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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s最新文献

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Accurate radiometric calibration of thermal sources 热源的精确辐射校准
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197529
N. Nelson, E. Mei
{"title":"Accurate radiometric calibration of thermal sources","authors":"N. Nelson, E. Mei","doi":"10.1109/AUTEST.1991.197529","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197529","url":null,"abstract":"Methods for achieving accurate radiometric calibration of thermal imaging test equipment, using a combination of measurement technique and closed-loop control of thermal source radiance are presented. These and other advancements are to be implemented in the Navy's consolidated automated support system (CASS) electrooptical subsystem (EOSS).<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116870778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A unique system for automated, generic testing of hydraulic UUT's 一个独特的系统，自动化，通用测试液压UUT的
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197558
J. E. Sage
{"title":"A unique system for automated, generic testing of hydraulic UUT's","authors":"J. E. Sage","doi":"10.1109/AUTEST.1991.197558","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197558","url":null,"abstract":"The IMAGE system is used to test a variety of hydraulic components in many commercial and military aircraft. The test system executes under control of the run time system and permits the prescribed testing sequence to occur. The IMAGE system operates in three modes and can be executed if a valid UUT unit under test definition and appropriate transducers have been specified. The modes of operation are outlined.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116345816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
System software standards and interface specifications for the ATLAS/Ada based environment for test (ABET) 基于ATLAS/Ada测试环境(ABET)的系统软件标准和接口规范
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197542
J. Graves, R. Brooks
{"title":"System software standards and interface specifications for the ATLAS/Ada based environment for test (ABET)","authors":"J. Graves, R. Brooks","doi":"10.1109/AUTEST.1991.197542","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197542","url":null,"abstract":"The ABET standards definition process is discussed, and brief descriptions of how each ABET layer provides services, based on the set of external component standards which are combined into a complete test system definition, are presented. The authors discuss how the ABET package specifications can be supplemented by using the Anna formal specification language. Using Anna formal specifications in ABET implementations will provide the capability to generate self-checking applications that can be debugged or validated for correctness (to ensure reliability) by the Anna tools (e.g., the Anna transformer).<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127902083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Resolving conflict in system requirements 解决系统需求中的冲突
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197574
R.E. Hartwell
{"title":"Resolving conflict in system requirements","authors":"R.E. Hartwell","doi":"10.1109/AUTEST.1991.197574","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197574","url":null,"abstract":"This study builds upon traditional systems engineering methods: analyzing system requirements, performing functional allocation, exercising the tradeoff issues, synthesizing requirements, and verifying that they are achievable. The importance of interactions between requirements and their corresponding implementations is emphasized. Understanding and documenting these interactions is proposed as an important step in the system design process. Graphic and mathematical analysis methods applied in the resolution of conflicts are introduced. The impact and importance of technology trends in system design, tradeoff analysis, and product planning are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131007674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design and development of an automated geotechnical dynamic triaxial testing system 自动化岩土动态三轴试验系统的设计与开发
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197584
D. Lu, R. Challoo, P. Compton, P. Leelani
{"title":"Design and development of an automated geotechnical dynamic triaxial testing system","authors":"D. Lu, R. Challoo, P. Compton, P. Leelani","doi":"10.1109/AUTEST.1991.197584","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197584","url":null,"abstract":"A dynamic triaxial testing apparatus for conducting geotechnical engineering laboratory tests was upgraded. An 80386-microcomputer-based data acquisition and control system was developed and incorporated into the input and output systems of the apparatus. This automated geotechnical dynamic triaxial testing system (AGDTTS) can be used to conduct geotechnical engineering laboratory tests with high speed, better performance, automated data acquisition, and improved control capability.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132690121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A new methodology for test program set generation and re-housing 一种测试程序集生成和重新安置的新方法
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197563
J. Hanna, W.J. Horth
{"title":"A new methodology for test program set generation and re-housing","authors":"J. Hanna, W.J. Horth","doi":"10.1109/AUTEST.1991.197563","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197563","url":null,"abstract":"A methodology for significantly improving the consistency, reliability, and transportability of test program sets (TPSs) is presented. This methodology utilizes the proposed IEEE tester-independent data standards and resource-independent standardized test methods to automate the TPS development process. Automating this process greatly reduces the costs associated with TPS development and provides a highly cost-effective method for re-hosting existing TPSs to new tester environments.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123693125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Standardized test resource models vs. UUT signal oriented models for test system control 标准化测试资源模型与面向UUT信号的测试系统控制模型
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197541
D. Crowe, W. Griffin, G. Matysek
{"title":"Standardized test resource models vs. UUT signal oriented models for test system control","authors":"D. Crowe, W. Griffin, G. Matysek","doi":"10.1109/AUTEST.1991.197541","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197541","url":null,"abstract":"The strengths and weaknesses of the UUT signal-oriented approach are examined in light of the standardized test resource model approach that has been presented to the IEEE ABET committee. This approach would create standard models for types of test resources that would define functionality, parametric ranges, and connectivity. It is shown that the test resource model concept presented will greatly reduce the TPS maintenance burden by moving test-station-specific information from detailed station documentation to the TPS program and to the software interfaces used by those programs. It will also greatly improve code reuse by making it clear in the code where non-standard or instrument-class-dependent test functions are being used.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122126028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
RICK: A DFT advisor for digital circuit design 瑞克:数位电路设计的DFT顾问
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197582
A. Dholakia
{"title":"RICK: A DFT advisor for digital circuit design","authors":"A. Dholakia","doi":"10.1109/AUTEST.1991.197582","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197582","url":null,"abstract":"Design for testability (DFT) requires digital circuit designers to address the issues of testability during the design phase. To simplify this task, a number of knowledge-based DFT expert systems have been suggested. A DFT advisor which can offer testability advice to the designer at all the stages of the design phase is described. It is implemented using the constraint programming language Galileo.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127243366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Results so far: A report of a diagnostic expert implementation 到目前为止的结果:诊断专家实施报告
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197556
W. Galey
{"title":"Results so far: A report of a diagnostic expert implementation","authors":"W. Galey","doi":"10.1109/AUTEST.1991.197556","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197556","url":null,"abstract":"The application of expert system technology to solve a demonstrated maintenance deficiency is presented. All phases of the process are discussed, including available knowledge sources and the implementation procedure itself. Productivity data are discussed.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129041719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The PCB circuit analysis system based on AI 基于AI的PCB电路分析系统
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s Pub Date : 1991-09-24 DOI: 10.1109/AUTEST.1991.197583
K. Han, K. Watson
{"title":"The PCB circuit analysis system based on AI","authors":"K. Han, K. Watson","doi":"10.1109/AUTEST.1991.197583","DOIUrl":"https://doi.org/10.1109/AUTEST.1991.197583","url":null,"abstract":"A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"2013 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121758021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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