circuit for delay control","authors":"K. Kishine, H. Inaba, Y. Ohtomo, M. Nakamura, Mitsuo Nakamura","doi":"10.1109/MWSCAS.2012.6292092","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292092","url":null,"abstract":"A design method for an over-lOG-b/s buffer circuit for generating precise delay is proposed. A simple small-signal equivalent circuit model is introduced to investigate the delay characteristics of a current mode logic (CML) buffer circuit with load resistances. By setting the transconductance generator gm and output resistance in a MOSFET model as a function of drain current, the design equations for the delay and gain are derived. To confirm the validity of the design method, we fabricated buffer chain IC with the 65nm-MOSFET process and compared the measured and estimated delay. The errors between the measured and estimated delay are less than 15%, confirming the validity of the method.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124129906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Silva-Martínez, A. Karsilayan, Hemasundar Mohan Geddada
{"title":"Blocker and jitter tolerant wideband ΣΔ modulators","authors":"J. Silva-Martínez, A. Karsilayan, Hemasundar Mohan Geddada","doi":"10.1109/MWSCAS.2012.6292039","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292039","url":null,"abstract":"Blocker and jitter sensitivity of continuous-time sigma-delta (CT-ΣΔ) converters is discussed. The interaction between blockers and clock jitter and its effect on the ADC resolution is also investigated. It is observed that out-of-band (OOB) blockers and clock jitter in the feedback DAC degrade the ADC resolution by convolving with the OOB quantization noise, thereby increasing the in-band noise floor. Some techniques on how to improve the blocker and jitter tolerance of CT-ΣΔ ADCs are outlined. It is verified that increased blocker tolerance relaxes the baseband channel filtering requirements in the signal path of a broadband receiver. By monitoring the internal signals of the ADC and dynamically controlling a front-end programmable gain amplifier, saturation and overload is avoided in the presence of strong interferers. The proposed blocker mitigation technique avoids changing the ADC internal loop parameters dynamically, resulting in fast settling time performance with moderate penalties in SNDR and circuit complexity.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126321543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Validation of a reflected-impedance design method for wireless power transfer applications","authors":"D. Beams, S. G. Annam","doi":"10.1109/MWSCAS.2012.6292131","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292131","url":null,"abstract":"This paper proposes a simplified method for designing four-coil resonant wireless power transfer (WPT) networks by sequential application of impedance reflection through mutual inductances. Experimental validation is presented, and accuracy and limitations of the method are described. The method appears useful for first-pass (approximate) design, but accurate simulation requires consideration of mutual inductances of non-adjacent coils.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129998938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using constraint graphs to improve embedded systems design","authors":"Indira Jayaram, C. Purdy","doi":"10.1109/MWSCAS.2012.6292090","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292090","url":null,"abstract":"Currently embedded system design is more an art than a science, lacking adequate support for sound top-down design, significant co-design, and effective integration of nonfunctional properties such as cost, reliability, security, and safety into the design process. We describe a top-down design process which employs constraint graphs to address these issues. We demonstrate the effectiveness of this method through the development of a family of designs for a camera.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129385981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Rank modulation hardware for flash memories","authors":"Mina Kim, J. Park, C. Twigg","doi":"10.1109/MWSCAS.2012.6292015","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292015","url":null,"abstract":"Flash has been widely used as nonvolatile memories, such as secondary or long-term persistent storage, but it has recently been adopted for solid-state drives in many mobile applications. Advances in flash technology, such as multi-level cells and error correction, have improved storage density and reliability, but these characteristics continue to be a challenge as the technology scales to smaller dimensions. Most notably, these techniques have been unable to directly deal with the failures caused by block erasures, except by spreading out the erasures across the entire memory through wear leveling. Rank modulation provides a new approach to multi-level flash memory cells; it uses the relative ranking of cell levels, instead of their absolute values. A flash memory with rank modulation based upon winner-take-all circuits is proposed, simulated, and fabricated. Using rank modulation, memory reliability and capacity is further improved.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129726016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Towards low area overhead ARQ based soft error tolerant data paths for SRAM-based Altera FPGAs","authors":"Phani Balaji Swamy Tangellapalli, S. R. Hasan","doi":"10.1109/MWSCAS.2012.6292047","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292047","url":null,"abstract":"The SRAM-based FPGA, due to their high performance, has become a popular choice in today's electronic systems and are used in large number of applications. But in radiation harsh environment these FPGAs require some additional mechanism to cope up with soft errors. Modern FPGAs are built in 28nm technologies, where even combinational circuits are substantially vulnerable to soft errors. Such designs require soft error mitigation circuits in their data paths. Conventional soft error mitigation techniques such as triple modular redundancy are robust but their area overhead is three times as compared to normal design. In this paper a variant of automatic repeat request (ARQ) protocol is proposed, along with delayed redundancy to reduce area overhead. Synthesis results show an improvement of 9.1 and 10% in latency for Cyclone II and Stratix II FPGAs, respectively, with a 1.94 times improvement in resource utilization. Our synthesis results show that our implementation is not only better in terms of area overhead but if a soft error occurs once in 10 clock cycles the overall system throughput is better for the proposed architecture compared to TMR. To our knowledge this is the first work to implement ARQ based protocol utilizing delayed redundancy to mitigate soft errors in SRAM-based FPGAs.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129410592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On the invariance of Lazzaro circuit model","authors":"C. Marinov, R. Costea, V. Bucata","doi":"10.1109/MWSCAS.2012.6292238","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6292238","url":null,"abstract":"A well known circuit - due to Lazzaro - for WTA neural applications is considered. It is a current mode low voltage network based on subthreshold MOS devices. The authors show that the circuit model does not guarantee by itself that all transistors keep staying in the subthreshold region. To this goal, supplementary conditions on the range of input and bias currents are derived. This results in a synthesis procedure which is simple and flexible and takes into account an input-output performance as well. Numerical examples are also given.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128631706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 30–40 GHz fractional-N frequency synthesizer development using a Verilog-A high-level design methodology","authors":"G. Gal, Omar Abdelfattah, G. Roberts","doi":"10.1109/MWSCAS.2012.6291956","DOIUrl":"https://doi.org/10.1109/MWSCAS.2012.6291956","url":null,"abstract":"A design methodology for constructing a high-frequency (30 to 40 GHz) fractional-N synthesizer in a 65 nm TSMC CMOS process is presented. The method is focused on minimizing the phase noise at the output of the synthesizer while achieving the desired frequency range and frequency resolution. The method involves selecting initial values for each PLL component, simulating each using a transistor-level simulation, i.e. Spectre, and deriving a noise and linearity model of operation. Using an initial guess for the loop filter transfer function, together with a set of Verilog-A models for the various PLL components, the loop filter transfer function is adjusted so that the output phase noise behaviour is minimized. If the noise performance does not meet specifications, noise and linearity bounds on the individual PLL components can be derived. These, in turn, will force the re-design of all or some of the PLL components. The approach described here has been used to design a fractional-N synthesizer in the frequency range of 30 - 40 GHz with 5 MHz frequency steps having a phase noise of less than -90 dBc/Hz at a 1000 kHz frequency offset.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127065590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}