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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

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Interactive Electronic Technical Specification (IETS) 交互式电子技术规范(IETS)
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197538
A. Poon, L. M. Palmer
{"title":"Interactive Electronic Technical Specification (IETS)","authors":"A. Poon, L. M. Palmer","doi":"10.1109/AUTEST.1991.197538","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197538","url":null,"abstract":"The Interactive Electronic Technical Specification (IET) research project provides a paperless environment for system development documentation including requirements, specifications, and design documents, with interactive hypermedia access to needed information. IETS can also provide automated requirements and system behavior. Elements and features of IETS are presented. A description is presented of the General Dynamics IETS approach, and its future role in advanced maintenance and diagnostic systems development.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132759386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Partitioning large diagnostic problems 对大型诊断问题进行分区
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197570
W. Simpson, J. Sheppard
{"title":"Partitioning large diagnostic problems","authors":"W. Simpson, J. Sheppard","doi":"10.1109/AUTEST.1991.197570","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197570","url":null,"abstract":"A basic approach to modeling large diagnostic problems, such as Space Station Freedom or the ATF avionics, is presented. For this approach, the authors present three techniques for developing submodels to create an interacting network of submodels of reasonable size. Specifically, they discuss: partitioning by articulation points; partitioning by logical cut points; and partitioning at arbitrary points. These techniques have been developed as part of a total integrated diagnostics package that includes testability analysis, design for testability, and a full range of diagnostic capabilities, including built-in test, embedded diagnostics, automatic tests and portable maintenance aids.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134478254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The B-2 radar B-2雷达
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197526
C. A. Smith
{"title":"The B-2 radar","authors":"C. A. Smith","doi":"10.1109/AUTEST.1991.197526","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197526","url":null,"abstract":"The B-2 radar's on-platform contribution to system effectiveness is described. The author provides that information which can be released about the B-2 radar, including derivation of its design requirements, description of the radar hardware and software, some of the radar's development history and transition to production. An illustration of how early development of built-in test (BIT) can significantly improve hardware and thus enhance system effectiveness is given.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124019733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
At-speed board test simplified via embeddable data trace/compaction IC 通过嵌入式数据跟踪/压缩IC简化了高速板测试
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197567
L. Whetsel
{"title":"At-speed board test simplified via embeddable data trace/compaction IC","authors":"L. Whetsel","doi":"10.1109/AUTEST.1991.197567","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197567","url":null,"abstract":"The architecture and operation of an 1149.1-based digital bus monitor (DBM) IC is described. The ability of the DBM to monitor at-speed signal transfers between ICs in real time provides a method of monitoring the functional operation of circuits assembled on board and multichip module substrates. Such tests can be used to reveal timing sensitive and/or intermittent failures that would otherwise not be detectable without the use of external testers and mechanical probing fixtures. This test approach may, in some cases, reduce the cost to manufacture and support a product by reducing the need for test equipment in both factory and field environments.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121031259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TPS transportability: From the factory to the depot TPS可运输性:从工厂到仓库
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197547
M. Schmidt
{"title":"TPS transportability: From the factory to the depot","authors":"M. Schmidt","doi":"10.1109/AUTEST.1991.197547","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197547","url":null,"abstract":"A major issue in replacing testers is the need to transport test program sets (TPSs) from the installed tester to the replacement tester. A test program set includes test programs and fixtures. The authors first address some of the key issues involved in developing translation systems to transport TPSs from an installed depot tester to a replacement commercial tester. They then provide an example based on their experience in developing a translation system for migrating from GR179X testers to Teradyne's L-series functional testers.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129053463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Intelligent-battery analyzer/charger systems 智能电池分析/充电系统
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197589
B. Gollomp, T. Palanisamy, T. I. Pattantyus, J. Hosty
{"title":"Intelligent-battery analyzer/charger systems","authors":"B. Gollomp, T. Palanisamy, T. I. Pattantyus, J. Hosty","doi":"10.1109/AUTEST.1991.197589","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197589","url":null,"abstract":"A brief description is given of electrochemistry technology. Current techniques, the unique and advanced nature of IBAC (intelligent battery analyzer charger) system technologies, and different IBAC architectures or implementations are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117045802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Advanced avionics architecture-support challenges for the 21st century 21世纪的先进航空电子架构支持挑战
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197532
J. E. White
{"title":"Advanced avionics architecture-support challenges for the 21st century","authors":"J. E. White","doi":"10.1109/AUTEST.1991.197532","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197532","url":null,"abstract":"The F-22 is entering the early days of its engineering and manufacturing development (EMD) phase. An overview of the F-22 avionics system is presented. The program's strategies for fielding a weapons system that not only meets all of its performance requirements, but also meets aggressive life-cycle cost goals are introduced.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117212120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design criteria for CAE-to-ATE translation CAE-to-ATE翻译的设计标准
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197591
L. Benetazzo, J. Costella, C. Narduzzi, C. Offelli, D. Rossetto
{"title":"Design criteria for CAE-to-ATE translation","authors":"L. Benetazzo, J. Costella, C. Narduzzi, C. Offelli, D. Rossetto","doi":"10.1109/AUTEST.1991.197591","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197591","url":null,"abstract":"The development and performance of two translation methods that connect, and integrate the CAE and ATE environments are discussed. The objective is the automatic translation of the information achieved by CAE design simulation procedures into a program that can be directly input to the test equipment for device-under-test (DUT) stimulus and response verification. The authors show how a set of commands for the tester is automatically generated, improving systems integration and robustness in DUT verification.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134508353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An ATE engineering environment ATE工程环境
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197546
R. M. Ralls
{"title":"An ATE engineering environment","authors":"R. M. Ralls","doi":"10.1109/AUTEST.1991.197546","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197546","url":null,"abstract":"The basics of the ATE software development process are discussed. The technique for determining the required capacities of various machine types and how to apply people to both is presented. Some of the management tools which can be used to characterize and manage the process are discussed. It is shown that the only point at which the specific tester makes a difference, is when the segment and sub-segment structure for an Ethernet system is laid out. The tester and its structures do affect the number of bridges used and their placement. Beyond that, the techniques outlined and the facility they define will accommodate any of the major testers and simulators as long as software compatibility remains the prime driver in the selection.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121353853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test concepts applied to French Army equipment in the field from 1990 to 2000 从1990年到2000年，测试概念应用于法国陆军装备
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197521
P. Brard
{"title":"Test concepts applied to French Army equipment in the field from 1990 to 2000","authors":"P. Brard","doi":"10.1109/AUTEST.1991.197521","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197521","url":null,"abstract":"The author presents the maintenance solutions that will be implemented by the French Army for intermediate-level equipment for the 1990-2000 generation. After summarizing the experience acquired from the preceding generation, the author describes the procedure applied to arrive at the definition of the requirement and the characteristics of the resulting test system.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117144527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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