{"title":"A new methodology for test program set generation and re-housing","authors":"J. Hanna, W.J. Horth","doi":"10.1109/AUTEST.1991.197563","DOIUrl":null,"url":null,"abstract":"A methodology for significantly improving the consistency, reliability, and transportability of test program sets (TPSs) is presented. This methodology utilizes the proposed IEEE tester-independent data standards and resource-independent standardized test methods to automate the TPS development process. Automating this process greatly reduces the costs associated with TPS development and provides a highly cost-effective method for re-hosting existing TPSs to new tester environments.<<ETX>>","PeriodicalId":320001,"journal":{"name":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1991.197563","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
A methodology for significantly improving the consistency, reliability, and transportability of test program sets (TPSs) is presented. This methodology utilizes the proposed IEEE tester-independent data standards and resource-independent standardized test methods to automate the TPS development process. Automating this process greatly reduces the costs associated with TPS development and provides a highly cost-effective method for re-hosting existing TPSs to new tester environments.<>