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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

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LV2Debug: A rule-based tool for the troubleshooting process LV2Debug:用于故障排除过程的基于规则的工具
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197554
D. Toms, D. Tenner
{"title":"LV2Debug: A rule-based tool for the troubleshooting process","authors":"D. Toms, D. Tenner","doi":"10.1109/AUTEST.1991.197554","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197554","url":null,"abstract":"LV2Debug is a fielded software tool for troubleshooting inertial reference units. It uses automated test equipment test results, the knowledge of expert technicians, failure histories, and repair-cost evaluation to lead a technician through the troubleshooting process. This includes confirming that a fault exists, diagnosing the problem, recommending repair actions, and helping to ensure that a repair has been correctly made. The goals of the LV2Debug troubleshooting system, the approach taken to meet these goals, and the overall architecture and operation of the system are described.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127723029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A modular microwave signal generator for the 1990's and beyond 模块化微波信号发生器为90年代和以后
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197580
T. Carey, R. Pratt
{"title":"A modular microwave signal generator for the 1990's and beyond","authors":"T. Carey, R. Pratt","doi":"10.1109/AUTEST.1991.197580","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197580","url":null,"abstract":"A modular, high-performance signal generator that delivers the smaller size, lighter weight, flexibility to upgrade or reconfigure, and supportability, required for the ATE of the future has been developed. Designed in an industry standard delivery system (MMS) with industry standard programming (SCPI), the Hewlett-Packard HP 70340A modular signal generator provides expandable performance, excellent reliability, and ease of use and support. With the HP 70340A both defense-related and commercial ATE can realize improved effectiveness: increased system uptime and throughput with a lower cost of ownership.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121798163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Applying automation to the DoD-STD 2167 documentation development task 将自动化应用于DoD-STD 2167文档开发任务
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197536
S.R. Greenspan
{"title":"Applying automation to the DoD-STD 2167 documentation development task","authors":"S.R. Greenspan","doi":"10.1109/AUTEST.1991.197536","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197536","url":null,"abstract":"The DoD-STD-2167 development process is addressed. Each requirement is discussed, and those areas that were automated and those areas in which automation was not applicable are identified. The discussion includes the general methodologies involved in the automatic process. In each of these areas any tradeoffs driven by automating that particular task are identified.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"62 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129571344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new approach to ATE power ATE电源的新方法
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197588
J. Kenny
{"title":"A new approach to ATE power","authors":"J. Kenny","doi":"10.1109/AUTEST.1991.197588","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197588","url":null,"abstract":"An approach to ATE power to improve the configurability, maintainability, reliability and functionality of the DC power subsystem has been developed. A description of the evolution of DC programmable power, the characteristics of the power subsystem architecture, and how it addresses the need for high-density, high-performance modern ATE is presented.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133885828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Paperless multimedia information and data collection system for ATE-A PRAM Project Report ATE-A PRAM项目报告无纸化多媒体信息和数据采集系统
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197537
F.L. Willis, P. Knapp
{"title":"Paperless multimedia information and data collection system for ATE-A PRAM Project Report","authors":"F.L. Willis, P. Knapp","doi":"10.1109/AUTEST.1991.197537","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197537","url":null,"abstract":"The productivity, reliability, availability, and maintainability (PRAM) Project 00-256 for integrating the Digital Multimedia Information System (DMIS) into the Reconnaissance Module Automatic Test System (RMATS) is discussed. An overview of the project is presented, along with a description of the PRAM process employed in obtaining approval and funding support for this advanced maintenance aiding and data collection system. RMATS provides ATE support for the Advanced Tactical Airborne Reconnaissance System (ATARS) and the Electrooptical Long Range Oblique Photographic System (EOLOROPS) as well as other existing reconnaissance and photographic systems within the Department of Defense inventory.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132790365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An artificial neural network printed circuit board diagnostic system based on infrared energy emissions 基于红外能量发射的人工神经网络印刷电路板诊断系统
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197528
H. Spence, D. Burris, J. Lopez, R. A. Houston
{"title":"An artificial neural network printed circuit board diagnostic system based on infrared energy emissions","authors":"H. Spence, D. Burris, J. Lopez, R. A. Houston","doi":"10.1109/AUTEST.1991.197528","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197528","url":null,"abstract":"A diagnostic method based on the infrared emissions of an electronic system is presented. Steps required to acquire thermal information reduce it to a manageable size, and form diagnostic decisions are discussed. The shortfalls of conventional ATE which may be improved by this approach are identified.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123721613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Trends in test: A vision for the 1990s 考试趋势:20世纪90年代的展望
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197587
T. Dehne
{"title":"Trends in test: A vision for the 1990s","authors":"T. Dehne","doi":"10.1109/AUTEST.1991.197587","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197587","url":null,"abstract":"The IEEE-488.2, SCPI, and VXI standards and plug-in data acquisition boards are examined. It is shown that the main options for building high-quality, reliable test systems can be categorized into three distinct types of instruments: IEEE-488 instruments, VXIbus instruments, and plug-in data acquisition boards. IEEE-488.2 and SCPI provide a new level of growth for the tried and true IEEE-488 systems, making them much easier to program and maintain. VXI should be as important to the industry as IEEE-488, and offers the advantages of smaller, more reliable, and higher performance test systems.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116679547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
INTELSAT VI satellite test program INTELSAT VI卫星测试程序
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197520
G.A. Tadler
{"title":"INTELSAT VI satellite test program","authors":"G.A. Tadler","doi":"10.1109/AUTEST.1991.197520","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197520","url":null,"abstract":"The INTELSAT VI satellite test program was designed around repetitive ground testing and no onboard integrated diagnostics. The ultimate design goal was to maximize both communications capacity and operational lifetime by minimizing the satellite dry weight (i.e. satellite without propellants). On board integrated diagnostic increase cost, reduct operational lifetime, and decrease reliability because of the added complexity to the satellite design. System reliability was optimized by adding redundancy to the maximum possible extent. The repetitive test philosophy began with component-level testing and ended with the final test verification program at the launch base.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128223593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A common engineering-to-manufacturing-to-field test strategy to achieve systems readiness beyond the 1990s 一个通用的从工程到制造到现场的测试策略，以在20世纪90年代以后实现系统准备就绪
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197549
R.L. Williams
{"title":"A common engineering-to-manufacturing-to-field test strategy to achieve systems readiness beyond the 1990s","authors":"R.L. Williams","doi":"10.1109/AUTEST.1991.197549","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197549","url":null,"abstract":"To achieve test program commonality an ATE (automated test equipment) architecture that provides a common platform for the separate test disciplines has been defined using integrating standards. This common ATE architecture is amenable to engineering electronics design so that prime equipment designers will use it in conjunction with design-for-test strategies for equipment proof-of-design and qualification testing. In its use for manufacturing test, the standard ATE architecture is functional (performance) test oriented (versus component or in-circuit) to ensure reusability of functional tests for depot return for issue purposes and fault isolation techniques. The common ATE architecture promises to integrate various program requirements imposed by differing field ATEs such as MATE, IFTE, CASS, and SMART into a unified factory solution.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116548190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Designing test environments to maximize TPS transportability 设计测试环境以最大化TPS可移植性
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197540
G.M.D. Gee, J.P. Soulikas
{"title":"Designing test environments to maximize TPS transportability","authors":"G.M.D. Gee, J.P. Soulikas","doi":"10.1109/AUTEST.1991.197540","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197540","url":null,"abstract":"Some of the issues to be considered when designing a standard test environment are discussed. Only by using a complete standard test environment can test code achieve hardware independence. The test environment must incorporate software and hardware standards so various computer platforms can host the control and support software, device drivers, and the test code, maximizing software reuse.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"28 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114050450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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